IP Library › Granted Patent US 10,895,449
Granted Patent B2
US 10,895,449 · App. 16/601,802 · Granted Jan 19, 2021

Shape measuring device

Inventors: Kentaro Nemoto (Kawasaki, JP); Masaoki Yamagata (Kawasaki, JP); Ryohei Kanno (Kawasaki, JP); Hiroaki Kawata (Kawasaki, JP)
Assignee: Mitutoyo Corporation
G01B11/24G01B11/002
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Quick Facts
Patent No.
US 10,895,449
App. No.
16/601,802
Granted
Jan 19, 2021
Kind
B2
Abstract

A shape measuring device includes a holding unit which holds a measuring target of which a shape is to be measured, a first measurement unit which measures relative coordinates of a plurality of measurement points on a first surface of the measurement target with respect to a defined point, a second measurement unit which operates independently from the first measurement unit and measures relative coordinates of a plurality of measurement points on a second surface of the measurement target, which is a reverse surface of the first surface, with respect to the defined point, and a calculation unit which calculates a shape of the measurement target on the basis of results measured by the first measurement unit and the second measurement unit.

Claims (18)

1. A shape measuring device comprising:

a holder configured to hold a measuring target having a measurable shape;

a first measurement circuit configured to measure relative coordinates of a plurality of measurement points on a first surface of the measurement target with respect to a defined point;

a second measurement circuit configured to operate independently from the first measurement circuit and measure relative coordinates of a plurality of measurement points on a second surface of the measurement target, which is a reverse surface of the first surface, with respect to the defined point; and

calculation circuitry configured to:

calculate a shape of the measurement target on the basis of results measured by the first measurement circuit and the second measurement circuit,

use the data measured by the first measurement circuit to obtain an equation of a plane from a group of points on the first surface,

obtain a center of gravity from a group of points on the second surface using the data measured by the second measurement circuit, and

obtain a thickness of the measuring target from the equation of the plane and the center of gravity.

2. The shape measuring device according to claim 1 , wherein

the first measurement circuit and the second measurement circuit are further configured to include a non-contact sensor configured to measure the plurality of measurement points without contacting the measurement target.

3. The shape measuring device according to claim 1 , wherein

the first measurement circuit and the second measurement circuit each have a two-dimensional sensor configured to scan the surfaces of the measurement target.

4. The shape measuring device according to claim 1 , wherein

the first measurement circuit is a measurement circuit configured to perform measurement using a first sensor facing the first surface of the measurement target,

the second measurement circuit is a measurement circuit configured to perform measurement using a second sensor facing the second surface of the measurement target, and

the holder is configured to fix and hold the measurement target during a measurement period.

5. The shape measuring device according to claim 1 , further comprising a moving device fixed to the holder and configured to positon the measurement target with respect to the first measurement circuit and the second measurement circuit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2019
From: NEMOTO, KENTARO; YAMAGATA, MASAOKI; KANNO, RYOHEI; KAWATA, HIROAKI
To: MITUTOYO CORPORATION
Reel/Frame 050714/0891 →
Priority Claims (1)
JP 2018-203095 · Oct 29, 2018 · national
Continuity (1)
Related Publication 20200132439A1 · Apr 30, 2020
Cited By (1)
US 12,571,628