IP Library › Granted Patent US 11,424,133
Granted Patent B2
US 11,424,133 · App. 16/825,237 · Granted Aug 23, 2022

Metal structure and method of manufacturing the same and metal wire and semiconductor device and electronic device

Inventors: Kenji Takai (Waseong-si, KR); Do Yoon Kim (Hwaseong-si, KR); Boun Yoon (Seoul, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01L21/3212B24B37/044C09G1/04C09K3/1409H01L21/2885H01L21/7684H01L21/76802H01L21/76834H01L21/76843H01L21/76877
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Quick Facts
Patent No.
US 11,424,133
App. No.
16/825,237
Granted
Aug 23, 2022
Kind
B2
Abstract

A method of manufacturing a metal structure including forming a metal layer including a metal and a nano-abrasive and supplying slurry on the metal layer to perform chemical mechanical polishing, a metal structure including a metal and a nano-abrasive having an average particle diameter of less than about 5 nanometers, and a metal wire, a semiconductor device, and an electronic device including the same.

Claims (11)

1. A method of manufacturing a metal structure, the method comprising:

forming a metal layer comprising a metal and a nano-abrasive, the nano-abrasive having an average particle diameter of less than 5 nanometers, wherein the forming of the metal layer comprises: preparing an electrodeposition coating solution comprising a metal salt, the nano-abrasive, and a solvent, and disposing a substrate comprising a conductive layer and an opposite electrode in the electrodeposition coating solution and performing electrodeposition by applying a current between the conductive layer and the opposite electrode; and

supplying slurry on the metal layer to perform chemical mechanical polishing.

2. The method of claim 1 , wherein the slurry does not comprise an abrasive having an average particle diameter of greater than or equal to about 3 nanometers.

3. The method of claim 1 , wherein the slurry is an abrasive-free slurry.

4. The method of claim 1 , wherein the slurry comprises an amino acid or a derivative thereof.

5. The method of claim 1 , wherein the nano-abrasive comprises a carbon abrasive.

6. The method of claim 5 , wherein the carbon abrasive comprises fullerene or a derivative thereof, graphene, graphite, a carbon nanotube, a carbon dot, or a combination thereof.

7. The method of claim 1 , wherein the metal comprises copper, silver, gold, aluminum, calcium, zinc, tungsten, iron, tin, platinum, nickel, or a combination thereof.

8. The method of claim 1 , wherein the metal salt comprises a copper salt, a silver salt, a gold salt, an aluminum salt, a calcium salt, a zinc salt, a tungsten salt, an iron salt, a tin salt, a platinum salt, a nickel salt, or a combination thereof.

9. A method of manufacturing a semiconductor device comprising forming a metal wire by the manufacturing method of claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 13, 2022
From: TAKAI, KENJI; KIM, DO YOON; YOON, BOUN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 060494/0371 →
Priority Claims (2)
KR 10-2019-0090524 · Jul 25, 2019 · national
KR 10-2019-0163597 · Dec 10, 2019 · national
Continuity (1)
Related Publication 20210028024A1 · Jan 28, 2021
Cited By (2)
US 12,655,322 US 12,679,998