Ternary paraelectric material with space group Cc and method of manufacturing the same
A ternary paraelectric having a Cc structure and a method of manufacturing the same are provided. The ternary paraelectric having a Cc structure includes a material having a chemical formula of A 2 B 4 O 11 that has a monoclinic system, is a space group No. 9, and has a dielectric constant of 150 to 250, wherein “A” is a Group 1 element, and “B” is a Group 5 element. “A” may include one of Na, K, Li and Rb. “B” may include one of Nb, V, and Ta. The A 2 B 4 O 11 material may be Na 2 Nb 4 O 11 in which bandgap energy thereof is greater than that of STO. The A 2 B 4 O 11 material may have relative density that is greater than 90% or more.
1 . A ternary paraelectric having a Cc structure comprising:
a material that belongs to a monoclinic system, is space group No. 9, and has the X-ray diffraction characteristics shown in (A) of FIG. 3 .
2 . The ternary paraelectric of claim 1 ,
wherein the material has a relation between frequency and a dielectric constant and a relation between frequency and a dielectric loss that are shown in FIG. 5 .
3 . The ternary paraelectric of claim 1 , wherein the material has a chemical formula of A 2 B 4 O 11 and has a dielectric constant of 150 to 250,
wherein “A” of the A 2 B 4 O 11 material is a Group 1 element, and “B” of the A 2 B 4 O 11 material is a Group 5 element.
4 . The ternary paraelectric of claim 3 , wherein “A” of the A 2 B 4 O 11 material comprises one of Na, K, Li and Rb and “B” of the A 2 B 4 O 11 material comprises one of Nb, V, and Ta.
5 . The ternary paraelectric of claim 3 , wherein the A 2 B 4 O 11 material comprises Na 2 Nb 4 O 11 in which a bandgap energy thereof is greater than that of STO.
6 . The ternary paraelectric of claim 3 , wherein a relative density of the A 2 B 4 O 11 material is 90% or more compared to a fully dense A 2 B 4 O 11 not containing a pore.
7 . A capacitor comprising:
a first electrode;
a second electrode; and
a dielectric layer, the dielectric layer comprising the ternary paraelectric having the Cc structure of claim 1 .
8 . A semiconductor device comprising the ternary paraelectric having the Cc structure of claim 1 .
9 . A method of manufacturing a ternary paraelectric having a Cc structure, the method comprising:
preparing ternary dielectric powder, the ternary dielectric powder comprising an A 2 B 4 O 11 material;
compacting the prepared ternary dielectric powder; and
sintering the compacted ternary dielectric powder;
wherein the ternary paraelectric includes a material that belongs to a monoclinic system, is a space group No. 9 and has the X-ray diffraction characteristics shown in (A) of FIG. 3 .
10 . The method of claim 9 , wherein the material has a dielectric constant of 150 to 250, “A” of the A 2 B 4 O 11 material is a Group 1 element, and “B” of the A 2 B 4 O 11 material is a Group 5 element.
11 . The method of claim 9 , further comprising re-heating a resultant product of the sintering.
12 . The method of claim 11 , wherein the sintering comprises a spark plasma sintering (SPS) operation.
13 . The method of claim 11 , wherein the re-heating is performed at a higher temperature than the sintering.
14 . The method of claim 9 , wherein the preparing of the ternary dielectric powder comprises:
mixing a first precursor including “A” of the A 2 B 4 O 11 material with a second precursor including “B” of the A 2 B 4 O 11 material;
milling the mixture of the first and second precursors after adding a solvent to the mixture;
drying a resultant product after the milling is completed; and
calcining the dried resultant product.
15 . The method of claim 14 , wherein the milling comprises a planetary milling operation.
16 . The method of claim 9 , wherein the compacting comprises:
molding the ternary dielectric powder into a pellet shape; and
compacting the molded ternary dielectric powder.
17 . The method of claim 9 , wherein “A” of the A 2 B 4 O 11 material is one of Na, K, Li, and Rb and “B” of the A 2 B 4 O 11 material is one of Nb, V, and Ta.
18 . The method of claim 9 , wherein the A 2 B 4 O 11 material comprises Na 2 Nb 4 O 11 in which bandgap energy thereof is greater than that of STO.
19 . The method of claim 9 , wherein a relative density of the A 2 B 4 O 11 material is 90% or more compared to a fully dense A 2 B 4 O 11 not containing a pore.
20 . The method of claim 9 , wherein the material has a relation between frequency and a dielectric constant and a relation between frequency and a dielectric loss that are shown in FIG. 5 .