IP Library › Granted Patent US 11,133,176
Granted Patent B2
US 11,133,176 · App. 16/058,032 · Granted Sep 28, 2021

Substrate processing method, recording medium and substrate processing system

Inventors: Kento Tsukano (Koshi, JP); Gentaro Goshi (Koshi, JP); Takuro Masuzumi (Koshi, JP); Hiromi Kiyose (Koshi, JP); Shogo Fukui (Koshi, JP)
Assignee: TOKYO ELECTRON LIMITED
H01L21/02101B08B3/041B08B3/08B08B3/10H01L21/6719H01L21/67028H01L21/67034H01L21/67051H01L21/67126H01L21/67748H01L21/68764
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,133,176
App. No.
16/058,032
Granted
Sep 28, 2021
Kind
B2
Abstract

In a substrate processing method, as a liquid film forming process, a liquid film of a processing liquid covering a surface of a substrate W is formed by supplying the processing liquid onto the surface of the substrate W while rotating the substrate W at a first rotation number. After the liquid film forming process, as a supply stopping process, a rotation number of the substrate W is set to be of a value equal to or less than the first rotation number and a supply of the processing liquid onto the substrate W is stopped. After the supply stopping process, as a liquid amount adjusting process, a liquid amount of the processing liquid forming the liquid film is reduced by setting the rotation number of the substrate W to a rotation number larger than the first rotation number.

Claims (16)

1. A substrate processing method, comprising:

a liquid film forming process of forming, by supplying a processing liquid onto a surface of a substrate while rotating the substrate at a first rpm (revolutions per minute), a liquid film of the processing liquid covering the surface of the substrate;

a supply stopping process of stopping after the liquid film forming process, the rotation of the substrate and stopping a supply of the processing liquid onto the substrate;

a first liquid amount adjusting process of reducing, after the supply stopping process, a liquid amount of the processing liquid forming the liquid film while rotating the substrate at a second rpm larger than the first rpm,

a periphery supply process of supplying, after the first liquid amount adjusting process, the processing liquid onto a peripheral portion of the substrate while rotating the substrate at a third rpm, the third rpm being equal to the first rpm,

wherein in the periphery supply process, the processing liquid is supplied by a nozzle located above a peripheral portion of the substrate.

2. The substrate processing method of claim 1 ,

wherein, in the supply stopping process, the supply of the processing liquid is stopped after the rotation of the substrate is stopped.

3. The substrate processing method of claim 1 , further comprising:

a second liquid amount adjusting process of stopping, after the periphery supply process, the supply of the processing liquid onto the substrate and reducing the liquid amount of the processing liquid forming the liquid film while rotating the substrate.

4. The substrate processing method of claim 1 , further comprising:

a carry-in process of carrying, after the first liquid amount adjusting process, the substrate with the liquid film of the processing liquid formed thereon into a processing vessel; and

a drying process of drying, after the carry-in process, the substrate by supplying a pressurized processing fluid into the processing vessel and draining the processing fluid from the processing vessel while supplying the pressurized processing fluid into the processing vessel and maintaining a pressure within the processing vessel at a pressure where the processing fluid maintains a critical state.

5. A computer-readable recording medium having stored thereon computer-executable instructions that, in response to execution, cause a substrate processing system to perform a substrate processing method as claimed in claim 1 .

6. The substrate processing method of claim 3 ,

wherein, in the second liquid amount adjusting process, the substrate is rotated at a fourth rpm, the fourth rpm having a value equal to or less than the second rpm.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2018
From: TSUKANO, KENTO; GOSHI, GENTARO; MASUZUMI, TAKURO; KIYOSE, HIROMI; FUKUI, SHOGO
To: TOKYO ELECTRON LIMITED
Reel/Frame 046740/0630 →
Priority Claims (2)
JP JP2017-154574 · Aug 9, 2017 · national
JP JP2018-094906 · May 16, 2018 · national
Continuity (1)
Related Publication 20190051519A1 · Feb 14, 2019