IP Library Granted Patent US 10,890,670
Granted Patent B2
US 10,890,670 · App. 16/400,195 · Granted Jan 12, 2021

Dense high-speed scintillator material of low afterglow

Inventors: Bernard Ferrand (Voreppe, FR); Bruno Viana (Montgeron, FR); Ludivine Pidol (Cachan, FR); Pieter Dorenbos (Gm Rijswijk, NL)
Assignee: SAINT-GOBAIN CRISTAUX ET DETECTEURS
G01T1/2023C09K11/745C09K11/7774G21K4/00A61B6/4258
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Quick Facts
Patent No.
US 10,890,670
App. No.
16/400,195
Granted
Jan 12, 2021
Kind
B2
Abstract

The invention relates to an inorganic scintillator material of formula Lu (2−y) Y (y−z−x) Ce x M z Si (1−v) M′ v O 5 , in which: M represents a divalent alkaline earth metal and M′ represents a trivalent metal, (z+v) being greater than or equal to 0.0001 and less than or equal to 0.2; z being greater than or equal to 0 and less than or equal to 0.2; v being greater than or equal to 0 and less than or equal to 0.2; x being greater than or equal to 0.0001 and less than 0.1; and y ranging from (x+z) to 1. In particular, this material may equip scintillation detectors for applications in industry, for the medical field (scanners) and/or for detection in oil drilling. The presence of Ca in the crystal reduces the afterglow, while stopping power for high-energy radiation remains high.

Claims (29)

1. A method for preparing a single-crystal scintillator material comprising Lu, Si, O, and M or M′ in which M represents a divalent alkaline earth metal ion and M′ represents a trivalent metal, the method comprising:

growing the single crystal according to the Czochralski method.

2. The method according to claim 1 , wherein the single-crystal scintillator material comprises Y.

3. The method according to claim 1 , wherein M or M′ substantially reduces the afterglow.

4. The method according to claim 1 , wherein M is present and M is at least one selected from the group consisting of Ca, Mg, and Sr.

5. The method according to claim 1 , wherein M′ is present and M′ is at least one selected from the group consisting of Al, Ga, and In.

6. The method according to claim 1 , wherein M is introduced in said scintillator material for substituting for a trivalent rare-earth ion, or M′ is introduced in said scintillator material for substituting for a tetravalent silicon atom.

7. The method according to claim 1 , wherein the single-crystal scintillator material has a formula of:

Lu (2−y) Y (y−z−x) Ce x M z Si (1−v) M′ v O 5 ,

wherein:

(z+v) is greater than or equal to 0.0001 and less than or equal to 0.2;

z is greater than 0 and less than or equal to 0.2;

v is greater than or equal to 0 and less than or equal to 0.2;

x is greater than or equal to 0.0001 and less than 0.1; and

y is from (x+z) to 1.

8. The method according to claim 7 , wherein (z+v) is greater than or equal to 0.0002.

9. The method according to claim 7 , wherein (z+v) is less than or equal to 0.05.

10. The method according to claim 7 , wherein (z+v) is less than or equal to 0.01.

11. The method according to claim 7 , wherein (z+v) is less than 0.001.

12. The method according to claim 7 , wherein x is greater than 0.0001 and less than 0.001.

13. The method according to claim 1 , wherein an atomic ratio of a sum of M and M′ to O ranges from 0.00002 to 0.04.

14. A method, comprising:

performing a medical scan with a scintillator system comprising a scintillation detector comprising an inorganic scintillator material comprising Lu, Si, O, and M or M′ in which M represents a divalent alkaline earth metal ion and M′ represents a trivalent metal.

15. The method of claim 14 , wherein the scintillation detector is a component of a computed tomography scanner.

16. The method of claim 15 , wherein the computed tomography scanner is coupled to a positron emission tomography scanner.

17. The method of claim 14 , wherein M or M′ substantially reduces the afterglow from cerium ion emission between about 350 nm and 450 nm.

18. The method of claim 14 , wherein the scintillation material is a single-crystal material which is grown in the presence of M or M′ in the melt or the scintillation material is a single-crystal material which is grown by the Czochralski method in the presence of M or M′ in the melt.

19. The method of claim 14 , wherein the scintillator system is a continuous acquisition scintillator system.

20. The method of claim 14 , wherein the scintillator system is a positron emission tomography system having time of flight measurement and optionally emission tomography.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2023
From: SAINT-GOBAIN CRISTAUX ET DETECTEURS
To: LUXIUM SOLUTIONS, LLC
Reel/Frame 063066/0758 →
Priority Claims (1)
FR 04 51815 · Aug 9, 2004 · national
Continuity (6)
Continuation 15358341 · Nov 22, 2016
Continuation 14039888 · Sep 27, 2013
Continuation 13214648 · Aug 22, 2011
Division 12622881 · Nov 20, 2009
Division 11573323
Related Publication 20190257958A1 · Aug 22, 2019
Cited By (1)
US 12,466,998