Semiconductor package and electromagnetic interference shielding structure for the same

1. A semiconductor package comprising:

a connection structure including one or more redistribution layers;

a semiconductor chip disposed on the connection structure and electrically connected to the one or more redistribution layers;

an encapsulant disposed on the connection structure and covering at least a portion of the semiconductor chip; and

a shielding structure covering at least a portion of the encapsulant,

wherein the shielding structure comprises:

a conductive pattern layer having a plurality of openings;

a first metal layer covering the conductive pattern layer and extending across the plurality of openings; and

a second metal layer covering the first metal layer, and

wherein the second metal layer has a thickness greater than a thickness of the first metal layer and wherein the first metal layer conforms to the conductive pattern layer and the plurality of openings.

2. The semiconductor package of claim 1 , wherein the conductive pattern layer includes metal nanoparticles and an adhesive resin.

3. The semiconductor package of claim 2 , wherein the conductive pattern layer has a conductive mesh structure.

4. The semiconductor package of claim 1 , wherein the first metal layer has a concave shape in each of the plurality of openings.

5. The semiconductor package of claim 4 , wherein the concave shape of the first metal layer is filled with the second metal layer.

6. The semiconductor package of claim 5 , wherein the first metal layer is an electroless plating layer, and

the second metal layer is an electrolytic plating layer.

7. The semiconductor package of claim 1 , wherein the shielding structure covers a top surface of the encapsulant, and extends to cover aside surface of the encapsulant and aside surface of the connection structure.

8. The semiconductor package of claim 7 , wherein the encapsulant includes an insulating resin and an inorganic filler.

9. The semiconductor package of claim 1 , further comprising:

a frame disposed on the connection structure and having a through-hole,

wherein the semiconductor chip is disposed in the through-hole, and

the encapsulant covers at least a portion of the frame and fills at least a portion of the through-hole.

10. The semiconductor package of claim 9 , wherein the shielding structure covers a top surface of the encapsulant, and extends to cover side surfaces of the encapsulant, the frame, and the connection structure.

11. The semiconductor package of claim 10 , wherein the frame includes an insulating layer, and

the insulating layer includes an insulating resin, an inorganic filler, and a glass fiber.

12. The semiconductor package of claim 9 , wherein the frame comprises:

a first insulating layer disposed in contact with the connection structure;

a first wiring layer embedded in the first insulating layer while being in contact with the connection structure;

a second wiring layer disposed on the first insulating layer on a side opposing a side in which the first wiring layer of the first insulating layer is embedded;

a second insulating layer disposed on the first insulating layer and covering the second wiring layer; and

a third wiring layer disposed on a side of the second insulating layer opposing a side in which the second wiring layer of the second insulating layer is embedded,

wherein the first to third wiring layers are electrically connected to the connection pad.

13. The semiconductor package of claim 9 , wherein the frame comprises:

a first insulating layer;

first and second wiring layers respectively disposed on opposing surfaces of the first insulating layer;

second and third insulating layers respectively disposed on the opposing surfaces of the first insulating layer and respectively covering the first and second wiring layers;

a third wiring layer disposed on a side of the second insulating layer opposing a side in which the first wiring layer is embedded in the second insulating layer; and

a fourth wiring layer disposed on a side of the third insulating layer opposing a side in which the second wiring layer is embedded in the third insulating layer,

wherein the first to fourth wiring layers are electrically connected to the connection pad.

14. A semiconductor package comprising:

a semiconductor chip having opposing first and second surfaces, the first surface having one or more connection pads disposed thereon;

an encapsulant covering at least a portion of the second surface of the semiconductor chip; and

a shielding structure disposed on the encapsulant and comprising a conductive pattern layer contacting the encapsulant and formed of an adhesive resin having metal nanoparticles dispersed therein,

wherein the conductive pattern layer has a plurality of openings exposing the encapsulant, and

wherein the shielding structure further comprises a metal layer covering the conductive pattern layer and extending across the plurality of openings.

15. The semiconductor package of claim 14 , wherein the metal nanoparticles dispersed in the conductive pattern layer include silver, a silver-copper alloy, or a silver-palladium alloy.

16. The semiconductor package of claim 14 , wherein the metal layer comprises a first metal layer covering the conductive pattern layer, and a second metal layer covering the first metal layer and having a thickness greater than a thickness of the first metal layer.

17. The semiconductor package of claim 14 , wherein the conductive pattern layer has a variable thickness on the encapsulant.

18. The semiconductor package of claim 14 , wherein the shielding structure including the conductive pattern layer is disposed on a top surface of encapsulant to face the second surface of the semiconductor chip, and on side surfaces of the encapsulant connected to the top surface.