Image based plasma sheath profile detection on plasma processing tools
A system includes an image processing module configured to receive an image, captured by an imaging device, of a plasma environment within a substrate processing chamber during processing of a substrate and extract one or more features of the image indicative of a plasma sheath formed within the plasma environment during the processing of the substrate. A control module is configured to determine a plasma sheath profile based on the one or more features extracted from the image and selectively adjust at least one processing parameter related to the processing of the substrate based on the plasma sheath profile.
1. A plasma processing system, comprising:
an image processor configured to (i) receive an image, captured by a camera, of a plasma environment within a substrate processing chamber during processing of a substrate and (ii) extract one or more features of the image indicative of a plasma sheath formed within the plasma environment during the processing of the substrate; and
a controller including a processor and configured to (i) determine a plasma sheath profile of the plasma sheath formed within the plasma environment based on the one or more features extracted from the image and (ii) selectively adjust a height of an edge ring based on a difference between the plasma sheath profile as determined by the controller and a reference profile.
2. The plasma processing system of claim 1 , wherein one of the one or more features corresponds to a contrast between a bulk plasma region and a plasma sheath region.
3. The plasma processing system of claim 2 , wherein the one of the one or more features corresponds to a line between the bulk plasma region and the plasma sheath region.
4. The plasma processing system of claim 1 , wherein the controller is configured to (i) compare the plasma sheath profile to the reference profile and (ii) selectively adjust the height of the edge ring based on a difference between the plasma sheath profile and a reference line corresponding to the reference profile.
5. The plasma processing system of claim 4 , wherein the reference line is a flat line located a predetermined distance above the substrate.
6. The plasma processing system of claim 1 , wherein the controller is configured to determine a flatness of the plasma sheath profile to selectively adjust the height of the edge ring.
7. The plasma processing system of claim 1 , wherein (i) the at least one processing parameter corresponds to power provided to an edge ring and (ii) the controller is configured to adjust the power provided to the edge ring based on the one or more features extracted from the image.
8. The plasma processing system of claim 1 , wherein the camera is arranged to view the plasma environment above an edge region of the substrate through an opening in a sidewall of the substrate processing chamber.
9. The plasma processing system of claim 8 , further comprising a shutter arranged to selectively open and close within the opening in the sidewall of the substrate processing chamber.
10. The plasma processing system of claim 9 , wherein the controller is configured to selectively open and close the shutter to allow the camera to capture the image.