PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
A plasma processing method includes an etching step of etching a wafer in a chamber, a plasma cleaning step of removing a particle on an inner wall of the chamber by introducing a gas containing a halogen element into the chamber by a plasma processing method for removing remaining halogen or the like in the chamber in a short time and improving throughput, and a remaining halogen removing step of removing the halogen element remaining in the chamber in the plasma cleaning step by alternately repeating an on state and an off state of the plasma containing oxygen in the chamber.
1 . A plasma processing method for plasma processing a sample in a processing chamber, the method comprising:
a first step of plasma processing the sample;
a second step of performing plasma-cleaning inside the processing chamber using a fluorine-containing gas after the first step; and
a third step of performing plasma-cleaning inside the processing chamber using plasma generated by a pulse-modulated radio frequency power and an oxygen gas after the second step.
2 . The plasma processing method according to claim 1 , wherein
plasma in the second step performs continuous discharge.
3 . The plasma processing method according to claim 2 , wherein
an off time of the pulse in pulse-modulation is made longer than an off time of the plasma during which a negative ion flux flowing onto an inner wall of the processing chamber is larger than an electron flux flowing onto the inner wall of the processing chamber, or the off time of the pulse is equal to the off time of the plasma.
4 . The plasma processing method according to claim 3 , wherein
the fluorine-containing gas is a nitrogen trifluoride (NF 3 ) gas.
5 . The plasma processing method according to claim 4 , wherein
a duty ratio of the pulse is set to 50% or less, and a cycle of the pulse is set to 1 ms.
6 . A plasma processing apparatus, comprising:
a processing chamber configured to perform plasma processing of a sample;
a radio frequency power supply configured to supply a radio frequency power for generating plasma;
a sample stage on which the sample is placed; and
a control device configured to execute a program specifying:
a first step of plasma processing the sample;
a second step of performing plasma-cleaning inside the processing chamber using a fluorine-containing gas after the first step; and
a third step of performing plasma-cleaning inside the processing chamber using plasma generated by a pulse-modulated radio frequency power and an oxygen gas after the second step.