IP Library Granted Patent US 11,502,667
Granted Patent B2
US 11,502,667 · App. 16/525,858 · Granted Nov 15, 2022

Top electrodes with step arrangements for bulk acoustic wave resonators

Inventors: Alireza Tajic (Snoqualmie, WA); Paul Stokes (Orlando, FL); Robert Aigner (Ocoee, FL)
Assignee: Qorvo US, Inc.
H03H9/132H01L41/047H01L41/0533H03H9/02062H03H9/02086H03H9/173H03H9/175H03H9/54
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Quick Facts
Patent No.
US 11,502,667
App. No.
16/525,858
Filed
Jul 30, 2019
Granted
Nov 15, 2022
Kind
B2
Art Unit
2849
USPC
310/365
Abstract

Bulk acoustic wave (BAW) resonators, and particularly top electrodes with step arrangements for BAW resonators are disclosed. Top electrodes on piezoelectric layers are disclosed that include a border (BO) region with a dual-step arrangement where an inner step and an outer step are formed with increasing heights toward peripheral edges of the top electrode. Dielectric spacer layers may be provided between the outer steps and the piezoelectric layer. Passivation layers are disclosed that extend over the top electrode either to peripheral edges of the piezoelectric layer or that are inset from peripheral edges of the piezoelectric layer. Piezoelectric layers may be arranged with reduced thickness portions in areas that are uncovered by top electrodes. BAW resonators as disclosed herein are provided with high quality factors and suppression of spurious modes while also providing weakened BO modes that are shifted farther away from passbands of such BAW resonators.

Claims (34)

1. A bulk acoustic wave (BAW) resonator comprising:

a bottom electrode;

a piezoelectric layer over the bottom electrode;

a top electrode over the piezoelectric layer, the top electrode forming a central region that forms a first height from the piezoelectric layer and a border (BO) region that extends about a periphery of the central region, the BO region comprising:

an inner step on the piezoelectric layer, the inner step forming a second height from the piezoelectric layer that is greater than the first height of the central region; and

an outer step on the piezoelectric layer, the outer step forming a third height from the piezoelectric layer that is greater than the first height of the central region; and

a dielectric spacer layer arranged between the outer step and the piezoelectric layer, wherein the dielectric spacer layer is in contact with the piezoelectric layer under the outer step.

2. The BAW resonator of claim 1 , wherein the third height is greater than the second height.

3. The BAW resonator of claim 1 , wherein the inner step and the outer step form mass loading portions of the top electrode.

4. The BAW resonator of claim 1 , wherein the dielectric spacer layer comprises at least one of silicon dioxide, silicon nitride, or aluminum nitride.

5. The BAW resonator of claim 1 , wherein the bottom electrode is arranged to extend along a bottom of the piezoelectric layer a distance that is in a range from 200 nm to 1 μm past a lateral edge of the top electrode that is on a top of the piezoelectric layer.

6. The BAW resonator of claim 1 , further comprising a passivation layer over the top electrode.

7. The BAW resonator of claim 6 , wherein the passivation layer extends to a peripheral edge of the piezoelectric layer.

8. The BAW resonator of claim 6 , wherein the passivation layer extends to a peripheral edge of the outer step and the passivation layer is inset from a peripheral edge of the piezoelectric layer.

9. The BAW resonator of claim 1 , wherein the top electrode forms an inner ring that forms a fourth height from the piezoelectric layer and the fourth height is less than the first height of the central region.

10. The BAW resonator of claim 9 , wherein the inner ring is spaced apart from the BO region by a gap portion of the top electrode.

11. The BAW resonator of claim 1 , wherein the outer step comprises a first outer step and the BAW resonator further comprises a second outer step such that the second outer step, the first outer step, and the inner step are arranged to form a step structure of descending heights from the BO region toward the central region.

12. The BAW resonator of claim 1 , wherein the BAW resonator comprises a solidly mounted resonator (SMR) type BAW resonator.

13. The BAW resonator of claim 1 , wherein the BAW resonator comprises a film bulk acoustic resonator (FBAR).

14. A bulk acoustic wave (BAW) resonator comprising:

a bottom electrode;

a piezoelectric layer over the bottom electrode; and

a top electrode over the piezoelectric layer, the top electrode forming a central region and a border (BO) region that extends about a periphery of the central region, the BO region comprising an inner step and an outer step, wherein the inner step is arranged between the central region and the outer step;

wherein an outside region is defined by peripheral boundaries of the top electrode and a portion of the piezoelectric layer is in the outside region, wherein the portion of the piezoelectric layer in the outside region forms a reduced thickness compared with a portion of the piezoelectric layer that is registered with the top electrode.

15. The BAW resonator of claim 14 , wherein the central region forms a first height from the piezoelectric layer, the inner step forms a second height from the piezoelectric layer, and the outer step forms a third height from the piezoelectric layer, and wherein the second height and the third height are greater than the first height.

16. The BAW resonator of claim 14 , further comprising a dielectric spacer layer arranged between the outer step and the piezoelectric layer.

17. The BAW resonator of claim 14 , wherein the bottom electrode overlaps with the portion of the piezoelectric layer that forms the reduced thickness.

18. The BAW resonator of claim 14 , further comprising a passivation layer over the top electrode.

19. The BAW resonator of claim 18 , wherein the passivation layer extends to a peripheral edge of the piezoelectric layer.

20. The BAW resonator of claim 14 , wherein the top electrode forms an inner ring that comprises a mass-reducing region of the top electrode.

21. The BAW resonator of claim 20 , wherein the inner ring is spaced apart from the BO region by a gap portion of the top electrode.

22. The BAW resonator of claim 20 , wherein the inner ring is directly adjacent the BO region of the top electrode.

23. The BAW resonator of claim 14 , wherein the BAW resonator comprises a solidly mounted resonator (SMR) type BAW resonator.

24. The BAW resonator of claim 14 , wherein the BAW resonator comprises a film bulk acoustic resonator (FBAR).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2019
From: TAJIC, ALIREZA; STOKES, PAUL; AIGNER, ROBERT
To: QORVO US, INC.
Reel/Frame 050184/0287 →
Continuity (2)
Provisional Application 62792113 · Jan 14, 2019
Related Publication 20200228089A1 · Jul 16, 2020
Cited By (7)
US 12,334,908 US 12,425,002 US 12,483,223 US 12,483,225 US 12,627,279 US 12,665,571 US 12,719,444