Systems and methods for calibrating a tunable component

1. A method for calibrating a tunable component, the method comprising:

measuring a response of the tunable component for a reference electrical tuning input;

storing a calibration code in a non-volatile memory, wherein the calibration code characterizes a deviation of the response of the tunable component relative to a reference response of the tunable component to the reference electrical tuning input;

during operation of the tunable component, receiving an electrical tuning input as a tuning word corresponding to a desired response of the tunable component;

generating a modified tuning word that is selected or computed based on the electrical tuning input and the calibration code to produce a tuned response of the tunable component that most closely matches the desired response; and

applying the modified tuning word to the tunable component to adjust a tuning setting of the tunable component based on the calibration code to achieve the tuned response of the tunable component.

2. The method of claim 1 , wherein the tunable component comprises one or more tunable capacitors; and

wherein a capacitance of the one or more tunable capacitors is tunable in response to the electrical tuning input to vary the tuned response of the tunable component.

3. The method of claim 1 , wherein storing a calibration code comprises storing one of a plurality of bin identifiers that are each associated with a discrete response range of the tunable component.

4. The method of claim 3 , wherein the desired response is selected to be within the discrete response range of the one of the plurality of bin identifiers having the smallest discrete response range.

5. The method of claim 3 , wherein the one of the plurality of bin identifiers is selected to characterize a response of a single tunable element of the tunable component.

6. The method of claim 3 , wherein the one of the plurality of bin identifiers is selected to characterize an aggregate response of an array of tunable elements of the tunable component.

7. The method of claim 3 , wherein adjusting a tuning setting comprises:

retrieving the one of the plurality of bin identifiers from the non-volatile memory;

selecting one or more of a plurality of tuning words corresponding to the stored one of the plurality of bin identifiers; and

applying the selected one or more of the plurality of tuning words to the tunable component.

8. The method of claim 7 , wherein the number of tuning words is equal to an integer multiple of the number of bin identifiers.

9. The method of claim 1 , wherein storing a calibration code comprises storing one or more coefficients of a calibration tuning function.

10. The method of claim 1 , wherein the non-volatile memory is provided on the tunable component.

11. The method of claim 1 , wherein the desired response has a first numerical resolution; and

wherein the tuned response of the tunable component has a second numerical resolution that is finer than the first numerical resolution.

12. The method of claim 1 , wherein generating a modified tuning word is performed by a software driver that is distinct from the tunable component.

13. The method of claim 1 , wherein the modified tuning word is selected or computed by a logic block in communication with the non-volatile memory and the tunable component.