Semiconductor package structure and method for manufacturing the same

1. A semiconductor package structure, comprising:

a conductive base having a first surface;

a first semiconductor die disposed on the first surface of the conductive base;

a first conductive pillar disposed on the first semiconductor die;

a first encapsulant disposed on the first surface of the conductive base and encapsulating the first semiconductor die,

wherein the first encapsulant further includes an opening defined by the first conductive pillar; and

a second encapsulant disposed on a second surface of the conductive base opposite to the first surface of the conductive base,

wherein the conductive base includes a curved surface, and

wherein a portion of the second encapsulant is in contact with the curved surface.

2. The semiconductor package structure of claim 1 , further comprising a conductive post in contact with the first surface of the conductive base.

3. The semiconductor package structure of claim 2 , wherein the conductive post includes a top portion and a bottom portion, and wherein a width of the bottom portion is greater than a width of the top portion.

4. The semiconductor package structure of claim 2 , wherein the conductive post has a first surface away from the first surface of the conductive base, and wherein the first surface of the first encapsulant and the first surface of the conductive post are substantially coplanar or the first surface of the first encapsulant is lower than the first surface of the conductive post.

5. The semiconductor package structure of claim 2 , wherein the first semiconductor die has a first surface away from the first surface of the conductive base and a second surface toward the first surface of the conductive base, and wherein the first semiconductor die includes a first electrode disposed adjacent to the second surface and electrically connected to the conductive post through the conductive base.

6. The semiconductor package structure of claim 1 , wherein the first conductive pillar is surrounded by and in contact with the first encapsulant.

7. The semiconductor package structure of claim 1 , wherein the first encapsulant has a first surface away from the first surface of the conductive base, and the first conductive pillar has a first surface away from the first surface of the conductive base, and wherein the first surface of the first encapsulant and the first surface of the first conductive pillar are substantially coplanar.

8. The semiconductor package structure of claim 1 , further comprising an interface between the first encapsulant and the second encapsulant, wherein the interface is at the same elevation with the first surface of the conductive base.

9. The semiconductor package structure of claim 1 , wherein the first encapsulant is composed of epoxy and a plurality of fillers.

10. The semiconductor package structure of claim 1 , further comprising:

a second semiconductor die adjacent to the conductive post; and

a second conductive pillar disposed on the second semiconductor die,

wherein the first semiconductor die and the second semiconductor die are configured to electrically connect to each other through a substrate.

11. A semiconductor package structure, comprising:

a conductive base;

a first semiconductor die disposed on a first surface of the conductive base;

a first conductive pillar disposed on a first surface of the first semiconductor die;

a first encapsulant disposed on the conductive base,

wherein the first conductive pillar and the first encapsulant each has a top surface away from the conductive base, and

wherein the top surface of the first conductive pillar is higher than or at the same elevation with the top surface of the first encapsulant; and

a second encapsulant disposed on a second surface of the conductive base opposite to the first surface of the conductive base,

wherein the conductive base includes a curved surface, and

wherein a portion of the second encapsulant is in contact with the curved surface.

12. The semiconductor package device of claim 11 , wherein the first conductive pillar has a bottom surface toward the first semiconductor die, and the first conductive pillar is free from possessing a lateral extension portion between the top surface and the bottom surface.

13. The semiconductor package device of claim 11 , wherein the first conductive pillar has a lateral surface, and wherein the lateral surface is in contact with the first encapsulant.

14. The semiconductor package device of claim 11 , further comprising a conductive post in contact with the conductive base and having a bottom surface, and wherein a width of the bottom surface is wider than that of the top surface of the conductive post.

15. A method of manufacturing a semiconductor package structure, comprising:

providing a conductive base having a conductive post, wherein the conductive post has a first surface;

attaching a first semiconductor die to a first surface of the conductive base,

wherein the first semiconductor die comprises a first conductive pillar;

forming a first encapsulant on the first surface of the conductive base to encapsulate the first semiconductor die; and

forming a second encapsulant on a second surface of the conductive base opposite to the first surface of the conductive base,

wherein the conductive base includes a curved surface, and

wherein a portion of the second encapsulant is in contact with the curved surface.

16. The method of claim 15 , further comprising:

attaching a second semiconductor die to the first surface of the conductive base;

etching the conductive base from the second surface of the conductive base to form a plurality of discrete units with a portion of the curved surface.

17. The method of claim 15 , further comprising grinding the first encapsulant such that a first surface of the first conductive pillar and a first surface of the first encapsulant are exposed.

18. The method of claim 15 , wherein forming the first encapsulant comprises performing a film molding operation.