Inspection system and method of inspection for substrate containers
The present disclosure relates to an inspection system configured and adapted for inspecting a substrate container or a component of a substrate container, the container or the component including a plurality of surfaces, the system including at least one mirror arranged and configured to provide a simultaneous view of at least a first one and a second one of the plurality of surfaces.
1 . A substrate container inspection system configured to inspect a plurality of surfaces of one or more of a substrate container and container components of the substrate container, the inspection system comprising:
more than one mirror configured such that each different mirror of the more than one mirror effects a simultaneous viewing, with a common camera, of an image of separate and disparate portions of the one or more of a substrate container and container components of the substrate container comprising at least a first one and a second one of the plurality of surfaces of the one or more of the substrate container and each container component of the container components.
2 . The substrate container inspection system according to claim 1 , wherein the substrate container or the component comprises a front surface and a plurality of inner and/or outer side surfaces, and the more than one mirror is arranged to provide a simultaneous view of the front surface and at least one of the plurality of side surfaces.
3 . The substrate container inspection system according to claim 1 , wherein the more than one mirror is provided to be movable relative to the substrate container or the component in a translational and/or pivotable manner.
4 . The substrate container inspection system according to claim 1 , comprising the camera configured to commonly capture the image of a simultaneous view of at least the first one and the second one of the plurality of surfaces.
5 . The substrate container inspection system according to claim 4 , wherein the camera is configured to capture an image of the front surface and at least one of the plurality of side surfaces.
6 . The substrate container inspection system according to claim 4 , wherein the at least one camera is provided as a line scan camera or an area scan camera.
7 . The substrate container inspection system according to claim 4 , wherein the camera is provided to be movable relative to the substrate container or the component in a translational and/or pivotable manner.
8 . The substrate container inspection system according to claim 4 , comprising an evaluating unit configured to evaluate the state of the substrate container or the component on the basis of at least one image captured by the camera.
9 . The substrate container inspection system according to claim 8 , wherein the evaluating unit is configured to provide an image analysis of the at least one image captured by the camera.
10 . The substrate container inspection system according to claim 1 , configured to inspect a front opening unified pod (FOUP), especially a body member and/or a lid member of a FOUP.
11 . A method for inspecting a plurality of surfaces of one or more of a substrate container and container components of the substrate container, the method comprising the steps of:
positioning the substrate container at or in the vicinity of an inspection system comprising more than one mirror configured such that each different mirror of the more than one mirror effects a simultaneous viewing, with a common camera, of an image of separate and disparate portions of the one or more of a substrate container and container components of the substrate container comprising at least a first one and a second one of the plurality of surfaces of the one or more of the substrate container and each container component of the container components,
capturing the image of the simultaneous view of the first one and the second one of the plurality of surfaces with the common camera,
evaluating the state of the substrate container and the container components with an evaluation unit configured to evaluate the state of the substrate container and the container components on the basis of at least one image captured by the camera.
12 . The method according to claim 11 , further utilizing a substrate container inspection system according to claim 1 .