Semiconductor die including edge ring structures and methods for making the same

1. A semiconductor die comprising:

semiconductor devices located over a substrate;

at least one dielectric material portion that laterally surrounds the semiconductor devices;

interconnect-level dielectric material layers that overlie the semiconductor devices and the at least one dielectric material portion and embedding metal interconnect structures; and

at least one edge seal ring structure continuously extending from a topmost surface of the interconnect-level dielectric material layers to a top surface of the substrate, wherein each of the at least one edge seal ring structure comprises:

a composite edge seal via structure including a metallic material layer and a dielectric fill material portion, wherein the metallic material layer includes an inner vertical sidewall segment that laterally surrounds, and laterally encloses, the semiconductor devices, an outer vertical sidewall segment that laterally surrounds, and laterally encloses, the dielectric fill material portion, and a planar bottom segment that connects bottom portions of the inner vertical sidewall segment of the metallic material layer and the outer vertical sidewall segment of the metallic material layer;

wherein:

the at least one dielectric material portion comprises a plurality of dielectric material portions that are stacked; and

the metallic material layer has a plurality of tapered sidewalls adjoined by at least one horizontal stepped surface and extending through different dielectric material portions of the plurality of dielectric material portions.

2. The semiconductor die of claim 1 , wherein each of the at least one horizontal stepped surface is located in a horizontal plane including a bottom surface of a respective dielectric material portion of the plurality of dielectric material portions.

3. The semiconductor die of claim 1 , wherein the semiconductor devices comprise:

a first alternating stack of first insulating layers and first electrically conductive layers and laterally contacting a first one of the plurality of dielectric material portions;

a second alternating stack of second insulating layers and second electrically conductive layers and laterally contacting a second one of the plurality of dielectric material portions; and

memory stack structures vertically extending through the first alternating stack and the second alternating stack and including a respective vertical semiconductor channel and a respective vertical stack of memory elements.

4. The semiconductor die of claim 3 , wherein the plurality of dielectric material portions comprises:

a first retro-stepped dielectric material portion contacting first stepped surfaces of the first alternating stack; and

a second retro-stepped dielectric material portion contacting second stepped surfaces of the second alternating stack.

5. A semiconductor die comprising:

semiconductor devices located over a substrate;

at least one dielectric material portion that laterally surrounds the semiconductor devices;

interconnect-level dielectric material layers that overlie the semiconductor devices and the at least one dielectric material portion and embedding metal interconnect structures; and

at least one edge seal ring structure continuously extending from a topmost surface of the interconnect-level dielectric material layers to a top surface of the substrate, wherein each of the at least one edge seal ring structure comprises:

a composite edge seal via structure including a metallic material layer and a dielectric fill material portion, wherein the metallic material layer includes an inner vertical sidewall segment that laterally surrounds, and laterally encloses, the semiconductor devices, an outer vertical sidewall segment that laterally surrounds, and laterally encloses, the dielectric fill material portion, and a planar bottom segment that connects bottom portions of the inner vertical sidewall segment of the metallic material layer and the outer vertical sidewall segment of the metallic material layer;

wherein:

the dielectric fill material portion has a vertical cross-sectional profile including a pair of stepped tapered outer sidewalls in contact with the metallic material layer; and

each of the pair of stepped tapered outer sidewalls comprises a first tapered outer sidewall segment having a first taper angle, a horizontal surface segment adjoined to an upper end of the first tapered outer sidewall, and a second tapered outer sidewall segment having a second taper angle and adjoined to an inner end of the horizontal surface segment.

6. A semiconductor die comprising:

semiconductor devices located over a substrate;

at least one dielectric material portion that laterally surrounds the semiconductor devices;

interconnect-level dielectric material layers that overlie the semiconductor devices and the at least one dielectric material portion and embedding metal interconnect structures; and

at least one edge seal ring structure continuously extending from a topmost surface of the interconnect-level dielectric material layers to a top surface of the substrate,

wherein each of the at least one edge seal ring structure comprises:

a composite edge seal via structure including a metallic material layer and a dielectric fill material portion, wherein the metallic material layer includes an inner vertical sidewall segment that laterally surrounds, and laterally encloses, the semiconductor devices, an outer vertical sidewall segment that laterally surrounds, and laterally encloses, the dielectric fill material portion, and a planar bottom segment that connects bottom portions of the inner vertical sidewall segment of the metallic material layer and the outer vertical sidewall segment of the metallic material layer; and

a set of metal barrier structures that is adjoined to the composite edge seal via structure and continuously extending from a top surface of the composite edge seal via structure to a horizontal plane including topmost surfaces of the metal interconnect structures;

wherein:

the set of metal barrier structures comprises a vertical stack of at least two line-level metal rings and at least one via-level metal ring;

a bottommost one of the at least two line-level metal rings contacts an entirety of a top surface of the composite edge seal via structure; and

a bottom surface of the bottommost one of the at least two line-level metal rings directly contacts an entirety of a top surface of the dielectric fill material portion and an entirety of a top surface of the metallic material layer.