Defect inspection method for sensor package structure

1. A defect inspection method for a sensor package structure, comprising:

providing a sensor package structure having a plurality of to-be-inspected regions arranged at different levels along a height direction, wherein the number of the to-be-inspected regions is equal to or greater than three;

implementing an image-capturing step by using an image capture device to separately focus on and take pictures of the to-be-inspected regions, so as to respectively obtain image information from each of the to-be-inspected regions, wherein a grayscale ratio is defined by any two of the image information, each image information contains has a defect image, and the defect images from the to-be-inspected regions are aligned with each other along the height direction and respectively have different grayscale values;

implementing a first determination step by determining the defect image having a maximum grayscale value as a reference defect image, defining the image information having the reference defect image as a reference image information, and defining each of the remaining defect images and the corresponding image information as a to-be-confirmed defect image and a to-be-confirmed image information; and

implementing a second determination step by comparing the reference image information and any one of the to-be-confirmed image information, which is carried out by multiplying the maximum grayscale value with the corresponding grayscale ratio to obtain a predicted grayscale value, and then confirming whether a difference between the grayscale value of the to-be-confirmed defect image and the predicted grayscale value falls within an error range, wherein when the difference falls within the error range, the to-be-confirmed defect image is determined as containing a pseudo defect, and wherein when the difference does not fall within the error range, the to-be-confirmed defect image is determined as containing a true defect.

2. The defect inspection method according to claim 1 , wherein during the step of comparing the reference image information and any one of the to-be-confirmed image information, the difference is an absolute value, the error range is M % of the predicted grayscale value, and M is within a range of 20-30.

3. The defect inspection method according to claim 2 , wherein the sensor package structure includes a substrate, a plurality of solder balls mounted on a bottom surface of the substrate, a sensor chip mounted on a top surface of the substrate, and a transparent board corresponding in position to the sensor chip, and wherein the to-be-inspected regions include an image sensing region of the sensor chip, an inner surface of the transparent board arranged adjacent to the image sensing region, and an outer surface of the transparent board arranged away from the image sensing region.

4. The defect inspection method according to claim 3 , wherein when the reference image information is obtained from the outer surface of the transparent board, a ratio of the grayscale values between the outer surface and the inner surface of the transparent board is within a range of 41.32%-87.73%, and a ratio of the grayscale values between the outer surface of the transparent board and the image sensing region is within a range of 33.33%-62.22%.

5. The defect inspection method according to claim 3 , wherein when the reference image information is obtained from the inner surface of the transparent board, a ratio of the grayscale values between the inner surface and the outer surface of the transparent board is within a range of 51.98%-87.73%, and a ratio of the grayscale values between the inner surface of the transparent board and the image sensing region is within a range of 79.13%-98.02%.

6. The defect inspection method according to claim 3 , wherein when the reference image information is obtained from the image sensing region, a ratio of the grayscale values between the image sensing region and the inner surface of the transparent board is within a range of 90.47%-99%, and a ratio of the grayscale values between the image sensing region and the outer surface of the transparent board is within a range of 56.97%-93.54%.

7. The defect inspection method according to claim 3 , wherein a gap within a range of 100 μm-150 μm exists between the image sensing region and the inner surface of the transparent board, and a medium in the gap is air, and wherein a distance from the inner surface to the outer surface is within a range of 300 μm-500 μm.

8. The defect inspection method according to claim 1 , wherein the to-be-inspected regions are parallel planes perpendicular to the height direction.

9. The defect inspection method according to claim 1 , wherein the image capture device includes a plurality of image-capturing modules, wherein in the image-capturing step, the sensor package structure or each of the image-capturing modules is moved so as to sequentially align the sensor package structure with the image-capturing modules, and the image-capturing modules obtain the image information by respectively focusing on and taking pictures of the to-be-inspected regions.

10. The defect inspection method according to claim 9 , wherein each of the image-capturing modules includes a multi-layer annular light source and a camera located on a central axis of the multi-layer annular light source, wherein in the image-capturing step, when the sensor package structure is moved to align with anyone of the image-capturing modules, the to-be-inspected regions are located on the central axis, the multi-layer annular light source emits light toward the sensor package structure, and the camera takes a picture of the to-be-inspected region in focus.