Microscope apparatus, observation method, and microscope apparatus-control program

1. A microscope apparatus comprising: a stage on which a vessel in which a plurality of object to be observed are stored is installed; an objective lens that forms an image of the plurality of the objects to be observed stored in the vessel; an actuator that moves the stage between an initial set position where the vessel is to be installed on the stage and a scanning measurement position where observation positions in the vessel are to be scanned by the objective lens; a sensor that detects focus information of the vessel while the stage is moved to the scanning measurement position from the initial set position; and a processor, wherein the processor is configured to move at least one of the stage or the objective lens at the scanning measurement position to scan one of the observation positions of the objects in the vessel by the objective lens, and perform an auto-focus control at every observation position on the basis of the focus information in a case where the stage has been moved to the scanning measurement position.

2. The microscope apparatus according to claim 1 ,

wherein the sensor detects a position of a bottom surface of the vessel as the focus information.

3. The microscope apparatus according to claim 2 ,

wherein the sensor detects at least three portions of the bottom surface of the vessel.

4. The microscope apparatus according to claim 3 ,

wherein the processor is configured to acquire information about a type of the vessel installed on the stage, and

wherein the actuator changes a movement path of the stage extending to the scanning measurement position from the initial set position on the basis of the information about the type of the vessel.

5. The microscope apparatus according to claim 4 ,

wherein the vessel is a well plate including a plurality of wells.

6. The microscope apparatus according to claim 3 ,

wherein the vessel is a well plate including a plurality of wells.

7. The microscope apparatus according to claim 3 , further comprising:

at least two displacement sensors that are arranged in a scanning direction with the objective lens interposed therebetween,

wherein the processor is configured to perform the auto-focus control on the basis of the focus information and a position of the vessel in a vertical direction at an observation position that is antecedently detected by the displacement sensor before the objective lens reaches one of the observation position in the vessel.

8. The microscope apparatus according to claim 2 ,

wherein the processor is configured to acquire information about a type of the vessel installed on the stage, and

wherein the actuator changes a movement path of the stage extending to the scanning measurement position from the initial set position on the basis of the information about the type of the vessel.

9. The microscope apparatus according to claim 8 ,

wherein the vessel is a well plate including a plurality of wells.

10. The microscope apparatus according to claim 2 ,

wherein the vessel is a well plate including a plurality of wells.

11. The microscope apparatus according to claim 2 , further comprising:

at least two displacement sensors that are arranged in a scanning direction with the objective lens interposed therebetween,

wherein the processor is configured to perform the auto-focus control on the basis of the focus information and a position of the vessel in a vertical direction at an observation position that is antecedently detected by the displacement sensor before the objective lens reaches one of the observation position in the vessel.

12. The microscope apparatus according to claim 1 ,

wherein the processor is configured to acquire information about a type of the vessel installed on the stage, and

wherein the actuator changes a movement path of the stage extending to the scanning measurement position from the initial set position on the basis of the information about the type of the vessel.

13. The microscope apparatus according to claim 12 ,

wherein the vessel is a well plate including a plurality of wells.

14. The microscope apparatus according to claim 12 ,

wherein the stage moves in a direction orthogonal to a direction of an optical axis of the objective lens while the stage is moved to the scanning measurement position from the initial set position.

15. The microscope apparatus according to claim 1 ,

wherein the vessel is a well plate including a plurality of wells.

16. The microscope apparatus according to claim 1 , further comprising:

at least two displacement sensors that are arranged in a scanning direction with the objective lens interposed therebetween,

wherein the processor is configured to perform the auto-focus control on the basis of the focus information and a position of the vessel in a vertical direction at an observation position that is antecedently detected by the displacement sensor before the objective lens reaches one of the observation position in the vessel.

17. The microscope apparatus according to claim 16 ,

wherein the displacement sensors are also used as the sensor which detects the focus information, and

the actuator moves the stage so that the stage passes above the displacement sensors while being moved to the scanning measurement position from the initial set position.

18. The microscope apparatus according to claim 16 ,

wherein the sensor which detects the focus information includes a displacement sensor for detecting focus information that is different from the displacement sensors.

19. The microscope apparatus according to claim 1 ,

wherein the movement path of the stage extending to the scanning measurement position from the initial set position includes movement paths in a plurality of directions.

20. The microscope apparatus according to claim 1 ,

wherein the sensor locates in front of the objective lens in a moving direction of the stage, and the sensor further detects the focus information of the vessel after the stage moves to the scanning measurement position and before the objective lens arrives at the observation position.

21. An observation method including moving a stage, on which a vessel in which a plurality of objects to be observed are stored is installed, from an initial set position where the vessel is to be installed to a scanning measurement position different from the initial set position and moving at least one of the stage or an objective lens forming an image of the plurality of the objects to be observed stored in the vessel, at the scanning measurement position to scan observation positions in the vessel and to observe the plurality of objects to be observed, the observation method comprising:

detecting focus information of the vessel while the stage is moved to the scanning measurement position from the initial set position, and

performing auto-focus control at every observation position in the vessel on the basis of the focus information in a case where the stage has been moved to the scanning measurement position.

22. A non-transitory computer readable recording medium storing a microscope apparatus-control program causing a computer to perform moving a stage, on which a vessel in which a plurality of objects to be observed are stored is installed, from an initial set position where the vessel is to be installed to a scanning measurement position, and moving at least one of the stage or an objective lens forming an image of the plurality of the objects to be observed stored in the vessel, at the scanning measurement position to scan observation positions in the vessel, the microscope apparatus-control program causing the computer to perform:

detecting focus information of the vessel while the stage is moved to the scanning measurement position from the initial set position, and

performing auto-focus control at every observation position in the vessel on the basis of the focus information in a case where the stage has been moved to the scanning measurement position.