IP Library › Granted Patent US 11,211,378
Granted Patent B2
US 11,211,378 · App. 16/515,877 · Granted Dec 28, 2021

Heterogeneous integration structure for artificial intelligence computing

Inventors: Mukta G. Farooq (Hopewell Junction, NY); Arvind Kumar (Chappaqua, NY)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
H01L27/0688H01L25/0657H01L27/249H01L2225/06541
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Quick Facts
Patent No.
US 11,211,378
App. No.
16/515,877
Granted
Dec 28, 2021
Kind
B2
Abstract

Three-dimensional (3D) semiconductor memory structures and methods of forming 3D semiconductor memory structures are provided. The 3D semiconductor memory structure includes a chip comprising a memory and Through-Silicon Vias (TSVs). The 3D semiconductor memory structure further includes a hardware accelerator arranged on and coupled face-to-face to the above chip. The 3D semiconductor memory structure also includes a substrate arranged under the under the (3D) semiconductor memory structure and the hardware accelerator and attached to the TSVs and external inputs and outputs of the memory chip and the hardware accelerator.

Claims (26)

1. A three-dimensional (3D) semiconductor memory device, comprising:

a 3D semiconductor structure having a chip comprising a memory and Through-Silicon Vias (TSVs);

a hardware accelerator arranged on and coupled face-to-face to the chip, wherein the chip is below the hardware accelerator;

a substrate arranged under the (3D) semiconductor memory structure and the hardware accelerator and attached to the TSVs and external inputs and outputs of the chip and the hardware accelerator; and

a supplemental High Bandwidth Memory (HBM) coupled to the substrate and configured to perform memory operations,

wherein the chip comprising the memory and the TSVs further includes a memory controller for controlling the memory operations, and

wherein the supplemental HBM is coupled to the substrate using a pre-soldered laminate.

2. The 3D semiconductor memory device of claim 1 , wherein the TSVs are arranged at a periphery of the chip.

3. The 3D semiconductor memory device of claim 1 , wherein the chip comprising the memory and the TSVs and the hardware accelerator are coupled to form an intermediate structure to which the substrate is attached.

4. The 3D semiconductor memory device of claim 1 , wherein the substrate is a packaging substrate comprising a pre-soldered laminate.

5. The 3D semiconductor memory device of claim 1 , wherein the chip comprises a Static Random Access Memory.

6. The 3D semiconductor memory device of claim 1 , wherein the chip comprising the memory and the TSVs further comprises a HBM Physical (PHY) interface and a HBM memory controller supporting a supplemental HBM and directly electrically coupled to the supplemental HBM using Back End Of Line (BEOL) metal lines.

7. The 3D semiconductor memory device of claim 6 , wherein the HBM PHY interface and the HBM memory controller are disposed in an inter-layer dielectric layer of a BEOL of the wafer.

8. The 3D semiconductor memory device of claim 1 , wherein the TSVs pass through peripheral regions of the chip.

9. A three-dimensional (3D) semiconductor memory device, comprising:

a 3D semiconductor structure having a memory chip comprising a memory and Through-Silicon Vias (TSVs);

a hardware accelerator arranged on and coupled to the memory chip;

an analog chip, arranged between the memory chip and the hardware accelerator and coupled face-to-face to the hardware accelerator;

a substrate arranged under the (3D) semiconductor memory structure, the hardware accelerator, and the analog chip, and attached to the TSVs and external inputs and outputs of the memory chip and the hardware accelerator; and

a supplemental High Bandwidth Memory (HBM) coupled to the substrate and configured to perform memory operations,

wherein the memory chip comprising the memory and the TSVs further includes a memory controller for controlling the memory operations, and

wherein the supplemental HBM is coupled to the substrate using a pre-soldered laminate.

10. The three-dimensional (3D) semiconductor memory device of claim 9 , wherein the analog chip is coupled to the hardware accelerator using Cu pillars and solder caps.

11. The three-dimensional (3D) semiconductor memory device of claim 9 , wherein the analog chip is free of TSVs.

12. The three-dimensional (3D) semiconductor memory device of claim 9 , wherein the analog chip comprises one or more TSVs.

13. The three-dimensional (3D) semiconductor memory device of claim 9 , wherein the hardware accelerator is coupled to the memory chip by copper pillars used in a copper-to-copper bond.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2019
From: FAROOQ, MUKTA G.; KUMAR, ARVIND
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 049794/0525 →
Continuity (1)
Related Publication 20210020627A1 · Jan 21, 2021
Cited By (2)
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