IP Library Granted Patent US 11,081,527
Granted Patent B2
US 11,081,527 · App. 15/994,054 · Granted Aug 3, 2021

Solid-state image pickup device and manufacturing method thereof

Inventors: Keisuke Hatano (Kanagawa, JP); Tetsuji Yamaguchi (Kanagawa, JP); Shintarou Hirata (Kanagawa, JP)
Assignee: Sony Semiconductor Solutions Corporation
H01L27/307H01L27/1463H01L27/14601H01L27/14636H01L31/12H01L51/0001H01L51/42H01L51/441H01L51/442H01L51/447H01L51/448
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Quick Facts
Patent No.
US 11,081,527
App. No.
15/994,054
Granted
Aug 3, 2021
Kind
B2
Abstract

There is provided a solid-state image pickup device that includes a functional region provided with an organic film, and a guard ring surrounding the functional region.

Claims (34)

1. An electronic apparatus, comprising:

a solid-state image pickup device, comprising:

a functional region provided with an organic film;

a guard ring, wherein the guard ring includes a first guard ring provided at a region surrounding the functional region;

a bonding pad that is provided at a peripheral region around the functional region;

an insulating film that is provided around the functional region; and

a passivation film that covers a top surface of the functional region and a top surface of the insulating film, wherein the guard ring is configured of the passivation film cladded at an inside of a groove that is provided on the insulating film; and

an aperture that is provided at a position facing the bonding pad.

2. The electronic apparatus according to claim 1 , wherein the guard ring includes:

a second guard ring surrounding the aperture; and

a third guard ring along an outer circumference of a chip.

3. The electronic apparatus according to claim 2 , wherein the second guard ring is provided across a plurality of apertures.

4. The electronic apparatus according to claim 1 , wherein the guard ring is configured of a material film that is not permeable to moisture and oxygen.

5. The electronic apparatus according to claim 1 , wherein the guard ring has a configuration in which one or more metallic layers are laminated around the functional region.

6. The electronic apparatus according to claim 5 , wherein the one or more metallic layers are configured of aluminum, tungsten, titanium, molybdenum, tantalum, copper, an alloy film of aluminum, tungsten, titanium, molybdenum, tantalum, copper, or a silicon- or oxygen-containing metallic film of aluminum, tungsten, titanium, molybdenum, tantalum, and copper.

7. The electronic apparatus according to claim 5 , further comprising the passivation film is cladded directly on an uppermost layer configuring the guard ring.

8. The solid-state image pickup device according to claim 7 , wherein the passivation film is configured of a material film that is not permeable to moisture and oxygen.

9. The solid-state image pickup device according to claim 8 , wherein the passivation film is configured of a silicon nitride film, a silicon oxynitride film, or an aluminum oxide film, or a laminated film stacking a silicon nitride film, a silicon oxynitride film, or an aluminum oxide film.

10. The solid-state image pickup device according to claim 1 , further comprising:

a semiconductor substrate on which the functional region is provided on a principal surface side thereof;

a charge transmission section that is provided inside the semiconductor substrate; and

a multi-layer wire that is provided on an opposite side of the principal surface of the semiconductor substrate and is connected with the bonding pad, wherein the charge transmission section transmits a signal charge that is photoelectric-converted by the organic film or a potential corresponding to a signal charge to the bonding pad via the multi-layer wire.

11. A solid-state image pickup device, comprising:

a functional region provided with an organic film;

a guard ring, wherein the guard ring includes a first guard ring provided at a region surrounding the functional region;

an insulating film around the functional region, wherein the guard ring is configured of an embedded layer that is embedded into an inside of a groove that is provided on the insulating film; and

a passivation film that covers a top surface of the functional region and a top surface of the insulating film, wherein the passivation film is cladded directly on the embedded layer.

12. The solid-state image pickup device according to claim 11 , wherein the embedded layer is configured of a metallic film or a silicon nitride film.

13. The solid-state image pickup device according to claim 12 , wherein the metallic film is configured of aluminum, tungsten, titanium, molybdenum, tantalum, copper, an alloy film of aluminum, tungsten, titanium, molybdenum, tantalum, copper, or a silicon- or oxygen-containing metallic film of aluminum, tungsten, titanium, molybdenum, tantalum, and copper.

14. A solid-state image pickup device, comprising:

a functional region provided with an organic film;

a guard ring surrounding the functional region;

an insulating film that is provided around the functional region; and

a passivation film that covers a top surface of the functional region and a top surface of the insulating film, wherein the guard ring is configured of the passivation film cladded at an inside of a groove that is provided on the insulating film.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2020
From: SONY CORPORATION
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 053017/0187 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2020
From: HATANO, KEISUKE; YAMAGUCHI, TETSUJI; HIRATA, SHINTAROU
To: SONY CORPORATION
Reel/Frame 053020/0434 →
Priority Claims (1)
JP 2011-271195 · Dec 12, 2011 · national
Continuity (5)
Continuation 15660436 · Jul 26, 2017
Continuation 15299838 · Oct 21, 2016
Continuation 15086919 · Mar 31, 2016
Continuation 14362422
Related Publication 20180277606A1 · Sep 27, 2018