IP Library › Granted Patent US 10,241,056
Granted Patent B2
US 10,241,056 · App. 16/170,283 · Granted Mar 26, 2019

Inspection apparatus, inspection method, and program

Inventor: Hajime Matsuda (Osaka, JP)
Assignee: Keyence Corporation
G01N21/8806G01N21/8851G06K9/2027G06K9/325G06T7/0004G06T7/0008G06T7/586G01N2021/845G01N2201/062G01N2201/12G06T2207/10152G06T2207/20016G06T2207/20221G06T2207/30164
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Quick Facts
Patent No.
US 10,241,056
App. No.
16/170,283
Granted
Mar 26, 2019
Kind
B2
Abstract

To facilitate adjusting of a distance from an inspection target to an illumination section by providing a movable illumination section that is movable independently of the imaging section. An illumination apparatus has a plurality of LEDs arranged in a substantially annular form, a light diffusion member for diffusing light emitted from the plurality of LEDs, and a lighting control part for lighting the plurality of light sources in accordance with a predetermined lighting pattern when designated to start lighting. In particular, the illumination apparatus moves independently of a camera to adjust a distance to a workpiece.

Claims (12)

1. An inspection apparatus comprising:

an illumination section which has a plurality of light segments to illuminate the inspection target from three or more illumination directions;

a processor for controlling the illumination section to light the plurality of light segments;

an imaging section for capturing a plurality of luminance images of an inspection target;

an inspection image generating section for obtaining a normal vector of a surface of the inspection target based on the three or more luminance images acquired by the imaging section and generating a shape image based on the normal vector by a photometric stereo method;

an image selection section for selecting an inspection image out of the plurality of luminance images captured by the imaging section and the shape image generated by the inspection image generating section; and

an inspection tool setting section for setting an inspection tool on the selected image by the image selection section.

2. The inspection apparatus according to claim 1 , wherein the inspection image generating section generates an inclination image made up of pixel values based on the normal vector.

3. The inspection apparatus according to claim 2 , wherein the image selection section accepts the image selection out of the plurality of luminance images, the shape image, and the inclination image.

4. The inspection apparatus according to claim 1 , wherein the inspection image generating section generates all-directional illumination image which is a luminance image acquired by lighting all of the light segments.

5. The inspection apparatus according to claim 4 , wherein the image selection section accepts the image selection out of the plurality of luminance images, the shape image, and the all-directional illumination image.

6. The inspection apparatus according to claim 1 , wherein the inspection image generating section generates a texture image based on a reflectance of surface of the inspection target and the image selection section accepts the image selection out of the plurality of luminance images, the shape image and the texture image.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2018
From: MATSUDA, HAJIME
To: KEYENCE CORPORATION
Reel/Frame 047311/0649 →
Priority Claims (1)
JP 2014-119102 · Jun 9, 2014 · national
Continuity (6)
Continuation 16009244 · Jun 15, 2018
Continuation 15686185 · Aug 25, 2017
Continuation 15586303 · May 4, 2017
Continuation 15290020 · Oct 11, 2016
Continuation 14718113 · May 21, 2015
Related Publication 20190064078A1 · Feb 28, 2019
Cited By (2)
US 12,682,590 US 12,693,233