IP Library Granted Patent US 11,628,478
Granted Patent B2
US 11,628,478 · App. 16/886,567 · Granted Apr 18, 2023

Steam cleaning of CMP components

Inventors: Haosheng Wu (San Jose, CA); Jianshe Tang (San Jose, CA); Hari Soundararajan (Sunnyvale, CA); Shou-Sung Chang (Mountain View, CA); Hui Chen (San Jose, CA); Chih Chung Chou (San Jose, CA); Alexander John Fisher (Santa Clara, CA); Paul D. Butterfield (San Jose, CA)
Assignee: Applied Materials, Inc.
B08B3/00B08B1/001B08B3/106B24B37/20B24B53/017H01L21/02057B08B2203/007H01L21/30625
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Quick Facts
Patent No.
US 11,628,478
App. No.
16/886,567
Granted
Apr 18, 2023
Kind
B2
Abstract

A method of cleaning for a chemical mechanical polishing system includes directing a gas that includes steam from an orifice onto a component in the polishing system while the component is spaced away from a polishing pad of the polishing system to clean the component, and moving the component into contact with the polishing pad.

Claims (12)

1. A method of cleaning for a chemical mechanical polishing system, comprising:

while a component in the polishing system is spaced away from a polishing pad of the polishing system, the component comprising a carrier head or a substrate to be polished, directing out of a nozzle a wet steam aerosol component at an inter-platen station to clean polishing by-product off the component, wherein the wet steam aerosol comprises a gas component that consists of steam, wherein the wet steam aerosol comprises liquid water at a concentration of less than 5 wt % of the wet steam aerosol, wherein the wet steam aerosol is formed by mixing liquid water with steam, and wherein that wet steam aerosol has a temperature of around 40-50° C. prior to reaching the component; and

moving the cleaned component into contact with the polishing pad.

2. The method of claim 1 , comprising setting a timer and halting the step of directing wet steam aerosol out of the nozzle at expiration of the timer.

3. The method of claim 1 , comprising positioning the component in a treatment station spaced from the polishing pad and directing the wet steam aerosol onto the component at the treatment station.

4. The method of claim 3 , comprising rotating the component in the treatment station as wet steam aerosol is directed onto the component.

5. The method of claim 3 , comprising vertically moving the component in the treatment station as the wet steam aerosol is directed onto the component.

6. The method of claim 1 , wherein cleaning the component comprises removing coagulated slurry.

7. The method of claim 1 , wherein cleaning the component comprises removing coagulated polishing debris.

8. The method of claim 1 , wherein the wet steam aerosol is directed onto at least a membrane of the carrier head.

9. The method of claim 1 , wherein the wet steam aerosol is directed onto an outer surface of the carrier head.

10. The method of claim 1 , wherein the wet steam aerosol has a flow rate in a range from 1 to 1000 cubic centimeters per minute (cc/min).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 9, 2021
From: WU, HAOSHENG; TANG, JIANSHE; SOUNDARARAJAN, HARI; CHANG, SHOU-SUNG; CHEN, HUI; CHOU, CHIH CHUNG; FISHER, ALEXANDER JOHN; BUTTERFIELD, PAUL D.
To: APPLIED MATERIALS, INC.
Reel/Frame 055196/0288 →
Continuity (2)
Provisional Application 62854302 · May 29, 2019
Related Publication 20200376522A1 · Dec 3, 2020
Cited By (1)
US 12,629,796