Semiconductor substrate production systems and related methods
Implementations of a method of separating a wafer from a boule including semiconductor material may include: creating a damage layer in a boule comprising semiconductor material. The boule may have a first end and a second end. The method may include cooling the first end of the boule and heating the second end of the boule. A thermal gradient may be formed between the cooled first end and the heated second end. The thermal gradient may assist a silicon carbide wafer to separate from the boule at the damage layer.
1. A method of separating a wafer from a boule comprising a semiconductor material, the method comprising:
creating a damage layer in a boule comprising semiconductor material, wherein the boule has a first end and a second end;
cooling the first end of the boule; and
heating the second end of the boule;
wherein a thermal gradient between the cooled first end and the heated second end assists a silicon carbide wafer to separate from the boule at the damage layer.
2. The method of claim 1 , wherein the damage layer is created through laser irradiation.
3. The method of claim 1 , wherein cooling the first end of the boule and heating the second end of the boule occurs simultaneously and the second end of the boule is heated through contacting a heating chuck.
4. The method of claim 1 , wherein heating the second end of the boule comprises applying pulses of heat using a heating chuck.
5. The method of claim 1 , wherein cooling the first end of the boule further comprises contacting the first end of the boule with liquid nitrogen and heating the second end of the boule further comprises applying a hot liquid to the second end of the boule.
6. The method of claim 1 , wherein cooling the first end of the boule further comprises contacting the first end of the boule with liquid nitrogen and heating the second end of the boule further comprises rapidly immersing the second end of the boule into a hot liquid.
7. The method of claim 1 , further comprising placing the second side of the boule on a heating chuck and one of peeling, prying, and twisting the first end of the boule with a grip while applying heat to the second side of the boule.
8. A method of separating a wafer from a boule of silicon carbide, the method comprising:
creating a damage layer in a boule of silicon carbide, wherein the boule has a first end and a second end;
applying a material onto the second end of the boule;
cooling the first end of the boule; and
heating the material at the second end of the boule;
wherein a thermal gradient caused by heating the second end of the boule and cooling the first end of boule assists a silicon carbide wafer to separate from the boule at the damage layer.
9. The method of claim 8 , wherein the damage layer is created through laser irradiation.
10. The method of claim 8 , wherein the material increases thermal conduction to the second end of the boule.
11. The method of claim 8 , wherein cooling the first end of the boule and heating the material at the second end of the boule occurs simultaneously and the material at the second end of the boule is heated through contacting a heating chuck and heating rapidly.
12. The method of claim 8 , wherein heating the second end of the boule comprises applying pulses of heat through a heating chuck.
13. The method of claim 8 , wherein cooling the first end of the boule further comprises contacting the first end of the boule with liquid nitrogen and heating the second end of the boule further comprises applying a hot liquid to the second end of the boule.
14. The method of claim 8 , wherein cooling the first end of the boule further comprises contacting the first end of the boule with liquid nitrogen and heating the second end of the boule further comprises rapidly immersing the second end of the boule into a hot liquid.
15. The method of claim 8 , further comprising placing the second side of the boule on a heating chuck, one of peeling, prying, and twisting the first end of the boule with a grip while applying heat to the second side of the boule.
16. A method of separating a wafer from a boule of silicon carbide, the method comprising:
creating a damage layer in a boule of silicon carbide, wherein the boule has a first end and a second end;
cooling the first end of the boule by contacting with liquid nitrogen;
heating the second end of the boule;
creating a thermal gradient between the first end and the second end of the boule through the simultaneous heating of the first end of the boule and cooling of the second end of the boule; and
mechanically separating a silicon carbide wafer from the boule at the damage layer.
17. The method of claim 16 , wherein the second end of the boule is contacted to a heating chuck and heated rapidly.
18. The method of claim 16 , wherein heating the second end of the boule further comprises applying pulses of heat through a heating chuck.
19. The method of claim 16 , wherein heating the second end of the boule further comprises applying a hot liquid to the second end of the boule.
20. The method of claim 16 , wherein heating the second end of the boule further comprises immersing the second end of the boule into a hot liquid.