IP Library › Granted Patent US 11,441,942
Granted Patent B2
US 11,441,942 · App. 16/446,506 · Granted Sep 13, 2022

Photoresist spectral sensitivity matching radiometer for trace/space width variation improvement

Inventors: Matthew S. Lang (Excelsior, MN); Lawrence E. LaLonde (Lakeland, MN); Kyle T. Tobias (Eleva, WI)
Assignee: Hutchinson Technology Incorporated
G01J1/0474G01J1/0488G01J1/16G02B5/0205G02B5/208G03F7/70591
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Quick Facts
Patent No.
US 11,441,942
App. No.
16/446,506
Granted
Sep 13, 2022
Kind
B2
Abstract

A radiometer probe for matching a spectral sensitivity of a dry-film resist is provided. The radiometer probe includes a light probe and a filter-diffuser assembly connected to the light probe. The filter-diffuser assembly includes a filter housing configured to receive an optical diffuser positioned on a filter. The optical diffuser and the filter are separated by a spacer.

Claims (26)

1. A radiometer probe for matching a spectral sensitivity of a dry-film resist comprising:

a light probe; and

a filter-diffuser assembly connected to the light probe, the filter-diffuser assembly including a filter housing configured to receive an optical diffuser positioned on a filter, the optical diffuser and the filter are separated by a spacer such that the radiometer probe is configured to expose a pattern on the dry-film resist to form at least one set of adjacent structures, having a space of less than 12 microns between one structure and an adjacent structure of the set.

2. The radiometer probe of claim 1 , wherein the light probe includes a light probe.

3. The radiometer probe of claim 1 , wherein the optical diffuser includes a quartz cosine diffuser configured to attenuate an intensity of an exposer to be within a targeted liner range.

4. The radiometer probe of claim 3 , wherein the optical diffuser includes at least one of opaline glass, Polytetrafluoroethylene (PTFE) or Spectralon that couple to fibers and spectrometers to collect signal from 180° field of view.

5. The radiometer probe of claim 1 , wherein the optical diffuser includes a top side and an opposing underside, wherein the top side of the optical diffuser includes an etched depression.

6. The radiometer probe of claim 5 , wherein the optical diffuser is fixed within the filter housing with the etched depression opposing the filter and spacer.

7. The radiometer probe of claim 1 , wherein the filter includes a metallic coating on a first side and a dielectric coating on an opposing second side.

8. The radiometer probe of claim 1 , wherein the filter is configured to target a linear range with a transmission value of at least one of: 100% at a 365 nm wavelength, 40% at a 405 nm wavelength, or 7% at a 435 nm wavelength.

9. The radiometer probe of claim 1 , wherein the filter is positioned within the filter housing such that a dielectric coating is facing opposite the optical diffuser and the spacer.

10. The radiometer probe of claim 1 , wherein the spacer includes a Teflon® shim configured to prevent interference caused by an air gap between the light probe and the filter.

11. The radiometer probe of claim 1 , wherein the spacer includes a PTFE shim configured to prevent interference caused by an air gap between the light probe and the filter.

12. The radiometer probe of claim 1 , wherein the filter-diffuser assembly is connected to the light probe via a thread using a threadlocking adhesive.

13. A method for calibrating a radiometer probe, the method comprising:

implementing the radiometer probe including a light probe and a filter-diffuser assembly threaded onto the light probe, the filter-diffuser assembly including a filter housing configured to receive an optical diffuser positioned on a filter, wherein the optical diffuser and the filter are separated by a spacer;

implementing a light source;

placing the radiometer probe under the light source and measuring an irradiance; comparing the measured irradiance with a standard irradiance; and

calibrating the radiometer probe based on the compared measured irradiance with the standard irradiance such that the radiometer probe is configured to expose a pattern on a dry-film resist to form at least one set of adjacent structures, having a space of less than 12 microns between one structure and an adjacent structure of the set.

14. The method of claim 13 , wherein the light probe includes a light probe.

15. The method of claim 13 , wherein the optical diffuser includes a quartz cosine diffuser configured to attenuate a intensity of an exposer to be within a targeted liner range.

16. The method of claim 15 , wherein the optical diffuser includes at least one of opaline glass, Polytetrafluoroethylene (PTFE) or Spectralon that couple to fibers and spectrometers to collect signal from 180° field of view.

17. The method of claim 13 , wherein the optical diffuser includes a top side and an opposing underside, wherein the top side of the optical diffuser includes an etched depression.

18. The method of claim 17 , wherein the optical diffuser is fixed within the filter housing with the etched depression opposing the filter and spacer.

19. The method of claim 13 , wherein the filter includes a metallic coating on a first side and a dielectric coating on an opposing second side.

20. The method of claim 13 , wherein the filter includes a metallic coating on a first side.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2026
From: HUTCHINSON TECHNOLOGY INCORPORATED
To: MOUND LASER & PHOTONICS CENTER, INC.
Reel/Frame 076110/0518 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2019
From: LANG, MATTHEW S.; LALONDE, LAWRENCE E.; TOBIAS, KYLE T.
To: HUTCHINSON TECHNOLOGY INCORPORATED
Reel/Frame 050187/0631 →
Continuity (2)
Provisional Application 62689712 · Jun 25, 2018
Related Publication 20190391007A1 · Dec 26, 2019