Granted Patent B2

US 12,601,778 · App. 16/396,227 · Granted Apr 14, 2026

Inventors: Seongmin Ma (Icheon-si, KR); Sangmin Kim (Icheon-si, KR); Jonghoi Cho (Icheon-si, KR); Ming Lei (Seattle, WA)

Assignees: SK HYNIX INC.; FEMTOMETRIX, INC.

G01R31/2656G01N21/636G01N21/9501G01R29/24G01R31/2601G01R31/2831G01R31/308H01L22/12H01L22/20H01L22/30G01N2021/1719G01N2021/1721G01N21/67G01N2021/8438

Abstract

Claims (44)

1 . A method of optical interrogation of a sample having a top side and a bottom side, the method comprising:

applying optical radiation from a optical source to a surface of the sample;

depositing electrical charge on the top side of the sample using a corona gun;

measuring an electrical current between the bottom side of the sample and an electrical ground using an ammeter to determine an amount of the electrical charge deposited, said measured electrical current induced by the electrical charge deposited on the top side of the sample;

determining the amount of electrical charge deposited on the top side of the sample based on the measured electrical current;

detecting using an optical detector, a variation in Second Harmonic Generation (SHG) effect signals generated by the optical radiation for different amounts of electrical charge deposited on the top side of the sample; and

determining a characteristic of the variation of the detected SHG effect signals in the presence of the optical radiation and the determined amount of electrical charge deposited on the top side of the sample.

2 . The method of claim 1 , used to determine interfacial charging states at corresponding band bending of the sample as a function of surface charge.

3 . The method of claim 1 , used to determine carrier dynamics at corresponding band bending of the sample as a function of surface charge.

4 . The method of claim 1 , wherein the bottom side of the sample is in contact with a conductive chuck and the ammeter is electrically connected between the conductive chuck and the electrical ground.

5 . The method of claim 1 , further comprising controlling a voltage provided to the corona gun based on the determined amount of electrical charge deposited on the top side of the sample.

6 . A system for optically interrogating a surface of a sample having a top side and a bottom side accompanied by application of electric charge to said top side of the sample, said system comprising:

an optical source configured to emit optical radiation, said optical source disposed so as to direct said optical radiation onto said surface of said sample;

a corona discharge source disposed with respect to the sample to provide different amounts of electric charge on the top side of the sample;

an optical detector configured to detect a variation in second harmonic generated light from the sample in the presence of the optical radiation and the different amounts of electrical charge;

a conductive chuck configured to support the sample and be in contact with the bottom side of the sample;

an ammeter connected between an electrical ground and said conductive chuck; and

electronics configured to:

determine an amount of electrical charge deposited on the top side of the sample based on an electrical current between the bottom side of the conductive chuck and the electrical ground measured using the ammeter, said electrical current induced by the electrical charge deposited on the top side of the sample.

7 . The system of claim 6 , wherein said optical source comprises a laser.

8 . The system of claim 6 , wherein said ammeter is configured to measure an electrical current induced between the sample and electrical ground by the different amounts of electric charge provided to the sample.

9 . The system of claim 8 , wherein the electronics are configured to associate different amounts of SHG signal with the different amounts of electrical charge provided by the corona discharge source.

10 . The system of claim 6 , furhter comprising a pumping optical source configured to emit pumping optical radiation, said pumping optical source disposed so as to direct said pumping optical radiation onto said surface of said sample.

11 . A system for optically interrogating a surface of a sample having a top side and a bottom side accompanied by application of electric charge to said sample, said system comprising:

a first optical source configured to emit a first incident beam of light towards said surface of said sample;

a second optical source configured to emit a second incident beam of light towards said surface of said sample, wherein the first incident beam overlaps with the second incident beam on the sample to generate at least one non-holographic four-wave mixing or multi-wave mixing signal component via a nonlinear optical interaction with the sample;

a corona discharge source disposed with respect to the sample to provide electric charge on the top side of the sample;

an optical detection system configured to receive the at least one non-holographic four-wave mixing or multi-wave mixing signal component and detect a variation in at least one non-holographic four-wave mixing signal component or at least one non-holographic multi-wave mixing signal component from a portion of the sample illuminated by the first and the second incident beams of light for different amounts of electrical charge deposited on said portion of the sample; and

electronics electrically connected to said optical detection system to receive a signal based on said detected variation in at least one non-holographic four-wave mixing signal component or at least one non-holographic multi-wave mixing signal component.

12 . The system of claim 11 , wherein said electronics are configured to determine the different amounts of electrical charge provided by the corona discharge source.

13 . The system of claim 11 , wherein said electronics are configured to determine a characteristic of the at least one four-wave mixing signal component or the at least one multi-wave mixing signal component detected for the different amounts of the electrical charge deposited on the top side of the sample.

14 . The system of claim 13 , wherein the electronics are configured to obtain information related to properties of the sample based on the determined characteristic of the detected at least one four-wave mixing signal component or multi-wave mixing signal component for the different amounts of the electrical charge.

15 . The system of claim 13 , wherein the electronics is configured to obtain information related to charge dynamics of the sample based on the determined characteristic of the detected at least one four-wave mixing signal component or multi-wave mixing signal component for the different amounts of the electrical charge.

16 . The system of claim 11 , further comprising a conductive chuck configured to support the sample and be in contact with the bottom side of the sample and an ammeter connected between an electrical ground and said conductive chuck, said electronics configured to determine an amount of electrical charge deposited on the top side of the sample based on an electrical current between the bottom side of the conductive chuck and the electrical ground measured using the ammeter.

17 . A method of optical interrogation of a sample having a top side and a bottom side, the method comprising:

directing a first incident beam from a first optical source towards a region on a surface of the sample;

directing a second incident beam from a second optical source towards the region on the surface of the sample, wherein the first incident beam overlaps with the second incident beam on the sample to generate at least one non-holographic four-wave mixing or multi-wave mixing signal component via a nonlinear optical interaction with the sample;

depositing electrical charge on the top side of the sample using a corona gun; and

detecting using an optical detection system, a variation in at least one non-holographic four-wave mixing signal component or at least one non-holographic multi-wave mixing signal component from a portion of the top side of the sample generated by the first incident beam and the second incident beam for different amounts of the electrical charge deposited on said portion of the top side of the sample.

18 . The method of claim 17 , further comprising determining information related to the sample based on the detected at least one four-wave mixing signal component or at least one multi-wave mixing signal component.

19 . The method of claim 17 , further comprising determining information related to charge dynamics of the sample based on the detected at least one four-wave mixing signal component or at least one multi-wave mixing signal component.

20 . The method of claim 17 , further comprising determining a characteristic of the at least one four-wave mixing signal component or at least one multi-wave mixing signal component for the different amounts of electrical charge deposited on the top side of the sample.

21 . The method of claim 20 , further comprising determining information related to charge dynamics of the sample based on the determined characteristic of the detected at least one four-wave mixing signal component or at least one multi-wave mixing signal component for the different amounts of the electrical charge.

22 . The method of claim 17 , further comprising measuring an electrical current between the bottom side of the sample and an electrical ground using an ammeter and determining an amount of electrical charge deposited on the top side of the sample based on the measured electrical current.

Assignments (2)

Continuity (2)

References Cited (327)