IP Library › Granted Patent US 11,858,829
Granted Patent B2
US 11,858,829 · App. 16/819,571 · Granted Jan 2, 2024

Ternary paraelectric material with space group Cc and method of manufacturing the same

Inventors: Giyoung Jo (Suwon-si, KR); Chan Kwak (Yongin-si, KR); Hyungjun Kim (Suwon-si, KR); Euncheol Do (Seoul, KR); Hyeoncheol Park (Hwaseong-si, KR); Changsoo Lee (Seoul, KR)
Assignee: Samsung Electronics Co., Ltd.
C01G33/006C04B35/6261C04B35/62695C04B35/645H01L28/40H10B12/37C01P2002/72C01P2002/76C01P2006/10C01P2006/40
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Quick Facts
Patent No.
US 11,858,829
App. No.
16/819,571
Granted
Jan 2, 2024
Kind
B2
Abstract

A ternary paraelectric having a Cc structure and a method of manufacturing the same are provided. The ternary paraelectric having a Cc structure includes a material having a chemical formula of A 2 B 4 O 11 that has a monoclinic system, is a space group No. 9, and has a dielectric constant of 150 to 250, wherein “A” is a Group 1 element, and “B” is a Group 5 element. “A” may include one of Na, K, Li and Rb. “B” may include one of Nb, V, and Ta. The A 2 B 4 O 11 material may be Na 2 Nb 4 O 11 in which bandgap energy thereof is greater than that of STO. The A 2 B 4 O 11 material may have relative density that is greater than 90% or more.

Claims (35)

1. A ternary paraelectric having a Cc structure comprising:

a material having a chemical formula of A 2 B 4 O 11 that belongs to a monoclinic system, is a space group No. 9, and has a dielectric constant of 150 to 250,

wherein “A” is a Group 1 element, and “B” is a Group 5 element.

2. The ternary paraelectric of claim 1 , wherein “A” comprises one of Na, K, Li and Rb.

3. The ternary paraelectric of claim 1 , wherein “B” comprises one of Nb, V, and Ta.

4. The ternary paraelectric of claim 1 , wherein the A 2 B 4 O 11 material comprises Na 2 Nb 4 O 11 in which a bandgap energy thereof is greater than that of STO.

5. The ternary paraelectric of claim 1 , wherein a relative density of the A 2 B 4 O 11 material is 90% or more compared to a fully dense A 2 B 4 O 11 not containing a pore.

6. A capacitor comprising:

a first electrode;

a second electrode; and

a dielectric layer, the dielectric layer comprising the ternary paraelectric having the Cc structure of claim 1 .

7. A semiconductor device comprising the ternary paraelectric having the Cc structure of claim 1 .

8. A method of manufacturing a ternary paraelectric having a Cc structure, the method comprising:

preparing ternary dielectric powder, the ternary dielectric powder comprising an A 2 B 4 O 11 material;

compacting the prepared ternary dielectric powder; and

sintering the compacted ternary dielectric powder;

wherein the ternary paraelectric includes a material that belongs to a monoclinic system, is a space group No. 9, and has a dielectric constant of 150 to 250, “A” is a Group 1 element, and “B” is a Group 5 element.

9. The method of claim 8 , further comprising re-heating a resultant product of the sintering.

10. The method of claim 9 , wherein the sintering comprises a spark plasma sintering (SPS) operation.

11. The method of claim 9 , wherein the re-heating is performed at a higher temperature than the sintering.

12. The method of claim 8 , wherein the preparing of the ternary dielectric powder comprises:

mixing a first precursor including “A” with a second precursor including “B”;

milling the mixture of the first and second precursors after adding a solvent to the mixture;

drying a resultant product after the milling is completed; and

calcining the dried resultant product.

13. The method of claim 12 , wherein the milling comprises a planetary milling operation.

14. The method of claim 8 , wherein the compacting comprises:

molding the ternary dielectric powder into a pellet shape; and

compacting the molded ternary dielectric powder.

15. The method of claim 8 , wherein “A” is one of Na, K, Li, and Rb.

16. The method of claim 8 , wherein “B” is one of Nb, V, and Ta.

17. The method of claim 8 , wherein the A 2 B 4 O 11 material comprises Na 2 Nb 4 O 11 in which bandgap energy thereof is greater than that of STO.

18. The method of claim 8 , wherein a relative density of the A 2 B 4 O 11 material is 90% or more compared to a fully dense A 2 B 4 O 11 not containing a pore.

19. The ternary paraelectric of claim 4 , wherein the A 2 B 2 O 11 material has a band offset of 1 eV or more to one of an upper electrode and a lower electrode of a capacitor.

20. The capacitor of claim 6 , wherein the ternary paraelectric having the Cc structure has a band offset of 1 eV or more to one of the first electrode and the second electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2020
From: JO, GIYOUNG; KWAK, CHAN; KIM, HYUNGJUN; DO, EUNCHEOL; PARK, HYEONCHEOL; LEE, CHANGSOO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 052125/0876 →
Priority Claims (1)
KR 10-2019-0132390 · Oct 23, 2019 · national
Continuity (1)
Related Publication 20210122644A1 · Apr 29, 2021
Cited By (2)
US 12,269,753 US 12,630,441