Microscopes with objective assembly crash detection and methods of utiliizing the same

1. A microscope comprising:

a microscope body;

an objective assembly comprising an objective lens;

an objective assembly mount configured to separably attach the objective assembly to the microscope body;

an orientation detection circuit configured to indicate when a relative orientation between the microscope body and the objective assembly differs from a predetermined relative orientation; and

a levelling mechanism that uses gravity to support the objective assembly in the predetermined relative orientation, wherein the levelling mechanism comprises a 3-point kinematic mounting structure.

2. The microscope of claim 1 , wherein the orientation detection circuit comprises one or more electric circuits, wherein the orientation detection circuit is configured such that, when the relative orientation between the microscope body and the objective assembly changes from the predetermined relative orientation, at least one of:

(i) an electrical continuity of the orientation detection circuit changes;

(ii) an electric current within the orientation detection circuit changes; and

(iii) a voltage of the orientation detection circuit changes.

3. The microscope of claim 1 , wherein the orientation detection circuit comprises an electric switch.

4. The microscope of claim 3 , wherein the electric switch is normally closed when the relative orientation between the objective assembly and the microscope body is the predetermined relative orientation, and wherein the electric switch opens when the relative orientation between the microscope body and the objective assembly differs from the predetermined relative orientation.

5. The microscope of claim 3 , wherein the electric switch comprises a matching pair of electrical contacting surfaces, wherein one electrical contacting surface of the matching pair of electrical contacting surfaces is included in the objective assembly and the other electrical contacting surface of the matching pair of electrical contacting surfaces is included in the objective assembly mount.

6. The microscope of claim 1 , wherein the orientation detection circuit comprises a position sensor configured to detect changes in the relative orientation between the microscope body and the objective assembly.

7. The microscope of claim 1 , wherein the objective assembly is configured to selectively pivot relative to the objective assembly mount, such that the relative orientation between the microscope body and the objective assembly differs from the predetermined relative orientation.

8. The microscope of claim 7 , wherein the objective assembly mount comprises a receiving region configured to retain the objective assembly, and wherein the receiving region is configured to permit the objective assembly to selectively pivot relative to the objective assembly mount within the receiving region.

9. The microscope of claim 1 , wherein the objective assembly mount further comprises a magnetic assembly configured to bias the objective assembly towards the predetermined relative orientation.

10. The microscope of claim 1 , further comprising a drive mechanism configured to operatively translate the microscope along an optical axis of the objective lens.

11. The microscope of claim 1 , further comprising a controller, wherein the controller comprises:

non-transitory memory comprising stored computer-readable instructions for stopping movement of the microscope when an indication that the relative orientation between the microscope body and the objective assembly differs from the predetermined relative orientation is received from the orientation detection circuit; and

a processing unit programmed to execute the stored computer-readable instructions.

12. A method of detecting a collision between the microscope of claim 1 and an object, the method comprising:

moving the microscope and the object relative to one another;

physically contacting the objective assembly and the object;

responsive to the physically contacting, moving the objective assembly relative to the microscope body; and

detecting the moving of the objective assembly relative to the microscope body.

13. The method of claim 12 , wherein the adjusting the moving of the microscope comprises one or more of: ceasing motion of the microscope and retracting the microscope away from the object.

14. The method of claim 12 , further comprising generating an alert that is indicative of physical contact between the objective assembly and the object responsive to the detecting the moving of the objective assembly relative to the microscope body.

15. The method of claim 12 , further comprising one or more of: ceasing motion of a test probe and retracting the test probe away from the objective assembly responsive to the detecting the moving of the objective assembly relative to the microscope body.

16. The method of claim 12 , further comprising one or more of: ceasing motion of a device under test and retracting the device under test responsive to the detecting the moving of the objective assembly relative to the microscope body.

17. The method of claim 12 , wherein the detecting the moving of the objective assembly relative to the microscope body is based on a change of an electrical continuity of an electric switch at least partially included in the objective assembly.

18. The method of claim 12 , wherein the moving the objective assembly relative to the microscope body further comprises pivoting the objective assembly relative to the microscope body to change the relative orientation between the microscope body and the objective assembly from the predetermined relative orientation.

19. A probe system for testing a device under test (DUT), the probe system comprising:

a chuck that defines a support surface configured to receive a substrate that includes the DUT;

a probe configured to communicate with the DUT;

a signal generation and analysis assembly configured to provide a test signal to the DUT and also to receive a resultant signal from the DUT;

the microscope of claim 1 , wherein the microscope is configured to collect an image of at least one of the probe and the DUT; and

at least one of:

(i) a manipulator configured to operatively translate the probe relative to the support surface; and

(ii) a drive assembly configured to selectively control a relative orientation between the probe and the support surface.