IP Library Granted Patent US 10,453,999
Granted Patent B2
US 10,453,999 · App. 15/981,855 · Granted Oct 22, 2019

Light emitting diode

Inventors: Yi-Ru Huang (Tainan, TW); Tung-Lin Chuang (Tainan, TW); Yan-Ting Lan (Tainan, TW); Sheng-Tsung Hsu (Tainan, TW); Chih-Ming Shen (Tainan, TW); Jing-En Huang (Tainan, TW); Teng-Hsien Lai (Tainan, TW); Hung-Chuan Mai (Kaohsiung, TW); Kuan-Chieh Huang (New Taipei, TW); Shao-Ying Ting (Tainan, TW); Cheng-Pin Chen (Tainan, TW); Wei-Chen Chien (Tainan, TW); Chih-Chin Cheng (Tainan, TW); Chih-Hung Tseng (Tainan, TW)
Assignee: Genesis Photonics Inc.
H01L33/38H01L33/36H01L33/382H01L33/46H01L33/465H01L33/60H01L33/385H01L33/387H01L33/405
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Quick Facts
Patent No.
US 10,453,999
App. No.
15/981,855
Granted
Oct 22, 2019
Kind
B2
Abstract

The invention provides an LED including a first-type semiconductor layer, an emitting layer, a second-type semiconductor layer, a first electrode, a second electrode, a Bragg reflector structure, a conductive layer and insulation patterns. The first electrode and the second electrode are located on the same side of the Bragg reflector structure. The conductive layer is disposed between the Bragg reflector structure and the second-type semiconductor layer. The insulation patterns are disposed between the conductive layer and the second-type semiconductor layer. Each insulating layer has a first surface facing toward the second-type semiconductor layer, a second surface facing away from the second-type semiconductor layer, and an inclined surface. The inclined surface connects the first surface and the second surface and is inclined with respect to the first surface and the second surface.

Claims (31)

1. A light emitting diode, comprising:

a semiconductor structure comprising a first-type semiconductor layer, a second-type semiconductor layer and a light emitting layer disposed between the first-type semiconductor layer and the second-type semiconductor layer;

an insulating structure disposed over the semiconductor structure, the insulation structure comprising a first insulating layer, a second insulating layer and a distributed Bragg reflector (DBR) layer entirely enclosed by the first insulating layer and the second insulating layer;

a first patterned metal layer disposed between the semiconductor structure and the insulating structure and electrically connected to the first-type semiconductor layer, wherein the first patterned metal layer comprises a first welding portion and a first finger portion connected to the first welding portion;

a current dispersion layer disposed between the semiconductor structure and the insulating structure and formed over the second-type semiconductor layer;

a second patterned metal layer located between the semiconductor structure and the insulating structure and disposed on the current dispersion layer, wherein the second patterned metal layer comprises a second welding portion and a second finger portion connected to the second welding portion; and

a first electrode layer and a second electrode layer apart disposed on the insulating structure,

wherein the insulating structure has at least one first through hole exposing a portion of the welding portion of the first patterned metal layer and at least one second through hole exposing a portion of the welding portion of the second patterned metal layer, wherein the first electrode layer and the second electrode layer are electrically connected to the first patterned metal layer and the second patterned metal layer through the first through hole and the second through hole respectively,

wherein the DBR layer of the insulating structure is not overlapped with the welding portion of the first patterned metal layer and the welding portion of the second patterned metal layer, respectively.

2. The light emitting diode as recited in claim 1 , further comprising at least one insulation pattern disposed between the current dispersion layer and the second-type semiconductor layer and in contact with the second-type semiconductor layer, wherein the second patterned metal layer is aligned with the insulation pattern and is located within an area of a footprint of the insulation pattern.

3. The light emitting diode as recited in claim 2 , wherein the insulation pattern has an inclined side surface, the inclined side surface and the second-type semiconductor layer includes an acute angle between 10 degree and 80 degree.

4. The light emitting diode as recited in claim 2 , wherein the insulation pattern has an inclined side surface, the inclined side surface and the second-type semiconductor layer includes a sharp angle between 30 degree and 50 degree.

5. The light emitting diode as recited in claim 2 , wherein each of the insulation patterns comprises a plurality of first sub-layers and a plurality of second sub-layers, and the first sub-layers and the second sub-layers are stacked alternately and a material of each of the first sub-layers is different from a material of each of the second sub-layers.

6. The light emitting diode as recited in claim 2 , wherein each of the insulation patterns comprises a plurality of first sub-layers and a plurality of second sub-layers, and the first sub-layers and the second sub-layers are stacked alternately and a material of each of the first sub-layers is the same to a material of each of the second sub-layers, and a density of each of the first sub-layers is different from a density of each of the second sub-layers.

7. The light emitting diode as recited in claim 1 , wherein a reflectance of the DBR layer is greater than or equal to 95% in a reflective wavelength range at least covering 0.8(X) nm to 1.8(X) nm, the light emitting layer is configured to emit a beam, the beam has a peak wavelength within an emission wavelength range, and X is the peak wavelength of the emission wavelength range.

8. The light emitting diode as recited in claim 1 , wherein the current dispersion layer comprises a translucent conductive layer.

9. A light emitting diode, comprising:

a semiconductor structure comprising a first-type semiconductor layer, a second-type semiconductor layer and a light emitting layer disposed between the first-type semiconductor layer and the second-type semiconductor layer;

an insulating structure disposed over the semiconductor structure, the insulation structure comprising a first insulating layer and a distributed Bragg reflector (DBR) layer disposed on the first insulating layer;

a first patterned metal layer disposed between the semiconductor structure and the insulating structure and electrically connected to the first-type semiconductor layer, wherein the first patterned metal layer comprises a first welding portion and a first finger portion connected to the first welding portion;

a current dispersion layer disposed between the semiconductor structure and the insulating structure and formed over the second-type semiconductor layer;

a second patterned metal layer located between the semiconductor structure and the insulating structure and disposed on the current dispersion layer, wherein the second patterned metal layer comprises a second welding portion and a second finger portion connected to the second welding portion; and

a first electrode layer and a second electrode layer apart disposed on the insulating structure and electrically connected to the welding portion of the first patterned metal layer and the welding portion of the second patterned metal layer respectively,

wherein the first insulating layer of the insulating structure exposes a portion of the welding portion of the first patterned metal layer and a portion of the welding portion of the second patterned metal layer, wherein the DBR layer of the insulating structure is not overlapped with the welding portion of the first patterned metal layer and the welding portion of the second patterned metal layer, respectively.

10. The light emitting diode as recited in claim 9 , further comprising at least one insulation pattern disposed between the current dispersion layer and the second-type semiconductor layer and in contact with the second-type semiconductor layer, wherein the second patterned metal layer is aligned with the insulation pattern and is located within an area of a footprint of the insulation pattern.

11. The light emitting diode as recited in claim 10 , wherein the insulation pattern has an inclined side surface, the inclined side surface and the second-type semiconductor layer includes an acute angle between 10 degree and 80 degree.

12. The light emitting diode as recited in claim 10 , wherein the insulation pattern has an inclined side surface, the inclined side surface and the second-type semiconductor layer includes a sharp angle between 30 degree and 50 degree.

13. The light emitting diode as recited in claim 10 , wherein each of the insulation patterns comprises a plurality of first sub-layers and a plurality of second sub-layers, and the first sub-layers and the second sub-layers are stacked alternately and a material of each of the first sub-layers is different from a material of each of the second sub-layers.

14. The light emitting diode as recited in claim 10 , wherein each of the insulation patterns comprises a plurality of first sub-layers and a plurality of second sub-layers, and the first sub-layers and the second sub-layers are stacked alternately and a material of each of the first sub-layers is the same to a material of each of the second sub-layers, and a density of each of the first sub-layers is different from a density of each of the second sub-layers.

15. The light emitting diode as recited in claim 9 , wherein a reflectance of the DBR layer is greater than or equal to 95% in a reflective wavelength range at least covering 0.8(X) nm to 1.8(X) nm, the light emitting layer is configured to emit a beam, the beam has a peak wavelength within an emission wavelength range, and X is the peak wavelength of the emission wavelength range.

16. The light emitting diode as recited in claim 9 , wherein the current dispersion layer comprises a translucent conductive layer.

Assignments (2)
ADDRESS CHANGE REGISTRATION FORM Recorded Dec 15, 2023
From: GENESIS PHOTONICS INC.
To: GENESIS PHOTONICS INC.
Reel/Frame 066044/0133 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2023
From: GENESIS PHOTONICS INC.
To: NICHIA CORPORATION
Reel/Frame 066044/0807 →
Continuity (6)
Continuation 15135573 · Apr 22, 2016
Continuation In Part 15045279 · Feb 17, 2016
Provisional Application 62116923 · Feb 17, 2015
Provisional Application 62151377 · Apr 22, 2015
Provisional Application 62168921 · Jun 1, 2015
Related Publication 20180261727A1 · Sep 13, 2018