Chain testing and diagnosis using two-dimensional scan architecture

1. A method, comprising:

shifting, in a first direction, a test pattern into scan chains in a circuit, the scan chains comprising scan cells, wherein the scan cells on each of the scan chains are further coupled to corresponding scan cells on two other scan chains in the scan chains such that data bits stored in the scan cells can be shifted circularly in a second direction orthogonal to the first direction based on a control signal;

shifting, in the second direction, the test pattern for a number of clock cycles equal to a number of the scan chains; and

shifting, in the first direction, the test pattern out of the scan chains to generate a chain test result.

2. The method recited in claim 1 , further comprising:

determining good scan chains and faulty scan chains based on the chain test result, the good scan chains being scan chains having no faulty scan cells; and

identifying faulty scan cell candidates on the faulty scan chains based on part of the chain test result for one of the good scan chains.

3. The method recited in claim 2 , further comprising:

shifting, in the first direction, another test pattern into the scan chains;

shifting, in a pseudo-diagonal direction, the another test pattern for a number of clock cycles determined based on the faulty scan cell candidates or the faulty scan chains to generate a portion of another chain test result, wherein the shifting in the pseudo-diagonal direction comprises: repeating an operation of shifting the another test pattern for one clock cycle in the first direction followed by shifting for one clock cycle in the second direction or an operation of shifting for one clock cycle in the second direction followed by shifting for one clock cycle in the first direction;

shifting, in the first direction, the another test pattern out of the scan chains to generate rest of the another chain test result; and

determining final faulty scan cell candidates in the faulty scan cell candidates based on the another chain test result.

4. The method recited in claim 3 , wherein the test pattern and the another test pattern are identical.

5. The method recited in claim 1 , further comprising:

shifting, in the first direction, another test pattern into the scan chains;

shifting, in a pseudo-diagonal direction, the another test pattern for a number of clock cycles equal to two times the number of the scan chains to generate a portion of another chain test result, wherein the shifting in the pseudo-diagonal direction comprises: repeating an operation of shifting the another test pattern for one clock cycle in the first direction followed by shifting for one clock cycle in the second direction or repeating an operation of shifting for one clock cycle in the second direction followed by shifting for one clock cycle in the first direction; and

shifting, in the first direction, the another test pattern out of the scan chains to generate rest of the another chain test result.

6. The method recited in claim 5 , further comprising:

determining good scan chains and faulty scan chains based on the chain test result, the good scan chain being a scan chain having no faulty scan cells; and

determining faulty scan cell candidates on the faulty scan chains based on part of the chain test result for one of the good scan chains and the another chain test result.

7. The method recited in claim 5 , wherein the test pattern and the another test pattern are identical.

8. A method, comprising:

shifting, in a first direction, a test pattern into scan chains in a circuit, the scan chains comprising scan cells, wherein the scan cells on each of the scan chains are further coupled to corresponding scan cells on two other scan chains in the scan chains such that data bits stored in the scan cells can be shifted circularly in a second direction orthogonal to the first direction based on a control signal;

shifting, in a pseudo-diagonal direction, the test pattern for a number of clock cycles equal to two times a number of the scan chains to generate a portion of a chain test result, wherein the shifting in the pseudo-diagonal direction comprises: repeating an operation of shifting the test pattern for one clock cycle in the first direction followed by shifting for one clock cycle in the second direction or repeating an operation of shifting for one clock cycle in the second direction followed by shifting for one clock cycle in the first direction; and

shifting, in the first direction, the test pattern out of the scan chains to generate rest of the chain test result.

9. The method recited in claim 8 , further comprising:

shifting, in the first direction, another test pattern into the scan chains; and

shifting, in the first direction, the another test pattern out of the scan chains to generate another chain test result.

10. The method recited in claim 9 , wherein the test pattern and the another test pattern are identical.

11. The method recited in claim 9 , further comprising:

determining good scan chains and faulty scan chains based on the another chain test result, the good scan chain being a scan chain having no faulty scan cells; and

determining faulty scan cell candidates on the faulty scan chains based on the chain test result.

12. The method recited in claim 8 , further comprising:

determining faulty scan cell candidates based on the chain test result.