IP Library › Granted Patent US 12,571,628
Granted Patent B2
US 12,571,628 · App. 18/449,609 · Granted Mar 10, 2026

Optical test device

Inventor: Otto Boucky (Nattheim, DE)
Assignee: JENOPTIK Industrial Metrology Germany GmbH
G01B11/303
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Quick Facts
Patent No.
US 12,571,628
App. No.
18/449,609
Granted
Mar 10, 2026
Kind
B2
Abstract

An optical test device for testing flat test objects comprises a holder for the test object and two optical sensors for detecting the three-dimensional surface topography of the test object. According to the invention, the holder is formed at least in sections as a test standard and is disposed with respect to the sensors in such a way that the sensors scan the test object from opposite sides and also detect the holder as a test standard at least in sections during the detecting of the test object.

Claims (23)

1 . An optical test device for testing flat test objects, comprising:

a holder for the test object and

at least two optical sensors for detecting the three-dimensional surface topography of the test object, wherein:

the holder is formed at least in sections as test standard and is disposed relative to the sensors in such a way that the sensors scan the test object from opposite sides and, during the detecting of the test object, also detect the holder as test standard at least in sections,

the holder comprises two plate-shaped individual parts, each with a window-shaped recess for the receiving of the test object in a reference plane, which are formed as test standard surfaces at their mutually facing surfaces, and

the individual parts are connected to each other in the reference plane offset relative to each other in such a way that test normal surfaces of the one individual part can be or are scanned by one of the sensors through the recess in the other individual part.

2 . The test device according to claim 1 , wherein the holder is formed as a frame.

3 . The test device according to claim 2 , wherein the frame is formed as a circumferentially closed frame with a window-shaped recess.

4 . The test device according to claim 2 , wherein the frame comprises a support structure, onto which the test object can be loosely arranged.

5 . The test device according to claim 4 , wherein the support structure comprises projections spaced apart from each other in circumferential direction of the frame.

6 . The test device according to claim 1 , wherein the holder is formed as a frame which comprises a support structure, onto which the test object can be loosely arranged, the frame is formed as a circumferentially closed frame with a window-shaped recess, and the support structure comprises projections spaced apart from each other in circumferential direction of the frame.

7 . The test device according to claim 6 , wherein the holder is at least coated in sections.

8 . The test device according to claim 1 , wherein the holder is formed as plane-parallel plate.

9 . The test device according to claim 8 , wherein at least one optical sensor is formed and configured for planar detecting of the test object.

10 . The test device according to claim 1 , wherein the holder is at least coated in sections.

11 . The test device according to claim 1 , wherein at least one optical sensor is formed and configured for planar detecting of the test object.

12 . The test device according to claim 1 , wherein at least one optical sensor is formed and configured for linear detecting of the test object, wherein a feeding device is provided for the relative movement of the holder relative to the sensors, such that during the feeding the test object is scanned by the sensor.

13 . The test device according to claim 12 , wherein the holder is provided at at least one test standard surface with surface characteristics detectable by at least one sensor.

14 . The test device according to claim 13 , wherein the holder is at least coated in sections.

15 . The test device according to claim 1 , wherein the holder is provided at at least one test standard surface with surface characteristics detectable by at least one sensor.

16 . A method for testing flat test objects, wherein a test device according to claim 1 is used.

17 . The method according to claim 16 , wherein the test object is a bipolar plate of a fuel cell.

18 . The method according to claim 16 , wherein the test object is a battery foil.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2024
From: BOUCKY, OTTO
To: JENOPTIK INDUSTRIAL METROLOGY GERMANY GMBH
Reel/Frame 068418/0578 →
Priority Claims (2)
DE 10 2022 120 519.3 · Aug 15, 2022 · national
DE 10 2022 124 224.2 · Sep 21, 2022 · national
Continuity (1)
Related Publication 20240053144A1 · Feb 15, 2024
References Cited (17)
US 9239296B2 · Citriniti · 2016 [cited by examiner]
US 10744675B2 · Citriniti · 2020 [cited by examiner]
US 10895449B2 · Nemoto · 2021 [cited by examiner]
US 20100045975A1 · Zoeller, III · 2010 [cited by examiner]
US 20140193064A1 · Couse et al. · 2014 [cited by applicant]
US 20150192404A1 · Tang et al. · 2015 [cited by applicant]
US 20180364028A1 · Piel et al. · 2018 [cited by applicant]
US 20200132439A1 · Nemoto · 2020 [cited by examiner]
US 20210050237A1 · Rebstock · 2021 [cited by examiner]
US 20210096089A1 · Shimizu · 2021 [cited by examiner]
DE 102017124978A1 · 2019 [cited by applicant]
JP 4132736B2 · 2008 [cited by examiner]
WO 2013134672A1 · 2013 [cited by applicant]
WO 2013182960A1 · 2013 [cited by applicant]
WO 2019205499A1 · 2019 [cited by applicant]
Deutsches Patent—Und Markenamt, Office Action regarding German Patent Application No. 102022124224.2, dated Sep. 22, 2023, 8 pages. [cited by applicant]
European Patent Office, Extended European Search Report regarding European Patent Application No. 23190875.7, dated Dec. 21, 2023, 11 pages. [cited by applicant]