Phase-front-modulation sensor

1. A sensor comprising:

at least one optical waveguide configured to emit light in a direction; and

an optical reflector optically coupled to the at least one optical waveguide, the optical reflector configured to reflect at least a portion of the light, the optical reflector comprising:

a first portion of the optical reflector configured to reflect a first portion of the light back to the at least one optical waveguide; and

a second portion of the optical reflector configured to reflect a second portion of the light back to the at least one optical waveguide, the second portion of the optical reflector responsive to a perturbation by moving relative to the first portion of the optical reflector, the reflected second portion of the light differing in phase from the reflected first portion of the light by a phase difference that is not substantially equal to an integer multiple of π when the second portion of the optical reflector is in an equilibrium position in absence of the perturbation.

2. The sensor of claim 1 , wherein the at least one optical waveguide comprises an optical fiber.

3. The sensor of claim 2 , wherein the at least one optical waveguide further comprises at least one lens configured to receive the light from the optical fiber and to transmit the light towards the optical reflector.

4. The sensor of claim 3 , wherein the at least one lens comprises a graded-index lens.

5. The sensor of claim 3 , wherein the at least one lens is configured to collimate the light emitted from the optical fiber and to return the reflected first portion of the light and the reflected second portion of the light to the optical fiber.

6. The sensor of claim 1 , further comprising a laser configured to generate the light, the light having at least one wavelength, the sensor further comprising an optical signal analyzer configured to receive the reflected first portion of the light and the reflected second portion of the light from the at least one optical waveguide.

7. A sensor comprising:

at least one optical waveguide configured to emit light in a direction; and

an optical reflector optically coupled to the at least one optical waveguide, the optical reflector configured to reflect at least a portion of the light, the optical reflector comprising:

a first portion of the optical reflector configured to reflect a first portion of the light back to the at least one optical waveguide; and

a second portion of the optical reflector configured to reflect a second portion of the light back to the at least one optical waveguide, the second portion of the optical reflector responsive to a perturbation by moving relative to the first portion of the optical reflector, the reflected second portion of the light differing in phase from the reflected first portion of the light by a phase difference that is not substantially equal to an integer multiple of π when the second portion of the optical reflector is in an equilibrium position in absence of the perturbation, wherein the optical reflector comprises a wafer, the first portion of the optical reflector comprising a first surface of the wafer, the second portion of the optical reflector comprising a diaphragm offset from the first portion of the optical reflector along the direction, the diaphragm in a well surrounded by the first surface.

8. The sensor of claim 7 , wherein the diaphragm is thinner than portions of the wafer surrounding the diaphragm.

9. The sensor of claim 7 , wherein the diaphragm is elastically deformable in response to the perturbation.

10. The sensor of claim 7 , wherein the light has a wavelength and the well has a depth substantially equal to one-eighth of the wavelength.

11. The sensor of claim 7 , wherein the light has a width greater than a width of the well.

12. The sensor of claim 7 , wherein the light has a width less than or equal to a width of the well.

13. The sensor of claim 7 , wherein the optical reflector comprises a plurality of spring structures mechanically coupled to the first portion of the optical reflector and to the diaphragm, the plurality of spring structures configured to elastically stretch and move such that the diaphragm translates in a direction that is generally perpendicular to the diaphragm.

14. The sensor of claim 7 , wherein the diaphragm is mechanically coupled to the wafer along a perimeter of the diaphragm, and the diaphragm is configured to elastically bow back and forth in a direction that is generally perpendicular to the diaphragm.

15. The sensor of claim 1 , wherein the phase difference is substantially equal to an odd integer multiple of π/2.

16. The sensor of claim 1 , wherein the phase difference has a magnitude that is in at least one of the following ranges: substantially greater than zero and substantially less than π, substantially greater than π and substantially less than 2π, substantially greater than 2π and substantially less than 3π, substantially greater than zero and less than or equal to π/2, greater than or equal to π/2 and substantially less than π, substantially greater than πand less than or equal to 3π/2, greater than or equal to 3π/2 and substantially less than 2π, substantially greater than 2π and less than or equal to 5π/2, and greater than or equal to 5π/2 and substantially less than 3π.

17. A sensor comprising:

at least one optical waveguide configured to emit light in a direction; and

an optical reflector optically coupled to the at least one optical waveguide, the optical reflector configured to reflect at least a portion of the light, the optical reflector comprising:

a first portion of the optical reflector configured to reflect a first portion of the light back to the at least one optical waveguide; and

a second portion of the optical reflector configured to reflect a second portion of the light back to the at least one optical waveguide, the second portion of the optical reflector responsive to a perturbation by moving relative to the first portion of the optical reflector, the reflected second portion of the light differing in phase from the reflected first portion of the light by a phase difference that is not substantially equal to an integer multiple of π when the second portion of the optical reflector is in an equilibrium position in absence of the perturbation, wherein the optical reflector is a wafer.

18. The sensor of claim 17 , wherein the wafer comprises a semiconductor material.

19. The sensor of claim 17 , wherein the wafer comprises a metal layer.

20. The sensor of claim 17 , wherein the wafer comprises at least one of the following materials: silicon, silicon nitride, silicon carbide, graphene.

21. The sensor of claim 17 , wherein the wafer comprises a photonic crystal structure.