Testing device for bottom-emitting or bottom-detecting optical devices

1. An apparatus, comprising:

a support structure having at least one opening formed in a sidewall;

a lower transparent chuck supported by the support structure;

an upper transparent chuck supported by the support structure,

wherein the upper transparent chuck comprises a set of vacuum holes,

wherein a space between the lower transparent chuck and the upper transparent chuck defines a chamber in which a vacuum is formed when a vacuum pump is applied to the at least one opening in the sidewall of the support structure, and

wherein the vacuum formed in the chamber between the lower transparent chuck and the upper transparent chuck creates suction that causes an optical device under test to be mechanically secured on a top surface of the upper transparent chuck; and

a photodetector disposed below the lower transparent chuck to detect light that travels through the upper transparent chuck and the lower transparent chuck when one or more probes complete an electrical path that causes the light to be emitted by the optical device under test.

2. The apparatus of claim 1 , further comprising:

a first electrode on the top surface of the upper transparent chuck,

wherein the optical device under test has a second electrode on a top surface, and

wherein the one or more probes complete the electrical path that causes the light to be emitted by the optical device under test when the one or more probes are in contact with the second electrode on the top surface of the optical device under test while the optical device under test is in contact with the first electrode on the top surface of the upper transparent chuck.

3. The apparatus of claim 1 , wherein:

the one or more probes comprise at least a first probe and a second probe, and

the one or more probes complete the electrical path that causes the light to be emitted by the optical device under test when the first probe is in contact with a first electrode on a top surface of the optical device under test while the second probe is in contact with a second electrode on the top surface of the optical device under test.

4. The apparatus of claim 1 , further comprising:

a heating element in thermal contact with the upper transparent chuck to cause the optical device under test to be heated to a target temperature prior to the one or more probes completing the electrical path that causes the optical device under test to emit the light.

5. The apparatus of claim 1 , further comprising:

a cooling element in thermal contact with the upper transparent chuck and the support structure to conduct heat away from the optical device under test prior to the one or more probes completing the electrical path that causes the optical device under test to emit the light.

6. The apparatus of claim 1 , wherein one or more of the lower transparent chuck or the upper transparent chuck has an anti-reflective coating.

7. The apparatus of claim 1 , wherein the vacuum formed in the chamber between the lower transparent chuck and the upper transparent chuck causes the optical device under test to be flattened against the top surface of the upper transparent chuck to prevent the optical device under test from bowing when contacted from above by the one or more probes.

8. The apparatus of claim 1 , wherein one or more of the lower transparent chuck or the upper transparent chuck are formed from a material having one or more of a thermal conductivity that satisfies a threshold or a hardness to withstand the vacuum formed when the vacuum pump is applied to the at least one opening in the sidewall of the support structure.

9. The apparatus of claim 1 , wherein the set of vacuum holes are formed in the upper transparent chuck according to a pattern that is based on a layout of the optical device under test.

10. The apparatus of claim 1 , wherein the optical device under test comprises a vertical-cavity surface-emitting laser device configured to emit the light.

11. An apparatus, comprising:

a support structure having at least one opening formed in a sidewall;

a lower transparent chuck supported by the support structure;

an upper transparent chuck supported by the support structure,

wherein the upper transparent chuck comprises a set of vacuum holes,

wherein a space between the lower transparent chuck and the upper transparent chuck defines a chamber in which a vacuum is formed when a vacuum pump is applied to the at least one opening in the sidewall of the support structure, and

wherein the vacuum formed in the chamber between the lower transparent chuck and the upper transparent chuck creates suction that causes an optical device under test to be mechanically secured on a top surface of the upper transparent chuck;

a temperature control device in thermal contact with the upper transparent chuck; and

a testing device disposed below the lower transparent chuck to perform one or more tests based on light that travels through the upper transparent chuck and the lower transparent chuck after the temperature control device causes the optical device under test to reach a target temperature.

12. The apparatus of claim 11 , wherein the temperature control device comprises a heating element in thermal contact with the upper transparent chuck to cause the optical device under test to be heated to the target temperature prior to one or more probes completing an electrical path that causes the light to be emitted by the optical device under test.

13. The apparatus of claim 12 , wherein the heating element is a thin-film heater.

14. The apparatus of claim 11 , wherein the temperature control device comprises a cooling element in thermal contact with the upper transparent chuck and the support structure to conduct heat away from the optical device under test prior to one or more probes completing an electrical path that causes the light to be emitted by the optical device under test.

15. The apparatus of claim 14 , wherein the cooling element is a thermoelectric cooler.

16. The apparatus of claim 11 , wherein the upper transparent chuck is formed from a material having a thermal conductivity that satisfies a threshold.

17. A method, comprising:

applying a vacuum pump to at least one opening in a sidewall of a structure that supports a lower transparent chuck and an upper transparent chuck that comprises a set of vacuum holes,

wherein a space between the lower transparent chuck and the upper transparent chuck defines a chamber in which a vacuum is formed when the vacuum pump is applied to the at least one opening in the sidewall of the structure, and

wherein the vacuum formed in the chamber between the lower transparent chuck and the upper transparent chuck creates suction that causes an optical device under test to be mechanically secured on a top surface of the upper transparent chuck; and

detecting, by a photodetector disposed below the lower transparent chuck, light that travels through the upper transparent chuck and the lower transparent chuck when one or more probes complete an electrical path that causes the light to be emitted by the optical device under test.

18. The method of claim 17 , further comprising:

causing the optical device under test to be heated or cooled to a target temperature using a temperature control device in thermal contact with the upper transparent chuck,

wherein the temperature control device causes the optical device under test to be heated or cooled to the target temperature prior to the one or more probes completing the electrical path that causes the light to be emitted by the optical device under test.

19. The method of claim 17 , wherein the one or more probes complete the electrical path that causes the optical device under test to emit the light when the one or more probes are in contact with a first electrode on a top surface of the optical device under test while the optical device under test is in contact with a second electrode on a top surface of the upper transparent chuck.

20. The method of claim 17 , wherein:

the one or more probes comprise a first probe and a second probe, and

the one or more probes complete the electrical path that causes the light to be emitted by the optical device under test when the first probe is in contact with a first electrode on a top surface of the optical device under test while the second probe is in contact with a second electrode on the top surface of the optical device under test.