IP Library › Granted Patent US 10,943,643
Granted Patent B2
US 10,943,643 · App. 16/847,551 · Granted Mar 9, 2021

Semiconductor storage circuit

Inventors: Masataka Sato (Yokohama, JP); Hideo Akiyoshi (Yokohama, JP); Masanobu Hirose (Yokohama, JP); Yoshinobu Yamagami (Yokohama, JP)
Assignee: SOCIONEXT INC.
G11C11/4087G11C5/025G11C11/4082G11C11/4085G11C11/4099
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,943,643
App. No.
16/847,551
Granted
Mar 9, 2021
Kind
B2
Abstract

First and second memory cell arrays each having memory cells arranged in the X and Y directions lie side by side in the Y direction with space between them. A relay buffer is provided between first and second row decoders for buffering a control signal to be supplied to the second row decoder. An inter-array block between the first and second memory cell arrays is constituted by at least either a tap cell or a dummy memory cell. The relay buffer and the inter-array block are the same in position and size in the Y direction.

Claims (36)

1. A semiconductor storage circuit, comprising:

a first memory cell array having a plurality of memory cells arranged in X and Y directions;

a second memory cell array having a plurality of memory cells arranged in the X and Y directions and lying side by side with the first memory cell array in the Y direction with space between them;

a first row decoder including a plurality of word line drivers corresponding to rows of the first memory cell array;

a second row decoder including a plurality of word line drivers corresponding to rows of the second memory cell array and lying side by side with the first row decoder in the Y direction with space between them;

a control circuit configured to generate a control signal to be supplied to the first and second row decoders:

a relay buffer, provided between the first row decoder and the second row decoder, configured to buffer the control signal to be supplied to the second row decoder; and

an inter-array block provided between the first memory cell array and the second memory cell array and constituted by at least either a tap cell or a dummy memory cell, wherein

the relay buffer and the inter-array block are the same in position and size in the Y direction.

2. The semiconductor storage circuit of claim 1 , wherein

the inter-array block is constituted by only a dummy memory cell.

3. The semiconductor storage circuit of claim 1 , wherein

the first memory cell array, the inter-array block, and the second memory cell array each include a plurality of gates extending in the X direction, and

a gate pitch in the Y direction is uniform in the first memory cell array, the inter-array block, and the second memory cell array.

4. The semiconductor storage circuit of claim 1 , wherein

the dummy memory cell constituting the inter-array block has the same layout as the memory cells of the first and second memory cell arrays.

5. The semiconductor storage circuit of claim 1 , comprising:

bit lines extending in the Y direction over the first memory cell array, the inter-array block, and the second memory cell array.

6. A semiconductor storage circuit, comprising:

a first memory cell array having a plurality of memory cells arranged in X and Y directions;

a second memory cell array having a plurality of memory cells arranged in the X and Y directions and lying side by side with the first memory cell array in the Y direction with space between them;

a first row decoder including a plurality of word line drivers corresponding to rows of the first memory cell array;

a second row decoder including a plurality of word line drivers corresponding to rows of the second memory cell array and lying side by side with the first row decoder in the Y direction with space between them;

a control circuit configured to generate a control signal to be supplied to the first and second row decoders:

a relay buffer, provided between the first row decoder and the second row decoder, configured to buffer the control signal to be supplied to the second row decoder; and

an inter-array block provided between the first memory cell array and the second memory cell array and constituted by at least either a tap cell or a dummy memory cell, wherein

a region between the first row decoder and the second row decoder is the same as the inter-array block in position and size in the Y direction.

7. The semiconductor storage circuit of claim 6 , wherein

the inter-array block is constituted by only a dummy memory cell.

8. The semiconductor storage circuit of claim 6 , wherein

the first memory cell array, the inter-array block, and the second memory cell array each include a plurality of gates extending in the X direction, and

a gate pitch in the Y direction is uniform in the first memory cell array, the inter-array block, and the second memory cell array.

9. The semiconductor storage circuit of claim 6 , wherein

the dummy memory cell constituting the inter-array block has the same layout as the memory cells of the first and second memory cell arrays.

10. The semiconductor storage circuit of claim 6 , comprising:

bit lines extending in the Y direction over the first memory cell array, the inter-array block, and the second memory cell array.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 17, 2020
From: SATO, MASATAKA; AKIYOSHI, HIDEO; HIROSE, MASANOBU; YAMAGAMI, YOSHINOBU
To: SOCIONEXT INC.
Reel/Frame 052435/0133 →
Continuity (2)
Continuation PCTJP2017038036 · Oct 20, 2017
Related Publication 20200243128A1 · Jul 30, 2020
Cited By (1)
US 12,672,317