IP Library Granted Patent US 10,797,144
Granted Patent B2
US 10,797,144 · App. 16/130,432 · Granted Oct 6, 2020

Semiconductor device

Inventors: Megumi Ishiduki (Yokkaichi, JP); Hiroshi Nakaki (Yokkaichi, JP); Takamasa Ito (Nagoya, JP)
Assignee: TOSHIBA MEMORY CORPORATION
H01L29/42344H01L27/11565H01L27/11575H01L27/11582H01L29/66833H01L29/7926H01L23/528H01L27/1157H01L27/11573
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Quick Facts
Patent No.
US 10,797,144
App. No.
16/130,432
Granted
Oct 6, 2020
Kind
B2
Abstract

A semiconductor device includes a base body, a stacked body on the base body and a first columnar part. The base body includes a substrate, a first insulating film on the substrate, a first conductive film on the first insulating film, and a first semiconductor part on the first conductive film. The stacked body includes conductive layers and insulating layers stacked alternately in a stacking direction. The first columnar part is provided inside the stacked body and the first semiconductor part. The first columnar part includes a semiconductor body and a memory film between the semiconductor body and conductive layers. The semiconductor body extends in the stacking direction. The first columnar part has a first diameter and a second diameter in a first direction crossing the stacking direction. The first diameter inside the first semiconductor part is larger than the second diameter inside the stacked body.

Claims (58)

1. A semiconductor device, comprising:

a base body including a first insulating film and a first semiconductor part provided above the first insulating film;

a stacked body provided above the base body, the stacked body including a plurality of conductive layers and a plurality of insulating layers, the conductive layers and the insulating layers being stacked alternately; and

a first columnar part provided inside the stacked body and inside the first semiconductor part, the first columnar part including a semiconductor body and a memory film, the semiconductor body extending in a stacking direction of the stacked body and being electrically connected to the first semiconductor part, the memory film including a charge trapping portion between the semiconductor body and one of conductive layers,

the first columnar part having a first diameter in a first direction crossing the stacking direction inside the first semiconductor part and a second diameter in the first direction inside the stacked body, the first diameter being larger than the second diameter,

the first semiconductor part including a first semiconductor layer, a second semiconductor layer and a third semiconductor layer, the second semiconductor layer contacting the first semiconductor layer and the semiconductor body, the third semiconductor layer contacting the second semiconductor layer, and

the first columnar part including a first portion surrounded with the third semiconductor layer, the first diameter being a diameter of the first portion.

2. The semiconductor device according to claim 1 , wherein

the plurality of insulating layers includes a first insulating layer,

and

the second diameter is a diameter of the first columnar part at a second portion surrounded with the first insulating layer.

3. The semiconductor device according to claim 2 , wherein the first insulating layer is positioned at a level most proximal to the first semiconductor part among the plurality of insulating layers.

4. The semiconductor device according to claim 1 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the first columnar part extending through the second semiconductor part in the stacking direction, the first columnar part having a third diameter in the first direction inside the second semiconductor part, the third diameter being larger than the second diameter.

5. The semiconductor device according to claim 1 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the first columnar part extending through the second semiconductor part in the stacking direction, the first columnar part having a third diameter in the first direction inside the second semiconductor part, the third diameter being equal to or less than the first diameter.

6. The semiconductor device according to claim 1 , further comprising a second columnar part provided inside the stacked body and inside the first semiconductor part,

the second columnar part including an insulator extending in the stacking direction and contacting the first semiconductor part,

the second columnar part having a fourth diameter in the first direction inside the first semiconductor part and a fifth diameter in the first direction inside the stacked body, the fourth diameter being larger than the fifth diameter.

7. The semiconductor device according to claim 6 , wherein

the second columnar part includes a recess portion inside the first semiconductor part,

the plurality of insulating layers includes a first insulating layer,

the fourth diameter is a diameter of the second columnar part at a fourth portion, the fourth portion being other than the recess portion of the second columnar part inside the first semiconductor part, and

the fifth diameter is a diameter of the second columnar part at a fifth portion surrounded with the first insulating layer.

8. The semiconductor device according to claim 7 , wherein

the fourth portion is a portion of the second columnar part surrounded with the third semiconductor layer, the fourth diameter being a diameter of the fourth portion.

9. The semiconductor device according to claim 7 , wherein the first insulating layer is positioned at a level most proximal to the first semiconductor part among the plurality of insulating layers.

10. The semiconductor device according to claim 6 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the second columnar part extending through the second semiconductor part in the stacking direction, the second columnar part having a sixth diameter in the first direction inside the second semiconductor part, the sixth diameter being larger than the fifth diameter.

11. The semiconductor device according to claim 6 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the second columnar part extending through the second semiconductor part in the stacking direction, the second columnar part having a sixth diameter in the first direction inside the second semiconductor part, the sixth diameter being equal to or less than the fourth diameter.

12. A semiconductor device, comprising:

a base body including a first insulating film and a first semiconductor part provided above the first insulating film;

a stacked body provided above the base body, the stacked body including a plurality of conductive layers and a plurality of insulating layers, the conductive layers and the insulating layers being stacked alternately;

a first columnar part provided inside the stacked body and inside the first semiconductor part, the first columnar part including a semiconductor body and a memory film, the semiconductor body extending in a stacking direction of the stacked body and being electrically connected to the first semiconductor part, the memory film including a charge trapping portion between the semiconductor body and one of conductive layers; and

a second columnar part provided inside the stacked body and inside the first semiconductor part, the second columnar part including an insulator extending in the stacking direction and contacting the first semiconductor part,

the first columnar part having a first diameter in a first direction crossing the stacking direction inside the first semiconductor part and a second diameter in the first direction inside the stacked body, the first diameter being larger than the second diameter,

the second columnar part having a fourth diameter in the first direction inside the first semiconductor part and a fifth diameter in the first direction inside the stacked body, the fourth diameter being larger than the fifth diameter.

13. The semiconductor device according to claim 12 , wherein

the second columnar part includes a recess portion inside the first semiconductor part,

the plurality of insulating layers includes a first insulating layer,

the fourth diameter is a diameter of the second columnar part at a fourth portion, the fourth portion being other than the recess portion of the second columnar part inside the first semiconductor part, and

the fifth diameter is a diameter of the second columnar part at a fifth portion surrounded with the first insulating layer.

14. The semiconductor device according to claim 13 , wherein

the first semiconductor part includes:

a first semiconductor layer;

a second semiconductor layer contacting the first semiconductor layer and the semiconductor body; and

a third semiconductor layer contacting the second semiconductor layer, and

the fourth portion is a portion of the second columnar part surrounded with the third semiconductor layer, the fourth diameter being a diameter of the fourth portion.

15. The semiconductor device according to claim 13 , wherein the first insulating layer is positioned at a level most proximal to the first semiconductor part among the plurality of insulating layers.

16. The semiconductor device according to claim 12 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the second columnar part extending through the second semiconductor part in the stacking direction, the second columnar part having a sixth diameter in the first direction inside the second semiconductor part, the sixth diameter being larger than the fifth diameter.

17. The semiconductor device according to claim 12 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the second columnar part extending through the second semiconductor part in the stacking direction, the second columnar part having a sixth diameter in the first direction inside the second semiconductor part, the sixth diameter being equal to or less than the fourth diameter.

18. The semiconductor device according to claim 12 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the first columnar part extending through the second semiconductor part in the stacking direction, the first columnar part having a third diameter in the first direction inside the second semiconductor part, the third diameter being larger than the second diameter.

19. The semiconductor device according to claim 12 , further comprising a second semiconductor part positioned between the stacked body and the first semiconductor part,

the first columnar part extending through the second semiconductor part in the stacking direction, the first columnar part having a third diameter in the first direction inside the second semiconductor part, the third diameter being equal to or less than the first diameter.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2018
From: ISHIDUKI, MEGUMI; NAKAKI, HIROSHI; ITO, TAKAMASA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 047481/0983 →
Priority Claims (1)
JP 2018-055371 · Mar 22, 2018 · national
Continuity (1)
Related Publication 20190296117A1 · Sep 26, 2019
Cited By (1)
US 12,389,637