Semiconductor package structure having a multi-thermal interface material structure
A semiconductor package structure includes a substrate, a first semiconductor and a second semiconductor over the substrate, and a multi-TIM structure disposed over the first semiconductor die and the second semiconductor die. The first semiconductor die includes a first heat output and the second semiconductor die includes a second heat output less than the first heat output. The multi-TIM structure includes a first TIM layer disposed over at least a portion of the first semiconductor die and a second TIM layer. A thermal conductivity of the first TIM layer is higher than a thermal conductivity of the second TIM layer. The first TIM layer covers the first semiconductor die.
1. A semiconductor package structure comprising:
a substrate;
a plurality of semiconductor dies over the substrate; and
a multi-thermal interface material (TIM) structure over the plurality of semiconductor dies,
wherein the multi-TIM structure comprises a first TIM layer and a second TIM layer, and a thermal conductivity (Tk) of the first TIM layer is different from a thermal conductivity of the second TIM layer, the first TIM layer overlaps a portion of each of the plurality of semiconductor dies, and the second TIM layer overlaps another portion of each of the plurality of semiconductor dies.
2. The semiconductor package structure of claim 1 , wherein the first TIM layer is separated from the second TIM layer by an air gap.
3. The semiconductor package structure of claim 1 , wherein the first TIM layer is in contact with the second TIM layer.
4. The semiconductor package structure of claim 1 , wherein the second TIM layer surrounds the first TIM layer from a top view.
5. The semiconductor package structure of claim 1 , wherein the plurality of semiconductor dies are arranged along a first direction, and the first TIM layer and the second TIM layer are arranged along a second direction different from the first direction.
6. The semiconductor package structure of claim 1 , wherein the plurality of semiconductor dies, the first TIM layer and the second TIM layer are arranged along a same direction.
7. The semiconductor package structure of claim 1 , wherein the multi-TIM structure further comprises a third TIM layer, and the first TIM layer is disposed between the second TIM layer and the third TIM layer from a top view.
8. The semiconductor package structure of claim 1 , wherein the multi-TIM structure has a consistent thickness.
9. The semiconductor package structure of claim 1 , wherein an area of the first TIM layer is greater than an area of the second TIM layer.
10. A semiconductor package structure comprising:
a substrate;
a first semiconductor die and a second semiconductor die disposed over the substrate, wherein the first semiconductor die includes a first heat output and the second semiconductor die includes a second heat output less than the first heat output; and
a multi-TIM structure disposed over the first semiconductor die and the second semiconductor die, the multi-TIM structure comprising a first TIM layer disposed over at least a portion of the first semiconductor die and a second TIM layer,
wherein a thermal conductivity of the first TIM layer is greater than a thermal conductivity of the second TIM layer.
11. The semiconductor package structure of claim 10 , wherein the thermal conductivity of the first TIM layer is greater than approximately 10 watts per meter kelvin (W/mK).
12. The semiconductor package structure of claim 10 , wherein the thermal conductivity of the second TIM layer is smaller than approximately 10 W/mK.
13. The semiconductor package structure of claim 10 , wherein the first TIM layer comprises a base material and thermal conductive fillers, the base material comprises plastics, adhesives, glues, epoxies, polymers, thermoplastics, silicone, grease, oil or resin, and the thermal conductive fillers comprise aluminum oxide (AlO), boron nitride (BN), aluminum nitride (AlN), aluminum (Al), copper (Cu), silver (Ag), or indium (In).
14. The semiconductor package structure of claim 10 , wherein the second TIM layer comprises polymer.
15. The semiconductor package structure of claim 10 , wherein an adhesion of the first TIM layer is different from an adhesion of the second TIM layer.
16. The semiconductor package structure of claim 10 , further comprising a heat sink disposed over the multi-TIM structure and in contact with the multi-TIM structure.
17. A semiconductor package structure comprising:
a substrate comprising a first region and a second region;
a plurality of semiconductor dies and in the first region of the substrate; and
a multi-TIM structure over the plurality of semiconductor dies in the first region, the multi-TIM structure comprising at least a first TIM layer and at least a second TIM layer,
wherein an adhesion of the first TIM layer is less than an adhesion of the second TIM layer, and the second TIM layer is disposed over corners of the first region.
18. The semiconductor package structure of claim 17 , wherein a thermal conductivity of the first TIM layer is different from a thermal conductivity of the second TIM layer.
19. The semiconductor package structure of claim 17 , wherein the second TIM layer further covers a periphery of the first region.
20. The semiconductor package structure of claim 17 , wherein the second TIM layer surrounds the first TIM layer from a top view.