IP Library Granted Patent US 11,062,910
Granted Patent B2
US 11,062,910 · App. 16/444,146 · Granted Jul 13, 2021

Surface treatment of silicon or silicon germanium surfaces using organic radicals

Inventors: Michael X. Yang (Palo Alto, CA); Hua Chung (Saratoga, CA); Xinliang Lu (Fremont, CA)
Assignees: Mattson Technology, Inc.; Beijing E-Town Semiconductor Technology Co., Ltd.
H01L21/3003B01D67/009C23C16/452C23F1/12H01J37/32743H01J37/32899H01L21/0234H01L21/0271H01L21/02118H01L21/02252H01L21/02321H01L21/302H01L21/306H01L21/3105H01L21/31058H01L21/31138H01L21/321H01L21/32136H01L21/76826C23F4/00H01J37/321H01J2237/006H01J2237/332
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Quick Facts
Patent No.
US 11,062,910
App. No.
16/444,146
Granted
Jul 13, 2021
Kind
B2
Abstract

Processes for surface treatment of a workpiece are provided. In one example implementation, a method can include performing an organic radical based surface treatment process on a workpiece. The organic radical based surface treatment process can include generating one or more species in a first chamber. The surface treatment process can include mixing one or more hydrocarbon molecules with the species to create a mixture. The mixture can include one or more organic radicals. The surface treatment process can include exposing a semiconductor material on the workpiece to the mixture in a second chamber.

Claims (27)

1. An organic radical based surface treatment process, the process comprising:

generating one or more species using a plasma induced in a first chamber;

filtering the one or more species generated by the plasma using a separation grid to create a filtered mixture;

mixing one or more hydrocarbon molecules with the filtered mixture at the separation grid to generate one or more organic radicals; and

exposing a workpiece to the organic radicals in a second chamber, the second chamber being separated from the first chamber by the separation grid.

2. The process of claim 1 , wherein the workpiece comprises silicon.

3. The process of claim 1 , wherein the workpiece comprises silicon germanium.

4. The process of claim 1 , wherein the one or more hydrocarbon molecules have a chemical formula of C n H 2n+2 , where n is greater than or equal to 1 and less than or equal to 10.

5. The process of claim 1 , wherein the one or more hydrocarbon molecules have a chemical formula of C n H 2n , where n is greater than or equal to 2 and n is less than or equal to 10.

6. The process of claim 1 , wherein the one or more organic radicals are generated by reaction of the one or more hydrocarbon molecules with the species.

7. The process of claim 1 , wherein the one or more organic radicals comprise a CH 3 radical.

8. The process of claim 1 , wherein the organic radical based surface treatment process results in methylation on at least a portion of the workpiece.

9. The process of claim 1 , wherein the one or more species are generated by the plasma induced in a process gas in the first chamber.

10. The process of claim 9 , wherein the process gas is an inert gas.

11. The process of claim 10 , wherein the inert gas is helium.

12. The process of claim 11 , wherein the process gas comprises a hydrogen gas and the species comprise hydrogen radicals.

13. The process of claim 1 , wherein the species comprise one or more hydrogen radicals generated using a heated filament.

14. The process of claim 1 , wherein the one or more organic radicals are generated using pyrolysis of molecules or UV-assisted molecule dissociation.

15. A method for processing a workpiece, comprising:

generating one or more species using a plasma;

filtering the one or more species generated by the plasma using a separation grid to create a filtered mixture;

exposing the workpiece to one or more organic radicals to modify a surface wetting angle of a silicon containing dielectric layer on the workpiece;

performing a wet process on the workpiece after exposing the workpiece to the one or more organic radicals;

wherein the one or more organic radicals are generated by mixing one or more hydrocarbon molecules with the filtered mixture.

16. The method of claim 15 , wherein the one or more hydrocarbon molecules have a chemical formula of C n H 2n+2 , where n is greater than or equal to 1 and less than or equal to 10.

17. The method of claim 15 , wherein the one or more hydrocarbon molecules have a chemical formula of C n H 2n , where n is greater than or equal to 2 and n is less than or equal to 10.

18. The method of claim 15 , wherein the one or more organic radicals comprise a CH 3 radical.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2021
From: EAST WEST BANK
To: MATTSON TECHNOLOGY, INC.
Reel/Frame 055950/0452 →
SECURITY INTEREST Recorded Oct 19, 2020
From: MATTSON TECHNOLOGY, INC.
To: EAST WEST BANK
Reel/Frame 054100/0167 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 30, 2019
From: MATTSON TECHNOLOGY, INC.
To: MATTSON TECHNOLOGY, INC.; BEIJING E-TOWN SEMICONDUCTOR TECHNOLOGY, CO., LTD
Reel/Frame 050582/0796 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2019
From: YANG, MICHAEL X.; CHUNG, HUA; LU, XINLIANG
To: MATTSON TECHNOLOGY, INC.
Reel/Frame 049518/0729 →
Continuity (3)
Continuation 15958560 · Apr 20, 2018
Provisional Application 62567295 · Oct 3, 2017
Related Publication 20190304793A1 · Oct 3, 2019
Cited By (1)
US 12,308,209