Systems and methods for reducing standby power in floating body memory devices
Methods, devices, arrays and systems for reducing standby power for a floating body memory array. One method includes counting bits of data before data enters the array, wherein the counting includes counting at least one of: a total number of bits at state 1 and a total number of all bits; a total number of bits at state 0 and the total number of all bits; or the total number of bits at state 1 and the total number of bits at state 0. This method further includes detecting whether the total number of bits at state 1 is greater than the total number of bits at state 0; setting an inversion bit when the total number of bits at state 1 is greater than the total number of bits at state 0; and inverting contents of all the bits of data before writing the bits of data to the memory array when the inversion bit has been set.
1. A semiconductor memory array configured for reducing standby power, said array comprising:
a plurality of floating body memory cells each having at least two stable floating body charge levels, wherein the standby power of one of said at least two stable floating body charge levels is lower than another of said at least two stable floating body charge levels; and
means for reducing standby power of said floating body memory cells, wherein said means for reducing standby power comprises means for setting the states of said memory cells to said state with lower standby power.
2. The semiconductor memory array of claim 1 , wherein each of said plurality of floating body memory cells further comprises a floating body region having a first conductivity type selected from a p-type conductivity type and an n-type conductivity type.
3. The semiconductor memory array of claim 2 , wherein each of said plurality of floating body memory cells further comprises a back-bias region having a second conductivity type selected from said p-type conductivity type and said n-type conductivity type, wherein said second conductivity type is different from said first conductivity type.
4. The semiconductor memory array of claim 3 , wherein applying a back-bias to said back-bias region results in maintenance of said floating body charge levels.
5. The semiconductor memory array of claim 4 , wherein said back-bias is a constant positive voltage bias.
6. The semiconductor memory array of claim 4 , wherein said back-bias is a periodic pulse of positive voltage.
7. The semiconductor memory array of claim 1 , wherein said means for reducing standby power comprises means for identifying whether at least one of said stable charge levels remains currently needed for storage of data by at least one of said floating body memory cells.
8. The semiconductor memory array of claim 1 , wherein said means for reducing standby power comprises means for identifying when each of said plurality of floating body memory cells store data that is not being actively used.
9. The semiconductor memory array of claim 1 , wherein said means for reducing standby power comprises means for identifying when each of said plurality of floating body memory cells does not store any valid data.
10. A system for reducing standby power, said system comprising:
a memory array comprising a plurality of floating body memory cells each having at least two stable floating body charge levels, wherein the standby power of one of said at least two stable floating body charge levels is lower than another of said at least two stable floating body charge levels; and
a controller configured for reducing the standby power of said floating body memory cells by setting the states of said floating body memory cells to said one of said at least two stable floating body charge levels.
11. The system of claim 10 , wherein each of said plurality of floating body memory cells further comprises a floating body region having a first conductivity type selected from a p-type conductivity type and an n-type conductivity type.
12. The system of claim 11 , further wherein each of said plurality of floating body memory cells further comprises a back-bias region having a second conductivity type selected from said p-type conductivity type and said n-type conductivity type, wherein said second conductivity type is different from said first conductivity type.
13. The system of claim 12 , wherein applying a back-bias to said back-bias region results in maintenance of said floating body charge levels.
14. The system of claim 13 , wherein said back-bias is a constant positive voltage bias.
15. The system of claim 13 , wherein said back-bias is a periodic pulse of positive voltage.
16. The system of claim 10 , further comprising means for identifying whether at least one of said stable charge levels remains currently needed for storage of data by at least one of said floating body memory cells.
17. The system of claim 10 , further comprising means for identifying when each of said plurality of floating body memory cells store data that is not being actively used.
18. The system of claim 10 , further comprising means for identifying when each of said floating body memory cells do not store any valid data.