IP Library Granted Patent US 10,541,015
Granted Patent B2
US 10,541,015 · App. 16/184,688 · Granted Jan 21, 2020

Virtual ground sensing circuitry and related devices, systems, and methods for crosspoint ferroelectric memory

Inventors: Giulio Giuseppe Marotta (Contigliano, IT); Marco Domenico Tiburzi (Avezzano, IT)
Assignee: Micron Technology, Inc.
G11C11/2273G11C7/062G11C7/067G11C11/221G11C11/2253G11C11/5657G11C2213/77
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Quick Facts
Patent No.
US 10,541,015
App. No.
16/184,688
Granted
Jan 21, 2020
Kind
B2
Abstract

A virtual ground sensing circuit includes a sense circuit configured to compare a reference voltage potential to a sense node voltage potential, and virtual ground circuitry operably coupled to the sense circuit. The virtual ground circuitry is configured to provide a virtual ground at a first bias voltage potential to a conductive line operably coupled to a selected ferroelectric memory cell, and discharge the conductive line to the sense node responsive to the selected ferroelectric memory cell changing from a first polarization state to a second polarization state. A method includes applying a second bias voltage potential to another conductive line operably coupled to the selected ferroelectric memory cell, and comparing a sense node voltage potential to a reference voltage potential. Electrical systems and computing devices include virtual ground sensing circuits.

Claims (25)

1. A virtual ground sensing circuit, comprising:

an operational amplifier comprising a non-inverting input, an inverting input, and an amplifier output;

a follower circuit including an n-MOS transistor and a p-MOS transistor, an input of the follower circuit including a gate of the n-MOS transistor operably coupled to a gate of the p-MOS transistor, and an output of the follower circuit including a source of the n-MOS transistor operably coupled to a source of the p-MOS transistor, the output of the follower circuit operably coupled to the inverting input of the operational amplifier;

a comparator configured to compare a sense node voltage at a drain of one of the n-MOS transistor and the p-MOS transistor to a reference voltage potential; and

another comparator configured to compare another sense node voltage at a drain of the other of the n-MOS transistor and the p-MOS transistor to another reference voltage potential.

2. The virtual ground sensing circuit of claim 1 , wherein a drain of the other of the n-MOS transistor and the p-MOS transistor is operably coupled to a power supply voltage potential.

3. The virtual ground sensing circuit of claim 1 , wherein the drain of the one of the n-MOS transistor and the p-MOS transistor is operably coupled to a power supply voltage potential through a transistor configured to isolate the drain of the one of the n-MOS transistor and the p-MOS transistor from the power supply voltage potential during a sense operation.

4. The virtual ground sensing circuit of claim 1 , wherein the output of the follower circuit is operably coupled to a conductive line decoder configured to selectively operably couple the output of the follower circuit to one of a plurality of conductive lines of a memory cell array.

5. The virtual ground sensing circuit of claim 1 , wherein the comparator is configured to compare a drain voltage potential of the p-MOS transistor to the reference voltage potential.

6. The virtual ground sensing circuit of claim 1 , wherein the sense node has a sense node capacitance.

7. The virtual ground sensing circuit of claim 6 , wherein the sense node capacitance includes a parasitic capacitance.

8. The virtual ground sensing circuit of claim 1 , further comprising one or more other comparators configured to compare the sense node voltage to one or more other reference voltage potentials.

9. The virtual ground sensing circuit of claim 1 , further comprising a digital to analog converter (DAC) configured to provide the reference voltage potential to the comparator, wherein a multi-bit digital signal swept from a low digital value to a high digital value is applied to an input of the DAC during a sense operation.

10. The virtual ground sensing circuit of claim 9 , further comprising a latch network configured to store a digital value of the multi-bit digital signal that corresponds to a data state of a selected memory cell operably coupled to a conductive line.

11. The virtual ground sensing circuit of claim 10 , wherein the latch network is configured to be clocked by an output of the comparator.

12. The virtual ground sensing circuit of claim 1 , wherein the operational amplifier is an operational transconductance amplifier.

13. An electrical system, comprising:

at least one memory cell; and

control circuitry operably coupled to the at least one memory cell, the control circuitry comprising:

an operational amplifier comprising a non-inverting input, an inverting input, and an amplifier output;

a follower circuit comprising an n-MOS transistor and a p-MOS transistor, an input of the follower circuit comprising a gate of the n-MOS transistor operably coupled to a gate of the p-MOS transistor, and an output of the follower circuit comprising a source of the n-MOS transistor operably coupled to a source of the p-MOS transistor, the output of the follower circuit operably coupled to the inverting input of the operational amplifier;

a comparator configured to compare a sense node voltage at a drain of one of the n-MOS transistor and the p-MOS transistor to a reference voltage potential; and

a feedback circuit operably coupling the output of the comparator to the inverting input of the operational amplifier and to a conductive line.

14. The electrical system of claim 13 , further comprises the conductive line operably coupled to the at least one memory cell.

15. The electrical system of claim 13 , further comprising a digital to analog converter (DAC) configured to receive a digital signal, an output of the DAC operably coupled to an inverting input of the comparator.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 15, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 051041/0317 →
RELEASE OF SECURITY INTEREST Recorded Oct 14, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050724/0392 →
SUPPLEMENT NO. 12 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 048948/0677 →
SUPPLEMENT NO. 3 TO PATENT SECURITY AGREEMENT Recorded Apr 19, 2019
From: MICRON TECHNOLOGY, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 048951/0902 →
Continuity (3)
Division 15674019 · Aug 10, 2017
Division 14717471 · May 20, 2015
Related Publication 20190096464A1 · Mar 28, 2019