Charged particle beam device
An object of the invention is to stably supply an electron beam from an electron gun, that is, to prevent variation in intensity of the electron beam. The invention provides a charged particle beam device that includes an electron gun having an electron source, an extraction electrode to which a voltage used for extracting electrons from the electron source is applied, and an acceleration electrode to which a voltage used for accelerating the electrons extracted from the electron source is applied, a first heating unit that heats the extraction electrode, and a second heating unit that heats the acceleration electrode.
1. A charged particle beam device comprising:
an electron gun having an electron source, an extraction electrode to which a voltage used for extracting electrons from the electron source is applied, and an acceleration electrode to which a voltage used for accelerating the electrons extracted from the electron source is applied;
a first heating unit that heats the extraction electrode; and
a second heating unit that heats the acceleration electrode; and
a heat insulating portion that is provided between the acceleration electrode and a cylindrical body that houses the electron source, the extraction electrode and the acceleration electrode, and prevents hear transfer from the acceleration electrode to the cylindrical body,
wherein the heat insulating portion is a titanium alloy.
2. The charged particle beam device according to claim 1 , wherein the titanium alloy is Ti-6Al-4V.
3. The charged particle beam device according to claim 1 , wherein
a black body coating is formed on a surface where the extraction electrode and the acceleration electrode face each other.
4. The charged particle beam device according to claim 1 , further comprising:
a control electrode that is disposed to cover the extraction electrode and to which a voltage used for controlling a position of a virtual light source is applied, wherein
the first heating unit heats the extraction electrode by heating the control electrode.
5. A charged particle beam device comprising:
an electron gun having an electron source, an extraction electrode to which a voltage used for extracting electrons from the electron source is applied, and an acceleration electrode to which a voltage used for accelerating the electrons extracted from the electron source is applied;
a first heating unit that heats the extraction electrode; and
a second heating unit that heats the acceleration electrode,
wherein the acceleration electrode includes a first annular portion that is disposed on a side of the electron source and has an annular shape, a second annular portion that is disposed on a side of a sample irradiated with accelerated electrons, and a cylindrical portion that is disposed between the first annular portion and the second annular portion and has a cylindrical shape, and
wherein a size of an opening of the first annular portion is equal to or greater than a size of an opening of the second annular portion, and is smaller than an inner diameter of the cylindrical portion.
6. The charged particle beam device according to claim 5 , wherein
a value obtained by dividing a axial length of the cylindrical portion by the size of the opening of the first annular portion is 1 or more.
7. The charged particle beam device according to claim 5 , wherein
an inclined surface having a high inner side is formed around the opening of the second annular portion.
8. The charged particle beam device according to claim 5 further comprising:
a heat insulating portion that is provided between the second annular portion and a cylindrical body that accommodates the electron source, the extraction electrode and the acceleration electrode, and prevents heat transfer from the acceleration electrode to the cylindrical body, wherein
an outer diameter of the first annular portion is larger than an outer diameter of the cylindrical portion or the second annular portion.
9. The charged particle beam device according to claim 8 , wherein
the heat insulating portion includes a vacuum seal.
10. The charged particle beam device according to claim 5 , wherein
an NEG pump is disposed inside the acceleration electrode.
11. The charged particle beam device according to claim 10 , wherein
a diffusion port is provided on a side surface of the cylindrical portion.
12. The charged particle beam device according to claim 5 , wherein
a heater is disposed on the outer periphery of the cylindrical portion.
13. A charged particle beam device comprising:
an electron gun having an electron source, an extraction electrode to which a voltage used for extracting electrons from the electron source is applied, and an acceleration electrode to which a voltage used for accelerating the electrons extracted from the electron source is applied;
a first heating unit that heats the extraction electrode; and
a second heating unit that heats the acceleration electrode,
wherein
an exhaust port is provided on a side surface of the extraction electrode, and
the first heating unit is provided to avoid the exhaust port.