IP Library Granted Patent US 10,818,731
Granted Patent B1
US 10,818,731 · App. 16/446,532 · Granted Oct 27, 2020

Three-dimensional nonvolatile memory

Inventor: Kimihiro Satoh (Fremont, CA)
Assignee: Avalanche Technology, Inc.
H01L27/249G11C11/161G11C13/0004H01F10/3254H01F10/3286H01L27/224H01L27/2409H01L43/02H01L45/06H01L45/1233G11C13/0007G11C2213/31G11C2213/32G11C2213/71G11C2213/72H01L45/144H01L45/146H01L45/147
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Quick Facts
Patent No.
US 10,818,731
App. No.
16/446,532
Granted
Oct 27, 2020
Kind
B1
Abstract

The present invention is directed to a memory array including one or more memory layers, each of which includes a first plurality of memory cells and a second plurality of memory cells arranged in alternated odd and even columns, respectively; multiple odd horizontal lines with each connected to a respective odd column of the first plurality of memory cells; multiple even horizontal lines with each connected to a respective even column of the second plurality of memory cells; multiple transverse lines with each connected to one of the first plurality of memory cells and a respective one of the second plurality of memory cells disposed adjacent thereto along a row direction; and multiple vertical lines with each connected to a respective one of the multiple transverse lines. The odd horizontal lines collectively form fingers of a first comb structure and the even horizontal lines collectively form fingers of a second comb structure.

Claims (30)

1. A memory array including one or more memory layers, each memory layer comprising:

a first plurality of memory cells and a second plurality of memory cells arranged in alternated odd and even columns, respectively;

a first plurality of odd horizontal lines with each connected to a respective odd column of the first plurality of memory cells at a first end of the respective odd column of the first plurality of memory cells;

a second plurality of even horizontal lines with each connected to a respective even column of the second plurality of memory cells at a first end of the respective even column of the second plurality of memory cells;

a plurality of transverse lines with each connected to one of the first plurality of memory cells and a respective one of the second plurality of memory cells disposed adjacent to the one of the first plurality of memory cells at a second end of the first and second plurality of memory cells along a row direction; and

a plurality of vertical lines with each connected to a respective one of the plurality of transverse lines,

wherein the first plurality of odd horizontal lines collectively form fingers of a first comb structure and the second plurality of even horizontal lines collectively form fingers of a second comb structure.

2. The memory array of claim 1 , wherein the second end of the first and second plurality of memory cells corresponds to a bottom end.

3. The memory array of claim 1 , wherein the second end of the first and second plurality of memory cells corresponds to a top end.

4. The memory array of claim 1 , wherein each memory cell of the first and second plurality of memory cells includes a resistance-switching memory element and a two-terminal selector coupled in series.

5. The memory array of claim 4 , wherein the resistance-switching memory element includes a magnetic free layer, a magnetic reference layer, and an insulating tunnel junction layer interposed between the magnetic free and reference layers.

6. The memory array of claim 4 , wherein the resistance-switching memory element includes a magnetic tunnel junction (MTJ).

7. The memory array of claim 4 , wherein the resistance-switching memory element includes a phase-change material.

8. The memory array of claim 4 , wherein the two-terminal selector is a bidirectional threshold switch.

9. The memory array of claim 4 , wherein the two-terminal selector includes two electrodes and a volatile switching layer interposed between the two electrodes.

10. The memory array of claim 1 , wherein each of the first and second comb structures is connected to a control circuitry below the first and second comb structures.

11. The memory array of claim 1 , wherein each of the plurality of vertical lines passes in between one of the first plurality of memory cells and a respective one of the second plurality of memory cells that are connected to a respective one of the plurality of transverse lines.

12. The memory array of claim 1 further comprising:

a third plurality of memory cells and a fourth plurality of memory cells arranged in alternated odd and even columns, respectively;

a third plurality of odd horizontal lines with each connected to a respective odd column of the third plurality of memory cells at a second end of the respective odd column of the third plurality of memory cells;

a fourth plurality of even horizontal lines with each connected to a respective even column of the fourth plurality of memory cells at a second end of the respective even column of the fourth plurality of memory cells,

wherein each of the plurality of the transverse lines is connected to one of the third plurality of memory cells and a respective one of the fourth plurality of memory cells disposed adjacent to the one of the third plurality of memory cells at a first end of the third and fourth plurality of memory cells along the row direction.

13. The memory array of claim 12 , wherein the second end of the first, second, third, and fourth plurality of memory cells corresponds to a bottom end.

14. The memory array of claim 12 , wherein each memory cell of the first and second plurality of memory cells includes a resistance-switching memory element and a two-terminal selector coupled in series.

15. The memory array of claim 14 , wherein the resistance-switching memory element includes a magnetic free layer, a magnetic reference layer, and an insulating tunnel junction layer interposed between the magnetic free and reference layers.

16. The memory array of claim 14 , wherein the resistance-switching memory element includes a magnetic tunnel junction (MTJ).

17. The memory array of claim 14 , wherein the resistance-switching memory element includes a phase-change material.

18. The memory array of claim 14 , wherein the two-terminal selector is a bidirectional threshold switch.

19. The memory array of claim 14 , wherein the two-terminal selector includes two electrodes and a volatile switching layer interposed between the two electrodes.

20. The memory array of claim 12 , wherein each of the plurality of vertical lines passes in between one of the first plurality of memory cells and a respective one of the second plurality of memory cells that are connected to a respective one of the plurality of transverse lines.

Assignments (5)
SECURITY INTEREST Recorded Mar 18, 2022
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 059436/0203 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057213/0050 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057217/0674 →
SECURITY INTEREST Recorded Feb 13, 2020
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 051930/0396 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2019
From: SATOH, KIMIHIRO
To: AVALANCHE TECHNOLOGY, INC.
Reel/Frame 049529/0934 →