IP Library Granted Patent US 11,152,326
Granted Patent B2
US 11,152,326 · App. 16/664,568 · Granted Oct 19, 2021

Semiconductor die with multiple contact pads electrically coupled to a lead of a lead frame

Inventors: Rennier Rodriguez (Bulacan, PH); Rammil Seguido (Malolos, PH); Raymond Albert Narvadez (Sta. Rosa, PH); Michael Tabiera (Cabuyao, PH)
Assignee: STMicroelectronics, Inc.
H01L24/45H01L23/4952H01L23/49513H01L24/43
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Quick Facts
Patent No.
US 11,152,326
App. No.
16/664,568
Granted
Oct 19, 2021
Kind
B2
Abstract

The present disclosure is directed to a semiconductor die with multiple contact pads electrically coupled to a single lead via a single wire, and methods for fabricating the same. In one or more embodiments, multiple contact pads are electrically coupled to each other by a plurality of conductive layers stacked on top of each other. The uppermost conductive layer is then electrically coupled to a single lead via a single wire.

Claims (64)

1. A device, comprising:

a lead frame including a first lead;

a die on the lead frame, the die including a first contact pad and a second contact pad;

a first conductive layer on the first contact pad;

a second conductive layer on the second contact pad;

a third conductive layer on the first conductive layer and the second conductive layer, the third conductive layer being positioned between the first conductive layer and the second conductive layer; and

a first wire coupled to the third conductive layer and the first lead.

2. The device of claim 1 wherein the die includes a third contact pad, the device further including:

a fourth conductive layer on the third contact pad; and

a fifth conductive layer on the second conductive layer and the fourth conductive layer.

3. The device of claim 2 , further comprising:

a second wire coupled to the fifth conductive layer and the first lead.

4. The device of claim 2 wherein the lead frame includes a second lead, the device further including:

a second wire coupled to the fifth conductive layer and the second lead.

5. The device of claim 1 wherein the first conductive layer and the second conductive layer are in a first plane.

6. The device of claim 5 wherein the third conductive layer is in a second plane parallel to the first plane.

7. The device of claim 1 wherein the first conductive layer, the second conductive layer, and the third conductive layer are conductive balls.

8. The device of claim 1 wherein the first contact pad and the second contact pad are on the same surface of the die.

9. A device, comprising:

a lead frame including a plurality of leads;

a semiconductor die on the lead frame, the semiconductor die including a first contact pad and a second contact pad spaced from the first contact pad;

a first conductive layer on the first contact pad;

a second conductive layer on the second contact pad;

a third conductive layer on the first conductive layer and the second conductive layer; and

a wire having a first end contacting the third conductive layer, and a second end contacting a single lead of the plurality of leads.

10. The device of claim 9 wherein the third conductive layer is positioned between the first conductive layer and the second conductive layer.

11. The device of claim 9 wherein the first conductive layer and the second conductive layer are in a first plane, and the third conductive layer is in a second plane parallel to the first plane.

12. The device of claim 9 wherein the first conductive layer, the second conductive layer, and the third conductive layer are conductive balls.

13. A method, comprising:

positioning a semiconductor die on a lead frame including a plurality of leads, the semiconductor die including a first contact pad and a second contact pad spaced from the first contact pad;

forming a first conductive layer on the first contact pad;

forming a second conductive layer on the second contact pad;

forming a third conductive layer on the first conductive layer and the second conductive layer; and

coupling a first wire to the third conductive layer and a single lead of the plurality of leads, a first end of the first wire contacting the third conductive layer, a second end of the first wire contacting the single lead.

14. The method of claim 13 , further comprising:

forming a fourth conductive layer on a third contact pad; and

forming a fifth conductive layer on the second conductive layer and the fourth conductive layer.

15. The method of claim 14 , further comprising:

coupling a first end of a second wire to the fifth conductive layer; and

coupling a second end of the second wire to the single lead.

16. The method of claim 14 , further comprising:

coupling a first end of a second wire to the fifth conductive layer; and

coupling a second end of the second wire to another lead of the lead frame.

17. A device, comprising:

a lead frame including a first lead;

a die on the lead frame, the die including a first contact pad, a second contact pad, and a third contact pad;

a first conductive layer on the first contact pad;

a second conductive layer on the second contact pad;

a third conductive layer on the first conductive layer and the second conductive layer;

a fourth conductive layer on the third contact pad;

a fifth conductive layer on the second conductive layer and the fourth conductive layer; and

a first wire coupled to the third conductive layer and the first lead.

18. The device of claim 17 , further comprising:

a second wire coupled to the fifth conductive layer and the first lead.

19. The device of claim 17 wherein the lead frame includes a second lead, the device further including:

a second wire coupled to the fifth conductive layer and the second lead.

20. A device, comprising:

a lead frame including a first lead;

a die on the lead frame, the die including a first contact pad and a second contact pad;

a first conductive layer on the first contact pad;

a second conductive layer on the second contact pad;

a third conductive layer on the first conductive layer and the second conductive layer, the first conductive layer and the second conductive layer being in a first plane, the third conductive layer being in a second plane parallel to the first plane; and

a first wire coupled to the third conductive layer and the first lead.

21. The device of claim 20 wherein the third conductive layer is positioned between the first conductive layer and the second conductive layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2024
From: STMICROELECTRONICS, INC.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 068025/0112 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 1, 2020
From: RODRIGUEZ, RENNIER; SEGUIDO, RAMMIL; NARVADEZ, RAYMOND ALBERT; TABIERA, MICHAEL
To: STMICROELECTRONICS, INC.
Reel/Frame 054507/0949 →
Continuity (2)
Provisional Application 62752676 · Oct 30, 2018
Related Publication 20200135686A1 · Apr 30, 2020