IP Library Granted Patent US 11,127,782
Granted Patent B2
US 11,127,782 · App. 16/024,601 · Granted Sep 21, 2021

Magnetic memory array incorporating selectors and method for manufacturing the same

Inventors: Hongxin Yang (Newark, CA); Bing K. Yen (Cupertino, CA)
Assignee: Avalanche Technology, Inc.
H01L27/222H01L43/02H01L43/12H01L43/10
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Quick Facts
Patent No.
US 11,127,782
App. No.
16/024,601
Granted
Sep 21, 2021
Kind
B2
Abstract

The present invention is directed to a memory cell array comprising an array of magnetic memory elements arranged in rows and columns; a plurality of electrodes, each of which is formed adjacent to a respective one of the array of magnetic memory elements; a plurality of first conductive lines, each of which is connected to a respective row of the array of magnetic memory elements along a row direction; and a plurality of composite lines. Each composite line includes a volatile switching layer connected to a respective column of the plurality of electrodes along a column direction; an electrode layer formed adjacent to the volatile switching layer; and a second conductive line formed adjacent to the electrode layer. The dimension of the volatile switching layer may be substantially larger than the size of the magnetic memory element along the row direction.

Claims (18)

1. A magnetic memory array comprising:

an array of magnetic memory elements arranged in rows and columns;

a plurality of first conductive lines formed beneath the array of magnetic memory elements, each of the plurality of first conductive lines connected to a respective row of the array of magnetic memory elements along a row direction; and

a plurality of composite lines formed above the array of magnetic memory elements, each of the plurality of composite lines including a volatile switching layer connected to a respective column of the array of magnetic memory elements along a column direction and an electrode layer formed on top of the volatile switching layer.

2. The memory array of claim 1 , further comprising a plurality of electrodes, each of which is formed between a respective one of the array of magnetic memory elements and a respective one of the volatile switching layers.

3. The memory array of claim 1 , wherein each of the array of magnetic memory elements includes two magnetic layers with an insulating tunnel junction layer interposed therebetween.

4. The memory array of claim 1 , wherein a dimension of the volatile switching layer along the row direction is substantially larger than a dimension of one of the array of magnetic memory elements along the row direction.

5. The memory array of claim 1 , wherein each of the plurality of composite lines further includes a second conductive line formed on top of the electrode layer.

6. The memory array of claim 1 , wherein a current path through one of the array of magnetic memory elements at a cross point between a respective one the plurality of first conductive lines and a respective one of the plurality of composite lines is substantially perpendicular to the row and column directions.

7. A magnetic memory array comprising:

an array of magnetic memory elements arranged in rows and columns;

a plurality of first conductive lines formed beneath the array of magnetic memory elements, each of the plurality of first conductive lines connected to a respective row of the array of magnetic memory elements along a row direction;

a sheet of volatile switching layer formed on top of the array of magnetic memory elements and covering the array of magnetic memory elements along the row direction and a column direction; and

a plurality of electrode lines formed on top of the sheet of volatile switching layer, each of the plurality of electrode lines aligned to a respective column of the array of magnetic memory elements along the column direction.

8. The memory array of claim 7 , further comprising a plurality of electrodes, each of which is formed between a respective one of the array of magnetic memory elements and the sheet of volatile switching layer.

9. The memory array of claim 7 , wherein each of the array of magnetic memory elements includes two magnetic layers with an insulating tunnel junction layer interposed therebetween.

10. The memory array of claim 7 further comprising a plurality of second conductive lines formed on top of the plurality of electrode lines.

11. The memory array of claim 7 , wherein a current path through one of the array of magnetic memory elements at a cross point between a respective one of the plurality of first conductive lines and a respective one the plurality of electrode lines is substantially perpendicular to the row and column directions.

Assignments (6)
SECURITY INTEREST Recorded Mar 18, 2022
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 059436/0203 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057213/0050 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057217/0674 →
SECURITY INTEREST Recorded Jul 8, 2020
From: AVALANCHE TECHNOLOGY, INC.
To: SILICON VALLEY BANK
Reel/Frame 053156/0223 →
SECURITY INTEREST Recorded Feb 13, 2020
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 051930/0396 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 14, 2018
From: YANG, HONGXIN; YEN, BING K
To: AVALANCHE TECHNOLOGY, INC.
Reel/Frame 046827/0585 →