Systems and methods for manufacturing nano-electro-mechanical-system probes
Systems and methods for manufacturing multiple integrated tip probes for scanning probe microscopy. According to an embodiment is a microscope probe configured to analyze a sample, the microscope probe including: a movable probe tip including a terminal probe end; a first actuator configured to displace the movable probe tip along a first axis; and a detection component configured to detect motion of the movable probe tip in response to an applied signal; where the moveable probe tip comprises a metal layer affixed to a supporting layer, at least a portion of the metal layer at the terminal probe end extending past the supporting layer.
1. A microscope probe configured to analyze a sample, the microscope probe comprising:
a first probe tip;
a second probe tip positioned a first distance from the first probe tip, wherein the second probe tip is positioned vertically above the first probe tip;
a fixed substrate;
a first spacer layer arranged between the fixed substrate and the first probe tip; and
a second spacer layer arranged between the first probe tip and the second probe tip;
wherein the first probe tip and the second probe tip each comprising a respective metal layer affixed to a top surface of first spacer layer and the second spacer layer, respectively, and each respective metal layer further comprising a respective terminal probe end;
wherein a portion of a bottom surface of the first spacer layer is fixedly secured to a top surface of the fixed substrate;
wherein a portion of a bottom surface of the second spacer layer is fixedly secured to a top surface of a portion of the first probe tip;
wherein at least a portion of the respective metal layers at the respective terminal probe ends of each of the first probe tip and the second probe tip extend past the first spacer layer and the second spacer layer, respectively in a plane parallel to the top surface of the fixed substrate; and
wherein each of the first probe tip and the second probe tip are freely moveable in the plane parallel to the top surface of the fixed substrate.
2. The microscope probe of claim 1 , further comprising a first actuator configured to displace at least one of the first probe tip and/or the second probe tip along a first axis; and a detection component configured to detect motion of the first probe tip and/or the second probe tip in response to the sample.
3. The microscope probe of claim 1 , wherein said first probe tip and second probe tip each comprise a metal.
4. The microscope probe of claim 3 , wherein the first probe tip and the second probe tip comprise the same metal.
5. The microscope probe of claim 3 , wherein the first probe tip and the second probe tip each comprise a different metal.