Radiation-hardened break before make circuit
A break-before-make (BB4M) circuit topology is disclosed for use with a multiplexer that eliminates shoot-through current between analog inputs and also between an analog input and analog output. The BB4M circuit generates a pulse that disables an existing selected channel before enabling a newly selected channel or gate driver, and is suitable for use in high-radiation or outer space operating environments.
1. A radiation hardened circuit, comprising:
an input for receiving an input signal;
a first delay circuit for generating a first delayed input signal having a first delay with respect to the input signal;
a second delay circuit for generating a second delayed input signal having a second delay with respect to the input signal; and
an exclusive-nor logic circuit with a first input, a second input, and an output, wherein the first input is coupled to the input signal and the second input is coupled to the second delayed input signal, and the exclusive-nor logic circuit is configured to generate a break-before-make pulse having a pulse width in response to a transition of the input signal;
a second output coupled to the output of the exclusive-nor logic circuit; and
a decoder circuit coupled to the first delay circuit and the exclusive-nor logic circuit, the decoder circuit is configured to enable one of a plurality of channel select signals according to the first delayed input signal and the break-before-make pulse, wherein the second delay is greater than the first delay, and the first delayed input signal transitions during the pulse width of the break-before-make pulse.
2. The radiation hardened circuit of claim 1 , wherein the input is coupled to an address select line.
3. The radiation hardened circuit of claim 2 , further comprising a first output coupled to the first delayed input signal, wherein the first output is coupled to a delayed address select line having the first delay with respect to the input signal.
4. The radiation hardened circuit of claim 3 , wherein the second output is coupled to a break-before-make pulse line.
5. The radiation hardened circuit of claim 1 , wherein the first delay circuit comprises:
one or more series resistive circuit elements,
one or more shunt capacitive circuit elements, and
a buffer circuit.
6. The radiation hardened circuit of claim 5 , wherein the buffer circuit comprises one or more inverter logic gates.
7. The radiation hardened circuit of claim 1 , wherein the second delay circuit comprises:
one or more series resistive circuit elements,
one or more shunt capacitive circuit elements, and
one or more buffer circuits.
8. The radiation hardened circuit of claim 7 , wherein the second delay circuit further comprises a trimming circuit configured to adjust a value of at least one of the one or more series resistive circuit elements.
9. The radiation hardened circuit of claim 8 , wherein the trimming circuit comprises switches configured to selectively bypass the at least one of the one or more series resistive circuit elements.
10. The radiation hardened circuit of claim 7 , wherein the second delay circuit further comprises a trimming circuit configured to adjust a value of at least one of the one or more shunt capacitive circuit elements.
11. The radiation hardened circuit of claim 10 , wherein the trimming circuit comprises switches to selectively decouple the at least one of the one or more shunt capacitive circuit elements.
12. The radiation hardened circuit of claim 1 , wherein the second delay circuit is further configured to introduce a longer delay for a rising edge transition on the input signal than for a falling edge transition on the input signal.
13. The radiation hardened circuit of claim 1 , wherein the second delay circuit is further configured to introduce a longer delay for a falling edge transition on the input signal than for a rising edge transition on the input signal.
14. The radiation hardened circuit of claim 1 , wherein the output of the exclusive-nor logic circuit is coupled to an input of a buffer circuit; and the second output is coupled to an output of the buffer circuit.
15. The radiation hardened circuit of claim 1 , wherein neither of the first delay circuit or the second delay circuit contains any of a latch, a flip-flop, and a cross-coupled circuit structure.
16. The radiation hardened circuit of claim 1 , wherein the first delay circuit and the second delay circuit are generated with resistor-capacitor circuits.
17. The radiation hardened circuit of claim 1 , wherein the decoder circuit is configured to enable one of a plurality of channel select signals with a decoding delay defined at least partially by the pulse width of the break-before-make pulse.
18. The radiation hardened circuit of claim 1 , wherein the pulse width of the break-before-make pulse is at least partially defined by the second delay of the second delayed input signal.