IP Library Granted Patent US 10,897,142
Granted Patent B2
US 10,897,142 · App. 16/447,922 · Granted Jan 19, 2021

Half bridge circuit with bootstrap capacitor charging circuit

Inventors: Daniel M. Kinzer (El Segundo, CA); Santosh Sharma (Laguna Niguel, CA); Ju Jason Zhang (Monterey Park, CA)
Assignee: NAVITAS SEMICONDUCTOR LIMITED
H02J7/00H01L23/49503H01L23/49562H01L23/49575H01L23/528H01L23/62H01L25/072H01L27/0248H01L27/088H01L27/0883H01L29/1033H01L29/2003H01L29/402H01L29/41758H02M1/088H02M3/157H02M3/1584H02M3/1588H03K3/012H03K3/356017H03K17/102H03K19/018507H01L2924/00H01L2924/0002H02M3/155H02M2001/0048Y02B40/00Y02B70/10
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Quick Facts
Patent No.
US 10,897,142
App. No.
16/447,922
Granted
Jan 19, 2021
Kind
B2
Abstract

A half bridge circuit is disclosed. The half bridge circuit includes a low side transistor having a low side transistor gate, where a low side transistor gate voltage at the low side transistor gate is controlled by a low side gate signal. The half bridge circuit also includes a high side transistor having a high side transistor gate, where a high side transistor gate voltage at the high side transistor gate is controlled by a high side gate signal. The half bridge circuit also includes a semiconductor circuit configured to allow current to flow from a ground referenced power supply node to a first floating power supply terminal. The semiconductor circuit includes a first transistor, where a gate voltage is controlled by a gate drive circuit control signal, a source is connected to the ground referenced power supply node, and a drain connected to the first floating power supply terminal.

Claims (64)

1. A half bridge circuit, comprising:

a low side GaN-based transistor having a low side transistor gate, wherein a low side transistor gate voltage at the low side transistor gate is controlled by a low side gate signal;

a high side GaN-based transistor having a high side transistor gate, wherein a high side transistor gate voltage at the high side transistor gate is controlled by a high side gate signal; and

a GaN-based semiconductor circuit configured to allow current to flow from a ground referenced power supply node to a first floating power supply terminal, wherein the semiconductor circuit comprises:

a first transistor, comprising:

a first transistor gate, wherein a first transistor gate voltage at the first transistor gate is controlled by a gate drive circuit control signal,

a first transistor source connected to the ground referenced power supply node, and

a first transistor drain connected to the first floating power supply terminal,

wherein the gate drive circuit control signal is configured to:

A) cause the first transistor to become conductive while the low side gate signal causes the low side GaN-based transistor to be conductive,

B) cause the first transistor to be conductive while the low side gate signal causes the low side GaN-based transistor to be conductive,

C) cause the first transistor to become non-conductive while the low side gate signal causes the low side GaN-based transistor to be conductive, and

D) cause the first transistor to be non-conductive while the low side gate signal causes the low side GaN-based transistor to be non-conductive.

2. The half bridge circuit of claim 1 , wherein the half bridge circuit is configured to be capable of operating with the first floating power supply terminal at a voltage that is at least 20 volts greater than a voltage of the ground referenced power supply node.

3. The half bridge circuit of claim 1 , wherein:

the low side transistor gate is configured to receive the low side gate signal from a low side gate drive circuit, and wherein the low side gate drive circuit is referenced to ground; and

the high side transistor gate is configured to receive the high side gate signal from a high side gate drive circuit, and wherein the high side gate drive circuit is referenced to a second floating power supply terminal.

4. The half bridge circuit of claim 3 , wherein the second floating power supply terminal is a switch node of the half bridge circuit.

5. The half bridge circuit of claim 3 , wherein a capacitor is connected between the first floating power supply terminal and the second floating power supply terminal.

6. The half bridge circuit of claim 3 , further comprising a delay circuit configured to turn on the first transistor while the low side GaN-based transistor is on.

7. The half bridge circuit of claim 3 , further comprising a delay circuit configured to turn off the first transistor while the low side GaN-based transistor is on.

8. The half bridge circuit of claim 1 , wherein the first transistor is an enhancement-mode device.

9. The half bridge circuit of claim 1 , wherein the semiconductor circuit further comprises a second transistor, comprising:

a gate connected to the ground referenced power supply node,

a source connected to the ground referenced power supply node, and

a drain connected to the first floating power supply terminal.

10. The half bridge circuit of claim 1 , wherein the semiconductor circuit further comprises a second transistor, comprising:

a gate connected to the ground referenced power supply node,

a source connecting the first transistor to the first floating power supply terminal and connected to the ground referenced power supply node through the first transistor, and

a drain connected to the first floating power supply terminal.

11. A method of using a half bridge circuit, the half bridge circuit comprising:

a low side GaN-based transistor having a low side transistor gate,

a high side GaN-based transistor having a high side transistor gate, and

a GaN-based semiconductor circuit configured to allow current to flow from a ground referenced power supply node to a first floating power supply terminal, wherein the semiconductor circuit comprises:

a first transistor, comprising:

a first transistor gate,

a first transistor source connected to the ground referenced power supply node, and

a first transistor drain connected to the first floating power supply terminal,

the method comprising:

controlling a low side transistor gate voltage at the low side transistor gate with a low side gate signal;

controlling a high side transistor gate voltage at the high side transistor gate with a high side gate signal; and

controlling a first transistor gate voltage at the first transistor gate with a gate drive circuit control signal,

wherein the gate drive circuit control signal is configured to:

A) cause the first transistor to become conductive while the low side gate signal causes the low side GaN-based transistor to be conductive,

B) cause the first transistor to be conductive while the low side gate signal causes the low side GaN-based transistor to be conductive,

C) cause the first transistor to become non-conductive while the low side gate signal causes the low side GaN-based transistor to be conductive, and

D) cause the first transistor to be non-conductive while the low side gate signal causes the low side GaN-based transistor to be non-conductive.

12. The method of claim 11 , further comprising operating the half bridge circuit with the first floating power supply terminal at a voltage that is at least 20 volts greater than a voltage of the ground referenced power supply node.

13. The method of claim 11 , further comprising:

with the low side transistor gate, receiving the low side gate signal from a low side gate drive circuit, wherein the low side gate drive circuit is referenced to ground; and

with the high side transistor gate, receiving the high side gate signal from a high side gate drive circuit, wherein the high side gate drive circuit is referenced to a second floating power supply terminal.

14. The method of claim 13 , wherein the second floating power supply terminal is a switch node of the half bridge circuit.

15. The method of claim 13 , wherein the half bridge circuit further comprises a capacitor connected between the first floating power supply terminal and the second floating power supply terminal.

16. The method of claim 13 , wherein the half bridge circuit further comprises a delay circuit configured to turn on the first transistor while the low side GaN-based transistor is on.

17. The method of claim 13 , wherein the half bridge circuit further comprises a delay circuit configured to turn off the first transistor while the low side GaN-based transistor is on.

18. The method of claim 11 , wherein the first transistor is an enhancement-mode device.

19. The method of claim 11 , wherein the semiconductor circuit further comprises a second transistor, comprising:

a gate connected to the ground referenced power supply node,

a source connected to the ground referenced power supply node, and

a drain connected to the first floating power supply terminal.

20. The method of claim 11 , wherein the semiconductor circuit further comprises a second transistor, comprising:

a gate connected to the ground referenced power supply node,

a source connecting the first transistor to the first floating power supply terminal and connected to the ground referenced power supply node through the first transistor, and

a drain connected to the first floating power supply terminal.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNMENT DOCUMENTS AND THE RECEIVING PARTY'S POSTAL CODE PREVIOUSLY RECORDED AT REEL: 053864 FRAME: 0208. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 9, 2021
From: NAVITAS SEMICONDUCTOR, INC.
To: NAVITAS SEMICONDUCTOR LIMITED
Reel/Frame 056758/0314 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2020
From: NAVITAS SEMICONDUCTOR, INC.
To: NAVITAS SEMICONDUCTOR LIMITED
Reel/Frame 053864/0208 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2019
From: KINZER, DANIEL M.; SHARMA, SANTOSH; ZHANG, JU JASON
To: NAVITAS SEMICONDUCTOR, INC.
Reel/Frame 049545/0165 →
Continuity (5)
Continuation 15961723 · Apr 24, 2018
Continuation 14667515 · Mar 24, 2015
Provisional Application 62127725 · Mar 3, 2015
Provisional Application 62051160 · Sep 16, 2014
Related Publication 20190319471A1 · Oct 17, 2019
Cited By (1)
US 12,316,241