Resistance-based memory compiler
Systems, methods and devices are disclosed that may a user to specify various layout and operational parameters of a resistive-based memory array in a manner that accommodates the unique characteristics of resistance-based memory cells and magnetic-based memory cells.
1. A method of generating one or more netlist files for configuring a memory array based on user input, the method comprising:
providing, using a computer-implemented memory compiler, a memory block including a controller, a number of reference voltage generators, a number of sense amplifiers, and a number of memory columns each including a plurality of resistance-based memory (RBM) cells;
selecting, using the computer-implemented memory compiler, the number of reference voltage generators to include in the memory block based on the user input;
selecting, using the computer-implemented memory compiler, the number of sense amplifiers to include in the memory block based on the user input; and
determining, using the computer-implemented memory compiler, how many of the sense amplifiers are to be coupled to each of the reference voltage generators based on the user input.
2. The method of claim 1 , wherein determining how many of the sense amplifiers are to be coupled to each of the reference voltage generators further comprises:
selecting, for a respective one of the reference voltage generators, a corresponding number of the memory columns to share the respective reference voltage generator.
3. The method of claim 1 , wherein:
a first netlist file configuration provides a single reference voltage generator for all the sense amplifiers in the memory block;
a second netlist file configuration provides a different reference voltage generator for a selected number of the sense amplifiers in the memory block; and
a third netlist file configuration provides a dedicated reference voltage generator for each of the sense amplifiers in the memory block.
4. The method of claim 1 , further comprising:
providing a column bias circuit for the memory block;
selecting a number of programmable current sources to include in the column bias circuit based on the user input; and
determining how many of the memory columns are to be coupled to each of the programmable current sources based on the user input.
5. The method of claim 4 , wherein:
a first netlist file configuration provides a single programmable current source for all the memory columns in the memory block;
a second netlist file configuration provides a different programmable current source for a selected number of the memory columns in the memory block; and
a third netlist file configuration provides a dedicated programmable current source for each of the memory columns in the memory block.
6. The method of claim 1 , further comprising:
providing a dual-purpose dummy track block in the memory block, the dual-purpose dummy track block including a number of columns each including a plurality of dummy RBM cells.
7. The method of claim 6 , wherein the dual-purpose dummy track block is configured to determine timing information for read and write operations of the memory array.
8. The method of claim 6 , wherein the dual-purpose dummy track block is configured to determine a course reference voltage for the memory array.
9. The method of claim 6 , wherein a first of the plurality of dummy RBM cells in a selected column of the dual-purpose dummy track block comprises a first application specific bit cell coupled to be coupled to a first supply voltage, and a second of the plurality of dummy RBM cells in the selected column of the dual-purpose dummy track block comprises a second application specific bit cell coupled to be coupled to a second supply voltage different than the first voltage supply.
10. The method of claim 9 , wherein the first application specific bit cell is configured to generate a first reference voltage, and the second application specific bit cell is configured to generate a second reference voltage different than the first reference voltage.
11. The method of claim 10 , wherein the first and second reference voltages are configured to determine a logic state of a multi-valued RBM cell in the memory array.
12. The method of claim 1 , wherein the controller is configured to adjust a write voltage for write operations based on a comparison between test data stored in a selected RBM cell and data read from the selected RBM cell.
13. The method of claim 1 , wherein the controller is configured to adjust a reference voltage for read operations based on a comparison between test data stored in a selected RBM cell and known data.