IP Library Granted Patent US 10,461,084
Granted Patent B2
US 10,461,084 · App. 16/408,649 · Granted Oct 29, 2019

Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making

Inventor: Yuniarto Widjaja (Cupertino, CA)
Assignee: Zeno Semiconductor, Inc.
H01L27/10802G11C11/401G11C11/404G11C11/4096H01L28/00
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Quick Facts
Patent No.
US 10,461,084
App. No.
16/408,649
Granted
Oct 29, 2019
Kind
B2
Abstract

An integrated circuit including a link or string of semiconductor memory cells, wherein each memory cell includes a floating body region for storing data. The link or string includes at least one contact configured to electrically connect the memory cells to at least one control line, and the number of contacts in the string or link is the same as or less than the number of memory cells in the string or link.

Claims (35)

1. An integrated circuit comprising:

a link or string of semiconductor memory cells, wherein each said semiconductor memory cell comprises:

a floating body region for storing charge indicating a state of said semiconductor memory cell; and

a back-bias region;

wherein applying a voltage to said back-bias region results in at least two stable floating body charge levels;

wherein said link or string comprises at least one contact configured to electrically connect said semiconductor memory cells to at least one control line;

wherein a number of said at least one contact is the same as or less than a number of said semiconductor memory cells in said link or string; and

a control circuitry configured to apply said voltage to said back-bias region.

2. The integrated circuit of claim 1 , wherein said number of said at least one contact is less than said number of said semiconductor memory cells.

3. The integrated circuit of claim 1 , wherein said semiconductor memory cells are connected in series.

4. The integrated circuit of claim 1 , wherein said semiconductor memory cells are connected in parallel.

5. The integrated circuit of claim 1 , wherein said integrated circuit is fabricated on a bulk silicon substrate.

6. The integrated circuit of claim 1 , wherein said number of said at least one contact is two.

7. The integrated circuit of claim 1 , wherein said semiconductor memory cells further comprise first and second conductive regions interfacing with said floating body region.

8. The integrated circuit of claim 1 , wherein each said semiconductor memory cell further comprises a gate insulated from said floating body region.

9. The integrated circuit of claim 1 , wherein at least one of said semiconductor memory cells is a contactless semiconductor memory cell.

10. The integrated circuit of claim 9 , wherein a majority of said semiconductor memory cells are contactless semiconductor memory cells.

11. An integrated circuit comprising:

a link or string of semiconductor memory cells, wherein each said semiconductor memory cell comprises:

a floating body region for storing charge; and

a back bias region;

wherein applying a voltage to said back-bias region results in at least two stable floating body charge levels;

wherein said link or string comprises at least one contact configured to electrically connect said semiconductor memory cells to at least one control line;

wherein a number of said at least one contact is the same as or less than a number of said semiconductor memory cells in said link or string; and

wherein said at least one control line is connected to a read circuitry; and

a control circuitry configured to apply said voltage to said back-bias region.

12. The integrated circuit of claim 11 , wherein said number of said at least one contact is less than said number of said semiconductor memory cells.

13. The integrated circuit of claim 11 , wherein said semiconductor memory cells are connected in series.

14. The integrated circuit of claim 11 , wherein said semiconductor memory cells are connected in parallel.

15. The integrated circuit of claim 11 , wherein said integrated circuit is fabricated on a bulk silicon substrate.

16. The integrated circuit of claim 11 , wherein said number of said at least one contact is two.

17. The integrated circuit of claim 11 , wherein said semiconductor memory cells further comprise first and second conductive regions interfacing with said floating body region.

18. The integrated circuit of claim 11 , wherein each said semiconductor memory cell further comprises a gate insulated from said floating body region.

19. The integrated circuit of claim 11 , wherein at least one of said semiconductor memory cells is a contactless semiconductor memory cell.

20. The integrated circuit of claim 19 , wherein a majority of said semiconductor memory cells are contactless semiconductor memory cells.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 4, 2025
From: ZENO SEMICONDUCTOR, INC.
To: EXACTOJOIN LLC
Reel/Frame 073109/0393 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2021
From: SILICON STORAGE TECHNOLOGY, INC.
To: ZENO SEMICONDUCTOR, INC.
Reel/Frame 056681/0744 →
DECLARATION SUPPORTING CORRECTION OF ERROUNEOIUSLY FILED REEL/FRAME NO. 049657/0037 Recorded Dec 13, 2019
From: ZENO SEMICONDUCTOR, INC.
To: ZENO SEMICONDUCTOR, INC.
Reel/Frame 051287/0251 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2019
From: WIDJAJA, YUNIARTO
To: SILICON STORAGE TECHNOLOGY, INC.
Reel/Frame 049657/0037 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2019
From: WIDJAJA, YUNIARTO
To: ZENO SEMICONDUCTOR, INC.
Reel/Frame 049280/0623 →
Continuity (13)
Continuation 16239758 · Jan 4, 2019
Continuation 16045630 · Jul 25, 2018
Continuation 15892236 · Feb 8, 2018
Continuation 15616369 · Jun 7, 2017
Continuation 15428921 · Feb 9, 2017
Continuation 15185156 · Jun 17, 2016
Continuation 14856943 · Sep 17, 2015
Continuation 14637688 · Mar 4, 2015
Continuation 14177819 · Feb 11, 2014
Continuation 13941227 · Jul 12, 2013
Continuation 12897528 · Oct 4, 2010
Provisional Application 61309589 · Mar 2, 2010
Related Publication 20190267382A1 · Aug 29, 2019
Cited By (3)
US 12,238,916 US 12,439,611 US 12,538,469