IP Library Granted Patent US 10,830,834
Granted Patent B2
US 10,830,834 · App. 16/245,154 · Granted Nov 10, 2020

Current measuring module using inspection substrate and inspection substrate

Inventors: Masaki Tomita (Tokyo, JP); Hiroyuki Takenaka (Tokyo, JP); Mitsutoshi Yahagi (Tokyo, JP)
Assignee: EBARA CORPORATION
G01R31/66G01R1/07314
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Quick Facts
Patent No.
US 10,830,834
App. No.
16/245,154
Granted
Nov 10, 2020
Kind
B2
Abstract

A current measuring module for measuring a current flowing through the substrate holder using an inspection substrate is provided. The substrate holder includes a plurality of holder electric contacts. The plurality of holder electric contacts contact a substrate to supply the held substrate with a current. The substrate holder holds the inspection substrate for measuring the current flowing through the substrate holder. The plurality of holder electric contacts contact a plurality of respective independent substrate electric contacts disposed on the inspection substrate. The inspection substrate includes a plurality of measurement points connected to the plurality of respective substrate electric contacts with wirings and substrate side connectors electrically connected to the plurality of measurement points. The current measuring module includes a plurality of inspection probes configured to contact the plurality of respective measurement points on the inspection substrate.

Claims (21)

1. A current measuring module for measuring a current flowing through a substrate holder using an inspection substrate, wherein

the substrate holder includes a plurality of holder electric contacts, and the plurality of holder electric contacts are configured to contact a substrate to supply the held substrate with a current,

the substrate holder is configured to hold the inspection substrate for measuring the current flowing through the substrate holder, the plurality of holder electric contacts contact a plurality of respective substrate electric contacts disposed on the inspection substrate while the inspection substrate is held, and the plurality of substrate electric contacts are electrically independent,

the inspection substrate includes:

a plurality of measurement points connected to the plurality of respective substrate electric contacts with wirings; and

substrate side connectors electrically connected to the plurality of measurement points,

the current measuring module includes:

a plurality of inspection probes configured to contact the plurality of respective measurement points on the inspection substrate held to the substrate holder; and

measurement side connectors electrically connected to the plurality of inspection probes, and

when the substrate side connectors and the measurement side connectors are connected, each of the plurality of measurement points on the inspection substrate and each of the plurality of respective inspection probes is electrically connected.

2. The current measuring module according to claim 1 , wherein

a voltage with a magnitude identical to a magnitude of a voltage applied to the substrate when the substrate is electroplated is applied from the holder electric contacts of the substrate holder to the substrate electric contacts, the wirings, and the measurement points to measure the current flowing through the substrate holder.

3. The current measuring module according to claim 1 , wherein

the respective wirings that connect the plurality of substrate electric contacts to the plurality of respective measurement points of the inspection substrate have an equal length.

4. The current measuring module according to claim 1 , wherein

the substrate holder includes a plurality of contact holding members electrically independent from one another, and the plurality of holder electric contacts are disposed on the respective contact holding members.

5. A current measuring module for measuring a current flowing through a substrate holder using an inspection substrate, wherein

the substrate holder includes a plurality of holder electric contacts, and the plurality of holder electric contacts are configured to contact a substrate to supply the held substrate with a current,

the substrate holder is configured to hold the inspection substrate for measuring the current flowing through the substrate holder, and the plurality of holder electric contacts contact a plurality of respective substrate electric contacts disposed on the inspection substrate while the inspection substrate is held,

the inspection substrate has a surface coated with an insulating layer, the insulating layer has a plurality of holes, and the inspection substrate includes a conducting layer exposed from the plurality of holes, and

the current measuring module includes inspection probes configured to contact the conducting layer of the inspection substrate held to the substrate holder through the holes.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2019
From: TOMITA, MASAKI; TAKENAKA, HIROYUKI; YAHAGI, MITSUTOSHI
To: EBARA CORPORATION
Reel/Frame 047961/0197 →
Priority Claims (1)
JP 2018-006570 · Jan 18, 2018 · national
Continuity (1)
Related Publication 20190219627A1 · Jul 18, 2019
Cited By (1)
US 12,416,383