Substrate processing apparatus and substrate processing method
Provided is a substrate processing method for processing a substrate. The substrate processing method includes a step of processing the substrate with a phosphoric acid liquid, a step of processing the substrate with a rinsing liquid, and a step of processing the substrate with a chemical liquid containing ammonia. After the substrate is processed with the rinsing liquid, the step of processing the substrate with a chemical liquid removes a portion of thickness of a film in a depth direction of a phosphorus diffusion region from the phosphorus diffusion region formed in the substrate when the substrate is processed with the phosphoric acid liquid.
1. A substrate processing method for processing a substrate, comprising:
a step of processing the substrate with a phosphoric acid liquid;
a step of processing the substrate with a rinsing liquid after the substrate has been processed with the phosphoric acid liquid;
a step of processing the substrate with a chemical liquid containing ammonia after the substrate has been processed with the rinsing liquid so that a portion of thickness of a film in a depth direction of a phosphorus diffusion region is removed from the phosphorus diffusion region formed in the substrate when the substrate is processed with the phosphoric acid liquid; and
a step of removing with an etchant a portion of thickness of the film in the depth direction of the phosphorus diffusion region of the substrate after the substrate has been processed with the rinsing liquid and before the substrate is processed with the chemical liquid.
2. The substrate processing method according to claim 1 , wherein the step of processing the substrate with the chemical liquid comprises a step of removing the film with a thickness of less than 0.3 nm from a surface of the substrate.
3. The substrate processing method according to claim 1 , wherein an etching rate for etching the substrate with the etchant is higher than an etching rate for etching the substrate with the chemical liquid.
4. The substrate processing method according to claim 3 , wherein a thickness of the film removed from the substrate by the etchant is greater than a thickness of the film removed from the substrate by the chemical liquid.
5. The substrate processing method according to claim 1 , wherein a temperature of the etchant is higher than a temperature of the chemical liquid.
6. The substrate processing method according to claim 1 , wherein an oxide film and a nitride film are provided in the substrate, and the portion of the thickness of the film is a portion of the oxide film.
7. The substrate processing method according to claim 1 , wherein the etchant is hydrofluoric acid.