IP Library Granted Patent US 10,504,989
Granted Patent B2
US 10,504,989 · App. 16/035,883 · Granted Dec 10, 2019

Avalanche-rugged silicon carbide (SiC) power device

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Quick Facts
Patent No.
US 10,504,989
App. No.
16/035,883
Granted
Dec 10, 2019
Kind
B2
Abstract

In at least one general aspect, a silicon carbide (SiC) device can include a drift region and a termination region at least partially surrounding the SiC device. The termination region can have a first transition zone and a second transition zone. The first transition zone can be disposed between a first zone and a second zone, and the second zone can have a top surface lower in depth than a depth of a top surface of the first zone. The first transition zone can have a recess, and the second transition zone can be disposed between the second zone and a third zone.

Claims (43)

1. An apparatus, comprising:

a drift region of a first conductivity type;

a shielding body defined by a trench and a shielding body doped region, the shielding body doped region having a thickness at least one third of a depth of the trench;

a rim having a second conductivity type and at least partially surrounding a silicon carbide (SiC) device; and

a termination region at least partially surrounding the SiC device and the shielding body, the termination region at least partially surrounding the rim and having the second conductivity type.

2. The apparatus of claim 1 , wherein the termination region has a transition zone disposed between a first zone and a second zone.

3. The apparatus of claim 2 , wherein the first zone has a depth equal to a depth of a doped region of the second zone.

4. The apparatus of claim 2 , wherein the transition zone has an edge defined by a step.

5. The apparatus of claim 1 , wherein the shielding body is included within a plurality of shielding bodies.

6. The apparatus of claim 1 , wherein the shielding body is included in an array of a plurality of shielding bodies interleaved with a plurality of Schottky regions.

7. The apparatus of claim 1 , wherein the drift region has a first conductivity type,

the apparatus further comprising:

a shielding body; and

a Schottky region,

the rim at least partially surrounding the shielding body and the Schottky region.

8. The apparatus of claim 1 , wherein the shielding body has a doping concentration the same as the doping concentration of a rim doped region of the rim.

9. An apparatus, comprising:

a drift region of a first conductivity type;

a rim having a second conductivity type and at least partially surrounding a silicon carbide (SiC) device;

a termination region at least partially surrounding the rim and having the second conductivity type; and

a shielding body defined by a trench and a shielding body doped region, the shielding body doped region having a thickness at least one third of a depth of the trench.

10. The apparatus of claim 9 , further comprising:

a first transition zone and a second transition zone each having a recess.

11. The apparatus of claim 9 , wherein the shield body is included in an array of a plurality of shielding bodies interleaved with a plurality of Schottky regions.

12. The apparatus of claim 9 , wherein the termination region has a first zone having a doped region with a first thickness, the termination region has a second zone having a doped region with a second thickness different from the first thickness.

13. The apparatus of claim 12 , wherein the doped region of the first zone has a depth equal to a depth of the doped region of the second zone.

14. The apparatus of claim 12 , wherein the termination region has a transition zone disposed between the first zone and the second zone.

15. The apparatus of claim 9 , wherein the drift region has the first conductivity type,

the apparatus further comprising:

an array of a plurality of shielding bodies interleaved with a plurality of Schottky regions, the rim at least partially surrounding the array.

16. The apparatus of claim 9 , wherein the shielding body is included within a plurality of shielding bodies.

17. An apparatus, comprising:

a drift region;

a rim at least partially surrounding a silicon carbide (SiC) device;

a termination region including a transition zone disposed between a first zone and a second zone, the termination region at least partially surrounding the rim; and

a shielding body defined by a trench and a shielding body doped region, the shielding body doped region having a thickness at least one third of a depth of the trench, the rim at least partially surrounding the shielding body.

18. The apparatus of claim 17 , wherein the shielding body is included in an array of a plurality of shielding bodies interleaved with a plurality of Schottky regions.

19. The apparatus of claim 17 , wherein the transition zone is a first transition zone,

the apparatus further comprising a second transition zone disposed between the second zone and a third zone.

20. The apparatus of claim 17 , wherein the drift region has a first conductivity type,

the apparatus further comprising:

a Schottky region,

the rim having a second conductivity type and at least partially surrounding the Schottky region, the termination region having the second conductivity type.

Assignments (9)
SECURITY INTEREST Recorded Jul 13, 2023
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; GTAT CORPORATION
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064271/0971 →
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 047399, FRAME 0631 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064078/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 058871, FRAME 0799 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 065653/0001 →
SECURITY INTEREST Recorded Nov 12, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 058871/0799 →
RELEASE OF SECURITY INTEREST Recorded Oct 28, 2021
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 057969/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2021
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 057694/0374 →
SECURITY INTEREST Recorded Nov 1, 2018
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047399/0631 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2018
From: KONSTANTINOV, ANDREI
To: TRANSIC AB
Reel/Frame 046357/0217 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2018
From: TRANSIC AB
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 046357/0360 →