IP Library › Granted Patent US 10,672,712
Granted Patent B2
US 10,672,712 · App. 16/048,826 · Granted Jun 2, 2020

Multi-RDL structure packages and methods of fabricating the same

Inventors: Milind S. Bhagavat (Los Altos, CA); Lei Fu (Austin, TX); Farshad Ghahghahi (San Jose, CA)
Assignee: Advanced Micro Devices, Inc.
H01L23/5386H01L21/4857H01L21/563H01L21/565H01L21/568H01L21/6835H01L23/3128H01L24/19H01L24/24H01L25/0655H01L25/16H01L25/50H01L2221/6835H01L2221/68345H01L2224/211H01L2224/24137H01L2924/19105H01L2924/3511
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,672,712
App. No.
16/048,826
Granted
Jun 2, 2020
Kind
B2
Abstract

Various arrangements of multi-RDL structure devices are disclosed. In one aspect, an apparatus is provided that includes a first redistribution layer structure and a second redistribution layer structure mounted on the first redistribution layer structure. A first semiconductor chip is mounted on the second redistribution layer structure and electrically connected to both the second redistribution layer structure and the first redistribution layer structure.

Claims (33)

1. An apparatus, comprising:

a first redistribution layer structure;

a second redistribution layer structure mounted on the first redistribution layer structure, the first redistribution layer structure and the second redistribution layer structure being separated by a gap;

a first semiconductor chip mounted on the second redistribution layer structure and electrically connected to both the second redistribution layer structure and the first redistribution layer structure; and

plural surface components mounted on the first redistribution layer structure in spaced-apart relation to the first semiconductor chip.

2. The apparatus of claim 1 , wherein the first redistribution layer structure comprises a first plurality of I/Os to electrically interface with a circuit board.

3. The apparatus of claim 1 , comprising a second plurality of I/Os to electrically interface the second redistribution layer structure and the first redistribution layer structure.

4. The apparatus of claim 1 , comprising plural bumpless interconnects to electrically connect the first semiconductor chip to the second redistribution layer structure.

5. The apparatus of claim 1 , comprising a first molding material encasing the plural surface components.

6. The apparatus of claim 1 , comprising a first molding material at least partially encasing the first semiconductor chip.

7. The apparatus of claim 1 , comprising a second semiconductor chip mounted on the second redistribution layer structure in spaced-apart relation to the first semiconductor chip, the second redistribution layer structure electrically connecting the first semiconductor chip to the second semiconductor chip.

8. The apparatus of claim 1 , wherein the first redistribution layer structure includes plural conductor structures of a first design rule and the second redistribution layer structure includes plural conductor structures of a second design rule with finer line width and spacing than the first design rule.

9. An apparatus, comprising:

a first redistribution layer structure having plural conductor structures of a first design rule and a first plurality of I/Os to connect the first redistribution layer structure to another circuit board;

a second redistribution layer structure mounted on the first redistribution layer structure, the first redistribution layer structure and the second redistribution layer structure being separated by a gap, the second redistribution layer structure having plural conductor structures of a second design rule with finer line width and spacing than the first design rule; and

a first semiconductor chip mounted on the second redistribution layer structure and electrically connected to both the second redistribution layer structure and the first redistribution layer structure.

10. The apparatus of claim 9 , comprising a second plurality of I/Os to electrically interface the second redistribution layer structure and the first redistribution layer structure.

11. The apparatus of claim 9 , comprising plural bumpless interconnects to electrically connect the first semiconductor chip to the second redistribution layer structure.

12. The apparatus of claim 9 , comprising a first molding material at least partially encasing the first semiconductor chip.

13. The apparatus of claim 9 , comprising a second semiconductor chip mounted on the second redistribution layer structure in spaced-apart relation to the first semiconductor chip, the second redistribution layer structure electrically connecting the first semiconductor chip to the second semiconductor chip.

14. The apparatus of claim 9 , comprising plural surface components mounted on the first redistribution layer structure in spaced-apart relation to the first semiconductor chip.

15. An apparatus, comprising:

a first redistribution layer structure;

a second redistribution layer structure mounted on the first redistribution layer structure, the first redistribution layer structure and the second redistribution layer structure being separated by a gap;

a first semiconductor chip mounted on the second redistribution layer structure and electrically connected to both the second redistribution layer structure and the first redistribution layer structure;

a first molding material at least partially encasing the first semiconductor chip; and

a second molding material on the first redistribution layer structure at least partially encasing the second redistribution layer structure.

16. The apparatus of claim 15 , wherein the first redistribution layer structure comprises a first plurality of I/Os to electrically interface with a circuit board.

17. The apparatus of claim 15 , comprising a second plurality of I/Os to electrically interface the second redistribution layer structure and the first redistribution layer structure.

18. The apparatus of claim 15 , comprising plural bumpless interconnects to electrically connect the first semiconductor chip to the second redistribution layer structure.

19. The apparatus of claim 15 , comprising plural surface components mounted on the first redistribution layer structure in spaced-apart relation to the first semiconductor chip.

20. The apparatus of claim 15 , comprising a second semiconductor chip mounted on the second redistribution layer structure in spaced-apart relation to the first semiconductor chip, the second redistribution layer structure electrically connecting the first semiconductor chip to the second semiconductor chip.

21. The apparatus of claim 15 , wherein the first redistribution layer structure includes plural conductor structures of a first design rule and the second redistribution layer structure includes plural conductor structures of a second design rule with finer line width and spacing than the first design rule.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2018
From: BHAGAVAT, MILIND S.; GHAHGHAHI, FARSHAD
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 046500/0453 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2018
From: FU, LEI
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 046500/0484 →
Continuity (1)
Related Publication 20200035606A1 · Jan 30, 2020
Cited By (3)
US 12,266,608 US 12,564,079 US 12,727,494