IP Library Granted Patent US 10,679,864
Granted Patent B2
US 10,679,864 · App. 16/364,568 · Granted Jun 9, 2020

Pre-heat processes for millisecond anneal system

Inventor: Paul Timans (Cambridge, GB)
Assignees: Mattson Technology, Inc.; Beijing E-Town Semiconductor Technology Co., Ltd.
H01L21/324H01L21/6719H01L21/67115H01L21/67248
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Quick Facts
Patent No.
US 10,679,864
App. No.
16/364,568
Granted
Jun 9, 2020
Kind
B2
Abstract

Preheat processes for a millisecond anneal system are provided. In one example implementation, a heat treatment process can include receiving a substrate on a wafer support in a processing chamber of a millisecond anneal system; heating the substrate to an intermediate temperature; and heating the substrate using a millisecond heating flash. Prior to heating the substrate to the intermediate temperature, the process can include heating the substrate to a pre-bake temperature for a soak period.

Claims (10)

1. A method for thermally treating a substrate having a dielectric film in a millisecond anneal system, the method comprising:

receiving a substrate in a processing chamber of a millisecond anneal system, the processing chamber having a wafer plane plate dividing the processing chamber into a top chamber and a bottom chamber;

heating the substrate to a pre-bake temperature using one or more heat sources located proximate the bottom chamber;

wherein during a soak period having a duration, the method comprises maintaining the temperature of the substrate at about the pre-bake temperature, wherein after the soak period, the method comprises heating the substrate using a ramp to increase the temperature of the substrate to an intermediate temperature;

wherein after heating the substrate to increase the temperature of the substrate to an intermediate temperature, the method comprises heating the substrate using a heating flask; wherein the duration of the soak period is sufficient for one or more species to leave the dielectric film.

2. The method of claim 1 , wherein before or during the soak period, the method comprises admitting an ambient gas into the processing chamber.

3. The method of claim 2 , wherein the ambient gas comprises one or more of hydrogen, deuterium, ammonia, or hydrazine species.

4. The method of claim 1 , wherein before or during the soak period, the method comprises inducing a plasma in the processing chamber to create chemically reducing species.

5. The method of claim 1 , wherein the pre-bake temperature is in the range of about 200° C. to about 500° C.

6. The method of claim 1 , wherein the duration of the soak period is between about 0.5 seconds and about 10 minutes.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2021
From: EAST WEST BANK
To: MATTSON TECHNOLOGY, INC.
Reel/Frame 055950/0452 →
SECURITY INTEREST Recorded Oct 19, 2020
From: MATTSON TECHNOLOGY, INC.
To: EAST WEST BANK
Reel/Frame 054100/0167 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 30, 2019
From: MATTSON TECHNOLOGY, INC.
To: MATTSON TECHNOLOGY, INC.; BEIJING E-TOWN SEMICONDUCTOR TECHNOLOGY, CO., LTD
Reel/Frame 050582/0796 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: TIMANS, PAUL
To: MATTSON THERMAL PRODUCTS GMBH
Reel/Frame 048701/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: MATTSON THERMAL PRODUCTS GMBH
To: MATTSON TECHNOLOGY, INC.
Reel/Frame 048701/0507 →