IP Library › Granted Patent US 10,951,225
Granted Patent B1
US 10,951,225 · App. 16/821,667 · Granted Mar 16, 2021

Successive approximation register analog-to-digital converter with multiple sample capacitors

Inventors: Donelson A. Shannon (Austin, TX); Edmund M. Schneider (Austin, TX); Jianping Wen (Austin, TX)
Assignee: Cirrus Logic, Inc.
H03M1/468H03M1/1245H03M1/462
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Quick Facts
Patent No.
US 10,951,225
App. No.
16/821,667
Granted
Mar 16, 2021
Kind
B1
Abstract

A SAR ADC may include a plurality of capacitor networks, wherein each capacitor network of the plurality of capacitor networks has a sampling capacitor for sampling an analog input signal to the SAR ADC and at least one non-sampling capacitor. The SAR ADC may also include a DAC including a plurality of sub-DACs including at least a first sub-DAC representing most significant bits of an output of the SAR ADC, wherein the output of the first sub-DAC is coupled to the sampling capacitors of the plurality of capacitor networks and a second sub-DAC representing bits of the output of the SAR ADC lesser in magnitude significance than those of the first sub-DAC, wherein the output of the second sub-DAC is coupled to a respective one of at least one non-sampling capacitor of each of the plurality of capacitor networks.

Claims (46)

1. A successive approximation register analog-to-digital converter (SAR ADC) comprising:

a plurality of capacitor networks, wherein each capacitor network of the plurality of capacitor networks has a sampling capacitor for sampling an analog input signal to the SAR ADC and at least one non-sampling capacitor;

a digital-to-analog converter (DAC) comprising a plurality of sub-DACs including at least:

a first sub-DAC representing most significant bits of an output of the SAR ADC, wherein the output of the first sub-DAC is coupled to the sampling capacitors of the plurality of capacitor networks; and

a second sub-DAC representing bits of the output of the SAR ADC lesser in magnitude significance than those of the first sub-DAC, wherein the output of the second sub-DAC is coupled to a respective one of at least one non-sampling capacitor of each of the plurality of capacitor networks;

an analog comparator configured to compare a sampled analog input signal of the SAR ADC to an output of the DAC; and

a successive approximation register (SAR) configured to, responsive to an output of the analog comparator, communicate to the DAC successive approximations of a digital code corresponding to the sampled analog input signal;

wherein each particular capacitor network of the plurality of capacitor networks is configured to operate in a plurality of phases comprising:

a sampling phase in which the particular capacitor network is decoupled from the DAC and samples the analog input signal using its respective sampling capacitor; and

a conversion phase in which the particular capacitor is coupled to the DAC and converts, using successive approximation, a sampled analog input signal sampled during the sampling phase into an equivalent digital output signal.

2. The SAR ADC of claim 1 , wherein each particular capacitor network of the plurality of capacitor networks is configured to operate, while in the conversion phase, in a plurality of sub-phases comprising:

a first sub-phase in which the output of the first sub-DAC is coupled to the respective sampling capacitor of the particular capacitor network, and wherein successive approximation for bits of the first sub-DAC is performed; and

a second sub-phase in which the output of the second sub-DAC is coupled to its respective non-sampling capacitor of the particular capacitor network, and wherein successive approximation for bits of the second sub-DAC is performed.

3. The SAR ADC of claim 1 , wherein the SAR ADC is configured to operate such that a first capacitor network of the plurality of capacitor networks is able to operate in the sampling phase contemporaneously with a second capacitor network of the plurality of capacitor networks operating in the conversion phase.

4. The SAR ADC of claim 1 , wherein in each particular capacitor network of the plurality of capacitor networks, a first capacitance of the sampling capacitor of the particular capacitor network is significantly greater than a second capacitance of the non-sampling capacitor of the particular capacitor network.

5. A method comprising, in a successive approximation register analog-to-digital converter (SAR ADC) having a plurality of capacitor networks, wherein each capacitor network of the plurality of capacitor networks has a sampling capacitor and at least one non-sampling capacitor;

sampling, with each sampling capacitor, an analog input signal to the SAR ADC;

comparing the sampled analog input signal of the SAR ADC to an output of a digital-to-analog converter (DAC), wherein the DAC comprises a plurality of sub-DACs including at least:

a first sub-DAC representing most significant bits of an output of the SAR ADC, wherein the output of the first sub-DAC is coupled to the sampling capacitors of the plurality of capacitor networks; and

a second sub-DAC representing bits of the output of the SAR ADC lesser in magnitude significance than those of the first sub-DAC, wherein the output of the second sub-DAC is coupled to a respective one of at least one non-sampling capacitor of each of the plurality of capacitor networks;

responsive to comparing the sampled analog input signal to the output of the DAC, communicating, with a successive approximation register (SAR) to the DAC successive approximations of a digital code corresponding to the sampled analog input signal; and

operating each particular capacitor network of the plurality of capacitor networks in a plurality of phases comprising:

a sampling phase in which the particular capacitor network is decoupled from the DAC and samples the analog input signal using its respective sampling capacitor; and

a conversion phase in which the particular capacitor is coupled to the DAC and converts, using successive approximation, a sampled analog input signal sampled during the sampling phase into an equivalent digital output signal.

6. The method of claim 5 , further comprising operating each particular capacitor network of the plurality of capacitor networks, while in the conversion phase, in a plurality of sub-phases comprising:

a first sub-phase in which the output of the first sub-DAC is coupled to the respective sampling capacitor of the particular capacitor network, and wherein successive approximation for bits of the first sub-DAC is performed; and

a second sub-phase in which the output of the second sub-DAC is coupled to its respective non-sampling capacitor of the particular capacitor network, and wherein successive approximation for bits of the second sub-DAC is performed.

7. The method of claim 5 , further comprising operating the SAR ADC such that a first capacitor network of the plurality of capacitor networks is able to operate in the sampling phase contemporaneously with a second capacitor network of the plurality of capacitor networks operating in the conversion phase.

8. The method of claim 5 , wherein in each particular capacitor network of the plurality of capacitor networks, a first capacitance of the sampling capacitor of the particular capacitor network is significantly greater than a second capacitance of the non-sampling capacitor of the particular capacitor network.

9. A system comprising:

an analog front end configured to generate an analog input signal; and

a successive approximation register analog-to-digital converter (SAR ADC) configured to convert the analog input signal to an equivalent digital signal comprising:

a plurality of capacitor networks, wherein each capacitor network of the plurality of capacitor networks has a sampling capacitor for sampling the analog input signal to the SAR ADC and at least one non-sampling capacitor;

a digital-to-analog converter (DAC) comprising a plurality of sub-DACs including at least:

a first sub-DAC representing most significant bits of an output of the SAR ADC, wherein the output of the first sub-DAC is coupled to the sampling capacitors of the plurality of capacitor networks; and

a second sub-DAC representing bits of the output of the SAR ADC lesser in magnitude significance than those of the first sub-DAC, wherein the output of the second sub-DAC is coupled to a respective one of at least one non-sampling capacitor of each of the plurality of capacitor networks;

an analog comparator configured to compare a sampled analog input signal of the SAR ADC to an output of the DAC; and

a successive approximation register (SAR) configured to, responsive to an output of the analog comparator, communicate to the DAC successive approximations of a digital code corresponding to the sampled analog input signal;

wherein each particular capacitor network of the plurality of capacitor networks is configured to operate in a plurality of phases comprising:

a sampling phase in which the particular capacitor network is decoupled from the DAC and samples the analog input signal using its respective sampling capacitor; and

a conversion phase in which the particular capacitor is coupled to the DAC and converts, using successive approximation, a sampled analog input signal sampled during the sampling phase into an equivalent digital output signal.

10. The system of claim 9 , wherein each particular capacitor network of the plurality of capacitor networks is configured to operate, while in the conversion phase, in a plurality of sub-phases comprising:

a first sub-phase in which the output of the first sub-DAC is coupled to the respective sampling capacitor of the particular capacitor network, and wherein successive approximation for bits of the first sub-DAC is performed; and

a second sub-phase in which the output of the second sub-DAC is coupled to its respective non-sampling capacitor of the particular capacitor network, and wherein successive approximation for bits of the second sub-DAC is performed.

11. The system of claim 9 , wherein the SAR ADC is configured to operate such that a first capacitor network of the plurality of capacitor networks is able to operate in the sampling phase contemporaneously with a second capacitor network of the plurality of capacitor networks operating in the conversion phase.

12. The system of claim 9 , wherein in each particular capacitor network of the plurality of capacitor networks, a first capacitance of the sampling capacitor of the particular capacitor network is significantly greater than a second capacitance of the non-sampling capacitor of the particular capacitor network.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2020
From: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
To: CIRRUS LOGIC, INC.
Reel/Frame 054682/0702 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2020
From: SCHNEIDER, EDMUND M.; WEN, JIANPING
To: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
Reel/Frame 052829/0720 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2020
From: SHANNON, DONELSON A.
To: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
Reel/Frame 052829/0764 →
Cited By (2)
US 12,512,845 US 12,597,942